Patents by Inventor James Trolinger

James Trolinger has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11768462
    Abstract: Embodiments described herein provide an integrated holographic reconstruction platform that enables a user to perform three-dimensional visualization of a phenomenon by reconstructing holograms using a combination of normalization and propagation algorithms, which yields better results with significantly less demanding processing time and computing resources. Specifically, the integrated holographic reconstruction platform may be implemented as an all-in-one computer software that includes software components of digital holographic reconstruction, de-twinning and optical distortion removal via a user-friendly graphical interface.
    Type: Grant
    Filed: July 13, 2021
    Date of Patent: September 26, 2023
    Assignees: METROLASER, INC., NAVAIR LAKEHURST, NAVAL AIR WARFARE CENTER AD (LKE)
    Inventors: Mohammad Mansoor, James Trolinger, Jacob George
  • Publication number: 20230020038
    Abstract: Embodiments described herein provide an integrated holographic reconstruction platform that enables a user to perform three-dimensional visualization of a phenomenon by reconstructing holograms using a combination of normalization and propagation algorithms, which yields better results with significantly less demanding processing time and computing resources. Specifically, the integrated holographic reconstruction platform may be implemented as an all-in-one computer software that includes software components of digital holographic reconstruction, de-twining and optical distortion removal via a user-friendly graphical interface.
    Type: Application
    Filed: July 13, 2021
    Publication date: January 19, 2023
    Inventors: Mohammad Mansoor, James Trolinger, Jacob George
  • Publication number: 20050036135
    Abstract: A system for quantifying surface characteristics detects and quantifies characteristics of a surface of an object. For example, the system may quantify changes in surface roughness without contacting the specimen and without requiring precise temporal or spatial stability. The system may also quantify the evolution or progression of a particular characteristic of a surface, such as a defect, a slipband, a crack, a microcrack, a pit, a damage feature, corrosion, a contour change, an impact crater, a change in residual stress, and so on. The system may include an energy source, a detector section, and a process section. The energy source transmits a source signal to the surface of the object. The source signal is specularly reflected and/or scattered by the surface to yield one or more received signals. The detector section receives the received signal and, in turn, provides a detector signal indicative of the received signal.
    Type: Application
    Filed: April 12, 2004
    Publication date: February 17, 2005
    Inventors: James Earthman, Vladimir Markov, James Trolinger, Derek Dunn-Rankin, Benjamin Buckner