Patents by Inventor James William Vogh, Jr.

James William Vogh, Jr. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10049294
    Abstract: The present disclosure advantageously provides apparatus, systems and methods which facilitate estimating and accounting for illumination conditions, viewing conditions and reflectance characteristics for imaged surfaces when performing color measurement, correction and/or transformation in an imaging process, such as photography. Advantageously, the disclosed apparatus, systems and methods may utilize a set of one or more illumination target elements for extrapolating illumination conditions from an imaged scene. The disclosure may be used to improve determination of color correction/transformation parameters and/or to facilitate determining a reflectance model for a target surface of interest.
    Type: Grant
    Filed: January 30, 2015
    Date of Patent: August 14, 2018
    Assignee: X-Rite Switzerland GmbH
    Inventors: James William Vogh, Jr., Olivier Calas, Beat Frick
  • Patent number: 9823131
    Abstract: Exemplary embodiments of the present disclosure are related to a color target and methods and systems for estimating a spectral reflectance of the color target based on an image of the color target. The color target can include a substrate having a target surface, a sample window formed in the substrate and defining perimeter within which a sample surface is disposed, and one or more filters disposed the sample surface. The one or more filters are configured to cover a first portion of the sample surface, while leaving a second portion of the sample surface uncovered.
    Type: Grant
    Filed: June 2, 2015
    Date of Patent: November 21, 2017
    Assignee: X-Rite Switzerland GmbH
    Inventors: James William Vogh, Jr., Jeremiah Snader, Olivier Calas, Jr., Niti Yadav, Leonel Fernando Mora
  • Publication number: 20160356651
    Abstract: Exemplary embodiments of the present disclosure are related to a color target and methods and systems for estimating a spectral reflectance of the color target based on an image of the color target. The color target can include a substrate having a target surface, a sample window formed in the substrate and defining perimeter within which a sample surface is disposed, and one or more filters disposed the sample surface. The one or more filters are configured to cover a first portion of the sample surface, while leaving a second portion of the sample surface uncovered.
    Type: Application
    Filed: June 2, 2015
    Publication date: December 8, 2016
    Applicant: X-Rite Switzerland GmbH
    Inventors: James William Vogh, JR., Jeremiah Snader, Olivier Calas, JR., Niti Yadav, Leonel Fernando Mora
  • Publication number: 20160224861
    Abstract: The present disclosure advantageously provides apparatus, systems and methods which facilitate estimating and accounting for illumination conditions, viewing conditions and reflectance characteristics for imaged surfaces when performing color measurement, correction and/or transformation in an imaging process, such as photography. Advantageously, the disclosed apparatus, systems and methods may utilize a set of one or more illumination target elements for extrapolating illumination conditions from an imaged scene. The disclosure may be used to improve determination of color correction/transformation parameters and/or to facilitate determining a reflectance model for a target surface of interest.
    Type: Application
    Filed: January 30, 2015
    Publication date: August 4, 2016
    Applicant: X-RITE SWITZERLAND GMBH
    Inventors: James William Vogh, JR., Olivier Calas, JR., Beat Frick
  • Patent number: 7830514
    Abstract: Systems and methods are provided to address the potential impact of lighting conditions/light sources on color measurement and/or color matching, particularly as such light variation relates to UV levels. The systems and methods generally include a UV visualizer that is adapted to establish and/or compare UV profiles for individual substrates/samples, e.g., print materials, under various illuminating conditions. According to the disclosure, it is possible to determine both (i) how a sample (e.g., a printing material) responds to UV light, and (ii) the amount of UV light under which the sample is viewed without the need to measure the excitation pattern of the sample/paper or the spectra of the illuminating light. In this way, a true color reading and/or color match may be achieved. Color corrections may be implemented that necessarily address the level of color brightener, if any, in the substrate or paper to be printed upon.
    Type: Grant
    Filed: October 16, 2007
    Date of Patent: November 9, 2010
    Assignee: X-Rite, Inc.
    Inventor: James William Vogh, Jr.
  • Publication number: 20090097028
    Abstract: Systems and methods are provided to address the potential impact of lighting conditions/light sources on color measurement and/or color matching, particularly as such light variation relates to UV levels. The systems and methods generally include a UV visualizer that is adapted to establish and/or compare UV profiles for individual substrates/samples, e.g., print materials, under various illuminating conditions. According to the disclosure, it is possible to determine both (i) how a sample (e.g., a printing material) responds to UV light, and (ii) the amount of UV light under which the sample is viewed without the need to measure the excitation pattern of the sample/paper or the spectra of the illuminating light. In this way, a true color reading and/or color match may be achieved. Color corrections may be implemented that necessarily address the level of color brightener, if any, in the substrate or paper to be printed upon.
    Type: Application
    Filed: October 16, 2007
    Publication date: April 16, 2009
    Applicant: X-RITE, INC.
    Inventor: James William Vogh, JR.