Patents by Inventor James Thaddeus Wegner

James Thaddeus Wegner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Microspot reflectometer
    Patent number: 12723980
    Abstract: A reflectometer configured to test a sample. The reflectometer includes a light source that emits a light beam to the sample that is placed on a sample holder. The reflectometer focuses the light beam to a reduced spot size on the sample. The reflectometer is configured to view structure/defects in the sample using a detector that is downstream from the sample.
    Type: Grant
    Filed: April 17, 2023
    Date of Patent: September 1, 2026
    Assignee: THE BOEING COMPANY
    Inventors: Brian Gunther, James Thaddeus Wegner, Jeffery Thomas Murphy
  • Microspot Reflectometer
    Publication number: 20240344980
    Abstract: A reflectometer configured to test a sample. The reflectometer includes a light source that emits a light beam to the sample that is placed on a sample holder. The reflectometer focuses the light beam to a reduced spot size on the sample. The reflectometer is configured to view structure/defects in the sample using a detector that is downstream from the sample.
    Type: Application
    Filed: April 17, 2023
    Publication date: October 17, 2024
    Inventors: Brian Gunther, James Thaddeus Wegner, Jeffery Thomas Murphy