Abstract: Field data is collected of a field. Each instance of field data contains information that can be used to determine a value corresponding to whether or not a plant is present or absent in a particular location and is referred to as a plant presence value. The plant presence values are aggregated using the position data associated with each instance of field data to generate aggregated plant presence values. Gaps between plots are identified based partly on variations in the plant presence values within the aggregated field data. Information known about a field can be used to heuristically identify gaps in a seed line or used to eliminate locations on a seed line that may look like a gap based on low plant presence values. The aggregated plant presence values can be presented as a heat map of plant presence values showing the relative plant density of the field.

Abstract: Field data is collected of a field. Each instance of field data contains information that can be used to determine a value corresponding to whether or not a plant is present or absent in a particular location and is referred to as a plant presence value. The plant presence values are aggregated using the position data associated with each instance of field data to generate aggregated plant presence values. Gaps between plots are identified based partly on variations in the plant presence values within the aggregated field data. Information known about a field can be used to heuristically identify gaps in a seed line or used to eliminate locations on a seed line that may look like a gap based on low plant presence values. The aggregated plant presence values can be presented as a heat map of plant presence values showing the relative plant density of the field.

Abstract: Field data is collected of a field. Each instance of field data contains information that can be used to determine a value corresponding to whether or not a plant is present or absent in a particular location and is referred to as a plant presence value. The plant presence values are aggregated using the position data associated with each instance of field data to generate aggregated plant presence values. Gaps between plots are identified based partly on variations in the plant presence values within the aggregated field data. Information known about a field can be used to heuristically identify gaps in a seed line or used to eliminate locations on a seed line that may look like a gap based on low plant presence values. The aggregated plant presence values can be presented as a heat map of plant presence values showing the relative plant density of the field.

Abstract: Field data is collected of a field. Each instance of field data contains information that can be used to determine a value corresponding to whether or not a plant is present or absent in a particular location and is referred to as a plant presence value. The plant presence values are aggregated using the position data associated with each instance of field data to generate aggregated plant presence values. Gaps between plots are identified based partly on variations in the plant presence values within the aggregated field data. Information known about a field can be used to heuristically identify gaps in a seed line or used to eliminate locations on a seed line that may look like a gap based on low plant presence values. The aggregated plant presence values can be presented as a heat map of plant presence values showing the relative plant density of the field.

Abstract: An inflatable structure to surround a dwelling comprising: a sand base; a plurality of inflatable tubes stacked vertically on the sand base; a lip extending from the sand base; and a plurality of securing pins extending through the lip, where the plurality of pins secures the inflatable structure to the ground. The each inflatable tube may include an air nozzle, where the air nozzle enables the inflatable of each respective tube. A zipper may be provided at each end of the plurality of inflatable tubes. The inflatable structure may also include a ribbed bottom surface to provide further support.

Abstract: The present invention is directed to a method for thermally processing a substrate in a thermal processing system. The method provides an amount of heat to the substrate and obtains information associated with the substrate when the amount of heat is provided. For example, the substrate is provided at a presoak position within the thermal processing system, wherein the presoak position, and one or more properties associated with the substrate, such as a position and temperature, are measured. An optimal process parameter value to provide an optimal thermal uniformity of the substrate is then determined, based, at least in part, on the information obtained from the substrate. For example, a soak position of the substrate is determined, wherein the determination is based, at least in part, on the one or more measured properties associated with the substrate, and a thermal uniformity associated with a reference data set.

Abstract: A method for implementing FDC in an APC system including receiving an FDC model from memory; providing the FDC model to a process model calculation engine; computing a vector of predicted dependent process parameters using the process model calculation engine; receiving a process recipe comprising a set of recipe parameters, providing the process recipe to a process module; executing the process recipe to produce a vector of measured dependent process parameters; calculating a difference between the vector of predicted dependent process parameters and the vector of measured dependent process parameters; comparing the difference to a threshold value; and declaring a fault condition when the difference is greater than the threshold value.

Abstract: The present invention is directed to a method for thermally processing a substrate in a thermal processing system. The method comprises providing an amount of heat to the substrate and obtaining information associated with the substrate when the amount of heat is provided. For example, the substrate is provided at a presoak position within the thermal processing system, wherein the presoak position, and one or more properties associated with the substrate, such as a position and temperature, are measured. An optimal process parameter value to provide an optimal thermal uniformity of the substrate is then determined, based, at least in part, on the information obtained from the substrate. For example, a soak position of the substrate is determined, wherein the determination is based, at least in part, on the one or more measured properties associated with the substrate, and a thermal uniformity associated with a reference data set.

Abstract: A system and a computer-implemented method of operating a processing system in which a process model is selected from a menu of process models available from the processing system. In the module and method, an experiment is designed having a number of process runs for characterization of the selected process model. Process runs to collect data are executed on a processing tool coupled to the processing system. The actual process results from the process runs are measured. The process model is solved for coefficients of the process model.

Abstract: A method of automatically configuring an Advanced Process Control (APC) system for a semiconductor manufacturing environment in which an auto-configuration script is generated for executing an auto-configuration program. The auto-configuration script activates default values for input to the auto-configuration program. The auto-configuration script is executed to generate an enabled parameter file output from the auto-configuration program. The enabled parameter file identifies parameters for statistical process control (SPC) chart generation.

Abstract: The present invention provides for an improved data collection system comprising a measurement device and a controller, wherein the controller provides at least one algorithm for data handling, storage and manipulation. The present invention further provides for an improved method of data handling, storage and manipulation comprising the steps of: measuring a first set of data using a measurement device coupled to a process reactor, producing a first set of reduced data using a peak extraction algorithm executed on a controller coupled to the measurement device, wherein the first set of reduced data comprises a data volume equal to or less than a data volume of the first set of data. In an alternate embodiment of the present invention a first reduced data set and a second reduced data set can be determined, compared and correlated with a state of the plasma processing system. The state of the plasma processing system can include an endpoint condition or a fault condition.