Patents by Inventor James Stroman Hall

James Stroman Hall has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10191016
    Abstract: A method and system for passively detecting, localizing, and/or characterizing a mechanical wave source at one or more spatial points of interest on a structure using ultrasonic guided waves are provided. The method includes estimating the spatial channel impulse response at one or more spatial points of interest using a movable transducer. Collected data recorded in response to transient mechanical waves is then combined with the spatial channel impulse response estimates to detect, localize, and/or characterize the source. A direct path from the mechanical wave source to each transducer is not required. Anisotropies and variations between transducer transfer functions may be accounted for and all propagation paths may be used to perform source localization. The method and system may leverage structural complexity rather than ignore it.
    Type: Grant
    Filed: March 14, 2013
    Date of Patent: January 29, 2019
    Inventors: James Stroman Hall, Jennifer Emmons Michaels
  • Patent number: 10126274
    Abstract: A method and system of detecting, localizing, and characterizing a defect at one or more spatial points of interest on a structure. The method may include collecting first data in a first state using one or more transducers on the structure, collecting second data in a second state subsequent to the first state, computing a scattered impulse response based on the collected first data and the collected second data, comparing the scattered impulse response with an estimated scattered impulse response corresponding to the case when damage is present at one or more spatial points of interest on the structure, and combining the generated comparison results to detect, localize, and characterize a defect at the one or more spatial points of interest on the structure.
    Type: Grant
    Filed: January 25, 2013
    Date of Patent: November 13, 2018
    Assignee: HIDDEN SOLUTIONS LLC
    Inventors: James Stroman Hall, Jennifer Emmons Michaels
  • Patent number: 9876562
    Abstract: Systems and methods to generate virtual spot beams are provided. The system includes a first antenna that provides a first physical spot beam that represents a radio frequency (RF) signal received from a remote source. The system also includes a second antenna that provides a second physical spot beam that represents the RF signal received from the remote source. The system further includes a beam formation module that is communicatively to the first and second antennas and that performs a beam formation operation on the first and second physical spot beams to generate one or more virtual spot beams.
    Type: Grant
    Filed: January 14, 2014
    Date of Patent: January 23, 2018
    Assignee: EMPIRE TECHNOLOGY DEVELOPMENT LLC
    Inventor: James Stroman Hall
  • Publication number: 20150341110
    Abstract: Systems and methods to generate virtual spot beams are provided. The system includes a first antenna that provides a first physical spot beam that represents a radio frequency (RF) signal received from a remote source. The system also includes a second antenna that provides a second physical spot beam that represents the RF signal received from the remote source. The system further includes a beam formation module that is communicatively to the first and second antennas and that performs a beam formation operation on the first and second physical spot beams to generate one or more virtual spot beams.
    Type: Application
    Filed: January 14, 2014
    Publication date: November 26, 2015
    Applicant: Empire Technology Development LLC
    Inventor: James Stroman HALL
  • Publication number: 20150160169
    Abstract: A method and system of detecting, localizing, and characterizing a defect at one or more spatial points of interest on a structure. The method may include collecting first data in a first state using one or more transducers on the structure, collecting second data in a second state subsequent to the first state, computing a scattered impulse response based on the collected first data and the collected second data, comparing the scattered impulse response with an estimated scattered impulse response corresponding to the case when damage is present at one or more spatial points of interest on the structure, and combining the generated comparison results to detect, localize, and characterize a defect at the one or more spatial points of interest on the structure.
    Type: Application
    Filed: January 25, 2013
    Publication date: June 11, 2015
    Applicant: HIDDEN SOLUTIONS LLC
    Inventors: James Stroman Hall, Jennifer Emmons Michaels
  • Publication number: 20150106037
    Abstract: A method and system for passively detecting, localizing, and/or characterizing a mechanical wave source at one or more spatial points of interest on a structure using ultrasonic guided waves are provided. The method includes estimating the spatial channel impulse response at one or more spatial points of interest using a movable transducer. Collected data recorded in response to transient mechanical waves is then combined with the spatial channel impulse response estimates to detect, localize, and/or characterize the source. A direct path from the mechanical wave source to each transducer is not required. Anisotropies and variations between transducer transfer functions may be accounted for and all propagation paths may be used to perform source localization. The method and system may leverage structural complexity rather than ignore it.
    Type: Application
    Filed: March 14, 2013
    Publication date: April 16, 2015
    Inventors: James Stroman Hall, Jennifer Emmons Michaels
  • Patent number: 6343358
    Abstract: Apparatus for processing data is provided, said apparatus comprising: a main processor 4; an instruction transfer register ITR for holding a data processing instruction and accessible via a first serial scan chain SC4; a data transfer register DTR for holding a data value and accessible via a second serial scan chain SC5; debug logic 6, 12 for controlling said main processor 4, said instruction transfer register ITR and said data transfer register DTR such that a data processing instruction held within said instruction transfer register ITR is passed a plurality of times to said main processor 4 for execution upon a sequence of data values scanned into or from said data transfer register via said second serial scan chain. In this way operational speed of the debug mode is increased since the data processing instruction only needs to be transferred once.
    Type: Grant
    Filed: May 19, 1999
    Date of Patent: January 29, 2002
    Assignee: Arm Limited
    Inventors: David Vivian Jaggar, William Adam Hohl, James Stroman Hall