Abstract: For bit errors caused by intrinsic cell variations, the bit errors are scattered across a page of memory. However, for bit errors caused by a physical issue in memory, the bit errors cluster together within the same memory area. In an example data storage device, a page of memory is divided into sections, and counters are used to count the number of errors in each section. A physical error location is detected if the number exceeds a parameter, and as compared to the number of errors in the other sections. In another example data storage device having an error correction code (ECC) engine, a histogram and binomial probability are used to detect physical errors. This has the advantage of detecting weak memory blocks that are about to fail, so the blocks can be retired early as a grown bad block.

Abstract: A neck exercise apparatus comprises a thin elongate leaf spring spanning between two supports. One or both of the supports includes a clamping actuator configured for clamping the leaf spring to the support during exercise. The actuator is also configured for releasing the clamping force, thereby permitting adjustment of the position of the support along the length of the leaf spring. Lower ends of the supports are configured to permit the supports to pivot over a flat support surface as the leaf spring is flexed during exercise.