Abstract: On-chip circuitry facilitates fuse testing in customized integrated circuits. The circuitry has specific application in testing fuse redundancy high end memories. A latch assisted fuse testing (LAFT) methodology employs an on-chip latch stack which can be used in place of the fuses. The latches in the stack are programmable and can perform the same function as the fuses during chip operation. This allows testing or experimentation to be performed nondestructively, without blowing any fuses. In one particular application of the invention, memory arrays with redundant blocks on a chip are provided with the on-chip latch stack. After the tests based on previously generated error data are performed using the latch stack, fuses are blown to repair the memory array by replacing defective memory blocks with redundant blocks.

Abstract: The present invention relates to a memory cell, and more particularly to a single-bit, dual-port cell, and a single-sided read circuit for use with one or more such cells. The cell may, in one embodiment, be used in a static random access memory (RAM) array, and may be implemented in BICMOS technology on an integrated circuit. The cell has a flip-flop storage unit comprising a CMOS circuit of cross-coupled inverters coupled to dual CMOS pass gates to provide isolation and data transfer. The storage unit is also coupled to a bipolar read line driver in a particular configuration to accomplish rapid bit line pull-up or pulldown for high speed read operation. Several alternative embodiments are disclosed.

Abstract: According to the disclosure a transmitter assembly is provided having a transmitter member, which is preferably separate from and cooperates with both a rod blank and a rod handle. In a preferred form the transmitter member extends within a hollow portion of the rod blank. A transmitter element is interposed between an inside surface bounding the hollow portion of the rod blank and the transmitter member to effectively conduct vibrations imparted through the rod blank to the transmitter member. The transmitter member is associated with the rod handle so that a user can effectively sense vibration of the transmitter member.