Abstract: Robot-assisted package delivery with integrated curbside parking monitoring and curb operations optimization is disclosed herein. An example method includes dispatching a delivery vehicle and delivery robot to a delivery location, the delivery location including a parking location for the delivery vehicle that allows for deployment of the delivery robot on a delivery mission, determining occupancy of the parking location, the delivery vehicle parking at the parking location when the parking location is unoccupied, the delivery robot being deployed upon parking of the delivery vehicle, and instructing the delivery vehicle to remain parked during the delivery mission or to leave the parking location and return at later point in time based on an estimated time of arrival of the delivery robot after the delivery mission.

Abstract: An integrated circuit includes one or more processing units that execute instructions that employ a register file, control logic creates a pre-startup register free list, prior to normal operation of at least one of the processing units, that includes a list of registers devoid of defective registers. In some implementations, no column and row repair information is provided to register file repair logic. In certain examples, the register file is configured as a repair-less register file. During normal operation of the one or more processing units, the integrated circuit employs the pre-startup register free list to select registers in a register file for the executing instructions. Associated methods are also presented.

Abstract: An integrated circuit includes one or more processing units that execute instructions that employ a register file, control logic creates a pre-startup register free list, prior to normal operation of at least one of the processing units, that includes a list of registers devoid of undefective registers. In some implementations, no column and row repair information is provided to register file repair logic. In certain examples, the register file is configured as a repair-less register file. During normal operation of the one or more processing units, the integrated circuit employs the pre-startup register free list to select registers in a register file for the executing instructions. Associated methods are also presented.

Abstract: An integrated circuit includes a memory core and a built-in self-test (BIST) controller. The memory core has an array of memory cells located at intersections of a plurality of word lines and a plurality of bit line pairs. The BIST controller is coupled to the memory core and has a mission mode and a built-in self-test mode. When in the mission mode, the BIST controller performs read and write accesses using precharge on demand. When in the built-in self-test mode, the BIST controller performs a floating bit line test by draining a voltage on true and complement bit lines of a selected bit line pair and subsequently precharging the true and complement bit lines of the selected bit line pair, before reading or writing data using the true and complement bit lines of the selected bit line pair.

Abstract: An integrated circuit includes a memory core and a built-in self-test (BIST) controller. The memory core has an array of memory cells located at intersections of a plurality of word lines and a plurality of bit line pairs. The BIST controller is coupled to the memory core and has a mission mode and a built-in self-test mode. When in the mission mode, the BIST controller performs read and write accesses using precharge on demand. When in the built-in self-test mode, the BIST controller performs a floating bit line test by draining a voltage on true and complement bit lines of a selected bit line pair and subsequently precharging the true and complement bit lines of the selected bit line pair, before reading or writing data using the true and complement bit lines of the selected bit line pair.

Abstract: A test circuit for a functional circuit includes a scan chain coupled to the functional circuit, and a controller coupled to the scan chain, for controlling the scan chain to scan a test pattern into the scan chain, and subsequently and repetitively for a multiple number of times launch the test pattern to the functional circuit, capture test data into the scan chain, and restore the test pattern in the scan chain for subsequent launch.

Abstract: A test circuit for a functional circuit includes a scan chain coupled to the functional circuit, and a controller coupled to the scan chain, for controlling the scan chain to scan a test pattern into the scan chain, and subsequently and repetitively for a multiple number of times launch the test pattern to the functional circuit, capture test data into the scan chain, and restore the test pattern in the scan chain for subsequent launch.