Patents by Inventor James S. Drage
James S. Drage has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8440388Abstract: Silica dielectric films, whether nanoporous foamed silica dielectrics or nonporous silica dielectrics are readily damaged by fabrication methods and reagents that reduce or remove hydrophobic properties from the dielectric surface. The invention provides for methods of imparting hydrophobic properties to such damaged silica dielectric films present on a substrate. The invention also provides plasma-based methods for imparting hydrophobicity to both new and damaged silica dielectric films. Semiconductor devices prepared by the inventive processes are also provided.Type: GrantFiled: November 28, 2005Date of Patent: May 14, 2013Assignee: Honeywell International Inc.Inventors: Nigel P. Hacker, Michael Thomas, James S. Drage
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Patent number: 7858294Abstract: Silica dielectric films, whether nanoporous foamed silica dielectrics or nonporous silica dielectrics are readily damaged by fabrication methods and reagents that reduce or remove hydrophobic properties from the dielectric surface. The invention provides for methods of imparting hydrophobic properties to such damaged silica dielectric films present on a substrate. The invention also provides plasma-based methods for imparting hydrophobicity to both new and damaged silica dielectric films. Semiconductor devices prepared by the inventive processes are also provided.Type: GrantFiled: April 5, 2007Date of Patent: December 28, 2010Assignee: Honeywell International Inc.Inventors: Nigel P. Hacker, Michael Thomas, James S. Drage
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Patent number: 7029826Abstract: Silica dielectric films, whether nanoporous foamed silica dielectrics or nonporous silica dielectrics are readily damaged by fabrication methods and reagents that reduce or remove hydrophobic properties from the dielectric surface. The invention provides for methods of imparting hydrophobic properties to such damaged silica dielectric films present on a substrate. The invention also provides plasma-based methods for imparting hydrophobicity to both new and damaged silica dielectric films. Semiconductor devices prepared by the inventive processes are also provided.Type: GrantFiled: June 19, 2001Date of Patent: April 18, 2006Assignee: Honeywell International Inc.Inventors: Nigel P. Hacker, Michael Thomas, James S. Drage
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Patent number: 6914114Abstract: An absorbing ether-like compound including a siliconethoxy, silicondiethoxy, or silicontriethoxy species attached to a naphthalene or anthracene chromophore via an oxygen linkage is used as an organic light-absorbing compound. The absorbing ether-like compound is incorporated into spin-on glass materials to provide anti-reflective coating materials for deep ultraviolet photolithography. A method of synthesizing the light-absorbing ether compounds is based on the reaction of an alcohol-substituted chromophore with an acetoxysilicon compound in the presence of alcohol. A method of making absorbing spin-on-glass materials including the absorbing ether-like compounds is also provided.Type: GrantFiled: April 30, 2003Date of Patent: July 5, 2005Assignee: Honeywell International Inc.Inventors: Teresa Baldwin, Mary Richey, James S. Drage, Hui-Jung Wu, Richard Spear
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Patent number: 6797607Abstract: A process for forming a substantially planarized nanoporous dielectric silica coating on a substrate suitable for preparing a semiconductor device, and semiconductor devices produced by the methods of the invention. The process includes the steps of applying a composition that includes at least one silicon-based dielectric precursor to a substrate, and then, (a) gelling or aging the applied coating, (b) contacting the coating with a planarization object with sufficient pressure to transfer a planar impression to the coating without substantially impairing formation of desired nanometer-scale pore structure, (c) separating the planarized coating from the planarization object, (d) curing said planarized coating; wherein steps (a)-(d) are conducted in any one of the following sequences: (a), (b), (c) and (d); (a), (d), (b) and (c); (b), (a), (d) and (c); and (b), (c), (a) and (d).Type: GrantFiled: October 26, 2001Date of Patent: September 28, 2004Assignee: AlliedSignal Inc.Inventors: Denis H. Endisch, James S. Drage
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Patent number: 6770572Abstract: A process for treating a silica film on a substrate, which includes reacting a suitable silica film with an effective amount of a surface modification agent, wherein the silica film is present on a substrate. The reaction is conducted under suitable conditions and for a period of time sufficient for the surface modification agent to form a hydrophobic coating on the film. The surface modification agent includes at least one type of oligomer or polymer reactive with silanols on the silica film. Dielectric films and integrated circuits including such films are also disclosed.Type: GrantFiled: January 20, 2000Date of Patent: August 3, 2004Assignee: AlliedSignal Inc.Inventors: Hui-Jung Wu, James S. Drage
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Publication number: 20040013858Abstract: Silica dielectric films, whether nanoporous foamed silica dielectrics or nonporous silica dielectrics are readily damaged by fabrication methods and reagents that reduce or remove hydrophobic properties from the dielectric surface. The invention provides for methods of imparting hydrophobic properties to such damaged silica dielectric films present on a substrate. The invention also provides plasma-based methods for imparting hydrophobicity to both new and damaged silica dielectric films. Semiconductor devices prepared by the inventive processes are also provided.Type: ApplicationFiled: July 18, 2003Publication date: January 22, 2004Inventors: Nigel P. Hacker, Michael Thomas, James S. Drage
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Patent number: 6670022Abstract: The present invention relates to nanoporous dielectric films and to a process for their manufacture. A substrate having a plurality of raised lines on its surface is provided with a relatively high porosity, low dielectric constant, silicon containing polymer composition positioned between the raised lines and a relatively low porosity, high dielectric constant, silicon containing composition positioned on the lines.Type: GrantFiled: November 3, 2000Date of Patent: December 30, 2003Assignee: Honeywell International, Inc.Inventors: Stephen Wallace, Douglas M. Smith, Teresa Ramos, Kevin H. Rodrick, James S. Drage
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Publication number: 20030199659Abstract: An absorbing ether-like compound including a siliconethoxy, silicondiethoxy, or silicontriethoxy species attached to a naphthalene or anthracene chromophore via an oxygen linkage is used as an organic light-absorbing compound. The absorbing ether-like compound is incorporated into spin-on glass materials to provide anti-reflective coating materials for deep ultraviolet photolithography. A method of synthesizing the light-absorbing ether compounds is based on the reaction of an alcohol-substituted chromophore with an acetoxysilicon compound in the presence of alcohol. A method of making absorbing spin-on-glass materials including the absorbing ether-like compounds is also provided.Type: ApplicationFiled: April 30, 2003Publication date: October 23, 2003Inventors: Teresa Baldwin, Mary Richey, James S. Drage, Hui-Jung Wu, Richard Spear
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Patent number: 6605362Abstract: An absorbing ether-like compound including a siliconethoxy, silicondiethoxy, or silicontriethoxy species attached to a naphthalene or anthracene chromophore via an oxygen linkage is used as an organic light-absorbing compound. The absorbing ether-like compound is incorporated into spin-on glass materials to provide anti-reflective coating materials for deep ultraviolet photolithography. A method of synthesizing the light-absorbing ether compounds is based on the reaction of an alcohol-substituted chromophore with an acetoxysilicon compound in the presence of alcohol. A method of making absorbing spin-on-glass materials including the absorbing ether-like compounds is also provided.Type: GrantFiled: November 5, 2001Date of Patent: August 12, 2003Assignee: Honeywell International Inc.Inventors: Teresa Baldwin, Mary Richey, James S. Drage, Hui-Jung Wu, Richard Spear
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Patent number: 6589889Abstract: A process for forming a substantially planarized nanoporous dielectric silica coating on a substrate suitable for preparing a semiconductor device, and semiconductor devices produced by the methods of the invention. The process includes the steps of applying a composition that includes at least one silicon-based dielectric precursor to a substrate, and then, (a) gelling or aging the applied coating, (b) contacting the coating with a planarization object with sufficient pressure to transfer a planar impression to the coating without substantially impairing formation of desired nanometer-scale pore structure, (c) separating the planarized coating from the planarization object, (d) curing said planarized coating; wherein steps (a)-(d) are conducted in any one of the following sequences: (a), (b), (c) and (d); (a), (d), (b) and (c); (b), (a), (d) and (c); and (b), (c), (a) and (d).Type: GrantFiled: September 9, 1999Date of Patent: July 8, 2003Assignee: AlliedSignal Inc.Inventors: Denis H. Endisch, James S. Drage
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Publication number: 20030119335Abstract: The present invention relates to nanoporous dielectric films and to a process for their manufacture. Such films are useful in the production of integrated circuits. A precursor of an alkoxysilane, and low and high volatility solvents are mixed at a pH of about 2-5, raised to a pH of about 8 or above with a low volatility base and deposited on a semiconductor substrate. After exposure to atmospheric moisture, a nanoporous dielectric film is produced on the substrate.Type: ApplicationFiled: September 18, 2002Publication date: June 26, 2003Inventors: Stephen Wallace, Douglas M. Smith, Teresa Ramos, Kevin H. Roderick, James S. Drage, Lisa Beth Brungardt
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Publication number: 20030077918Abstract: An improved nanoporous dielectric film useful for the production of semiconductor devices, integrated circuits and the like, is provided, together with novel processes for producing these improved films.Type: ApplicationFiled: August 9, 2002Publication date: April 24, 2003Inventors: Hui-Jung Wu, James S. Drage, Lisa Brungardt, Teresa A. Ramos, Douglas M. Smith
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Publication number: 20030062600Abstract: A process for forming a nanoporous dielectric coating on a substrate. The process includes forming a substantially uniform alkoxysilane gel composition on a surface of a substrate, which alkoxysilane gel composition comprises a combination of at least one alkoxysilane, an organic solvent composition, water, and an optional base catalyst; heating the substrate for a sufficient time and at a sufficient temperature in an organic solvent vapor atmosphere to thereby condense the gel composition; and then curing the gel composition to form a nanoporous dielectric coating having high mechanical strength on the substrate.Type: ApplicationFiled: September 30, 2002Publication date: April 3, 2003Inventors: Hui-Jung Wu, James S. Drage, Teresa Ramos, Douglas M. Smith, Stephen Wallace, Kevin Roderick, Lisa Beth Brungardt
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Patent number: 6518205Abstract: A process for treating silica dielectric film on a substrate, which includes reacting a suitable hydrophilic silica film with an effective amount of a multifunctional surface modification agent. The film is present on a substrate and optionally has a pore structure with hydrophilic pore surfaces, and the reaction is conducted for a period of time sufficient for said surface modification agent to penetrate said pore structure and produce a treated silica film having a dielectric constant of about 3 or less, wherein the surface modification agent is hydrophobic and suitable for silylating or capping silanol moieties on such hydrophilic surfaces. Dielectric films and integrated circuits including such films are also disclosed.Type: GrantFiled: November 16, 2000Date of Patent: February 11, 2003Assignee: AlliedSignal Inc.Inventors: Hui-Jung Wu, James S. Drage, Douglas M. Smith, Teresa Ramos, Stephen Wallace, Neil Viernes
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Patent number: 6503850Abstract: The present invention relates to nanoporous dielectric films and to a process for their manufacture. Such films are useful in the production of integrated circuits. A precursor of an alkoxysilane, and low and high volatility solvents are mixed at a pH of about 2-5, raised to a pH of about 8 or above with a low volatility base and deposited on a semiconductor substrate. After exposure to atmospheric moisture, a nanoporous dielectric film is produced on the substrate.Type: GrantFiled: March 25, 1998Date of Patent: January 7, 2003Assignee: AlliedSignal Inc.Inventors: Stephen Wallace, Douglas M. Smith, Teresa Ramos, Kevin H. Roderick, James S. Drage, Lisa Beth Brungardt
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Patent number: 6495479Abstract: A nanoporous dielectric film useful for the production of semiconductor devices, integrated circuits and the like, is provided, together with processes for producing these improved films. The films are produced by a process that includes (a) preparing a silicon-based, precursor composition including a porogen, (b) coating a substrate with the silicon-based precursor to form a film, (c) aging or condensing the film in the presence of water, (d) heating the gelled film at a temperature and for a duration effective to remove substantially all of said porogen, and wherein the applied precursor composition is substantially aged or condensed in the presence of water in liquid or vapor form, without the application of external heat or exposure to external catalyst.Type: GrantFiled: May 5, 2000Date of Patent: December 17, 2002Assignee: Honeywell International, Inc.Inventors: Hui-Jung Wu, James S Drage, Lisa Brungardt, Teresa A. Ramos, Douglas M. Smith
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Patent number: 6489030Abstract: A microelectronic device having a cured polycarbosilane diffusion barrier is disclosed. A microelectronic device has a substrate, a dielectric layer on the substrate and metal filled vias formed through the dielectric layer. A covering of a cured polycarbosilane diffusion barrier is on the metal filled vias and the dielectric layer.Type: GrantFiled: April 14, 2000Date of Patent: December 3, 2002Assignee: Honeywell International, Inc.Inventors: Hui-Jung Wu, James S. Drage
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Publication number: 20020168876Abstract: A process for forming a substantially planarized nanoporous dielectric silica coating on a substrate suitable for preparing a semiconductor device, and semiconductor devices produced by the methods of the invention.Type: ApplicationFiled: October 26, 2001Publication date: November 14, 2002Inventors: Denis H. Endisch, James S. Drage
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Patent number: 6455130Abstract: The present invention relates to nanoporous dielectric films and to a process for their manufacture. A substrate having a plurality of raised lines on its surface is provided with a relatively high porosity, low dielectric constant, silicon containing polymer composition positioned between the raised lines and a relatively low porosity, high dielectric constant, silicon containing composition positioned on the lines.Type: GrantFiled: November 3, 2000Date of Patent: September 24, 2002Assignee: AlliedSignal Inc.Inventors: Stephen Wallace, Douglas M. Smith, Teresa Ramos, Kevin H. Roderick, James S. Drage