Patents by Inventor James W. Kramer

James W. Kramer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11955239
    Abstract: Systems and methods for ensuring medical diagnostic test integrity are disclosed. In particular, systems and methods herein can be used to ensure compliance with testing procedures. Some embodiments provide systems and methods for verifying test results. According to some embodiments, test results can be non-human-readable results that can be interpreted by a computing system.
    Type: Grant
    Filed: February 9, 2023
    Date of Patent: April 9, 2024
    Assignee: EMED LABS, LLC
    Inventors: Michael W. Ferro, Jr., Zachary Carl Nienstedt, Sam Miller, Marco Magistri, Nicholas Atkinson Kramer, James Thomas Heising
  • Patent number: 6775006
    Abstract: An analysis method for analyzing height-scanning interferometry data from a test surface, the method including: calculating a coherence profile and a phase profile for the test surface based on the data; calculating an experimental phase gap map based on a difference between the phase profile and the coherence profile; filtering the experimental phase gap map to remove noise; and using the filtered phase gap map to improve an estimate for a height profile of the test surface.
    Type: Grant
    Filed: November 2, 2001
    Date of Patent: August 10, 2004
    Assignee: Zygo Corporation
    Inventors: Peter De Groot, James W. Kramer
  • Patent number: 6597460
    Abstract: The invention features a surface profiling method including: collecting interferometric data related to a surface profile of a measurement object; and calculating the surface profile based on the collected interferometric data and at least one value indicative of dispersion in the phase change on reflection (PCOR) of the profiled surface of the measurement object. The invention also features a surface profiling system including: an interferometry system which during operation provides interferometric data related to a surface profile of a measurement object; and an electronic processor coupled the interferometry system, wherein during operation the electronic processor calculates the surface profile based on the interferometric data and at least one parameter indicative of dispersion in the phase change on reflection (PCOR) of the profiled surface of the measurement object.
    Type: Grant
    Filed: January 25, 2001
    Date of Patent: July 22, 2003
    Assignee: Zygo Corporation
    Inventors: Peter De Groot, Xavier Colonna De Lega, Leslie L. Deck, James W. Kramer
  • Publication number: 20020135775
    Abstract: An analysis method for analyzing height-scanning interferometry data from a test surface, the method including: calculating a coherence profile and a phase profile for the test surface based on the data; calculating an experimental phase gap map based on a difference between the phase profile and the coherence profile; filtering the experimental phase gap map to remove noise; and using the filtered phase gap map to improve an estimate for a height profile of the test surface.
    Type: Application
    Filed: November 2, 2001
    Publication date: September 26, 2002
    Inventors: Peter De Groot, James W. Kramer
  • Publication number: 20010050773
    Abstract: The invention features a surface profiling method including: collecting interferometric data related to a surface profile of a measurement object; and calculating the surface profile based on the collected interferometric data and at least one value indicative of dispersion in the phase change on reflection (PCOR) of the profiled surface of the measurement object. The invention also features a surface profiling system including: an interferometry system which during operation provides interferometric data related to a surface profile of a measurement object; and an electronic processor coupled the interferometry system, wherein during operation the electronic processor calculates the surface profile based on the interferometric data and at least one parameter indicative of dispersion in the phase change on reflection (PCOR) of the profiled surface of the measurement object.
    Type: Application
    Filed: January 25, 2001
    Publication date: December 13, 2001
    Inventors: Peter De Groot, Xavier Colonna De Lega, Leslie L. Deck, James W. Kramer
  • Patent number: 4592688
    Abstract: A hanger assembly for securing insulation or refractory linings to walls includes a circular stud which includes a flattened locking section of relatively short axial extent forming laterally projecting lugs, a somewhat less flattened anti-rotation section of substantial axial extent inwardly adjacent the locking section, and an unflattened or rotation section of short axial extent inwardly adjacent the anti-rotation section, whereby a quarter-turn retaining washer may be positioned over the stud to the rotation section, rotated a quarter turn and then moved outwardly along the anti-rotation section to engage and lock against the underside of the locking section.
    Type: Grant
    Filed: August 12, 1983
    Date of Patent: June 3, 1986
    Assignee: Erico Products, Inc.
    Inventor: James W. Kramer