Patents by Inventor James Rousey

James Rousey has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20070080705
    Abstract: According to one embodiment of the invention, a method for resuming the probing of a wafer includes identifying a data set associated with a wafer. The data set identifies at least one unprobed die supported on the surface of the wafer. The method also includes determining that the data set associated with the wafer is useable and generating a probe map of the wafer from the data set. The probe map identifies a physical position associated with each unprobed die supported on the surface of the wafer. The probe map and one or more probe commands are communicated to a probe module to drive the probe module in resuming the probe of the wafer.
    Type: Application
    Filed: October 19, 2006
    Publication date: April 12, 2007
    Applicant: Texas Instruments Incorporated
    Inventors: Glenn Schuette, James Rousey, Curtis Miller
  • Publication number: 20050275421
    Abstract: According to one embodiment of the invention, a method for resuming the probing of a wafer includes identifying a data set associated with a wafer. The data set identifies at least one unprobed die supported on the surface of the wafer. The method also includes determining that the data set associated with the wafer is useable and generating a probe map of the wafer from the data set. The probe map identifies a physical position associated with each unprobed die supported on the surface of the wafer. The probe map and one or more probe commands are communicated to a probe module to drive the probe module in resuming the probe of the wafer.
    Type: Application
    Filed: June 10, 2004
    Publication date: December 15, 2005
    Inventors: Glenn Schuette, James Rousey, Curtis Miller