Patents by Inventor James T. Flick

James T. Flick has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for diagnosing heart disease, predicting sudden death, and analyzing treatment response using multifractal analysis
    Patent number: 6993377
    Abstract: A method of analyzing electrocardiogram (EKG) data for use in the diagnosis of heart disease, prognosis of cardiac conditions, and the monitoring of heart disease therapies is disclosed. The method utilizes a wavelet-based multifractal analysis with one or more of (1) a discrete wavelet smoothing step to remove the effects of abnormal beats; (2) “Levy flight” analysis to detect the frequency of abnormal beats known to adversely affect the multifractal (MF) analysis; and (3) MF alpha analysis, a multifractal extension of monofractal short term (ST) alpha analysis. The invention further comprises an EKG test battery comprising Levy flight anomalous beat/beat cluster screening, followed by (ST) MF alpha analysis and MF Holder analysis (when validated by the Levy flight analysis). The wavelet smoothing step can also be used to classify human EKGs by observing the effect of sequential smoothing on the MF Holder coefficient.
    Type: Grant
    Filed: February 22, 2002
    Date of Patent: January 31, 2006
    Assignee: The Board of Trustees of the University of Arkansas
    Inventors: James T. Flick, Jacob Joseph
  • Method for diagnosing heart disease, predicting sudden death, and analyzing treatment response using multifractial analysis
    Publication number: 20030163057
    Abstract: A method of analyzing electrocardiogram (EKG) data for use in the diagnosis of heart disease, prognosis of cardiac conditions, and the monitoring of heart disease therapies is disclosed. The method utilizes a wavelet-based multifractal analysis with one or more of (1) a discrete wavelet smoothing step to remove the effects of abnormal beats; (2) “Levy flight” analysis to detect the frequency of abnormal beats known to adversely affect the multifractal (MF) analysis; and (3) MF alpha analysis, a multifractal extension of monofractal short term (ST) alpha analysis. The invention further comprises an EKG test battery comprising Levy flight anomalous beat/beat cluster screening, followed by (ST) MF alpha analysis and MF Holder analysis (when validated by the Levy flight analysis). The wavelet smoothing step can also be used to classify human EKGs by observing the effect of sequential smoothing on the MF Holder coefficient.
    Type: Application
    Filed: February 22, 2002
    Publication date: August 28, 2003
    Inventors: James T. Flick, Jacob Joseph