Patents by Inventor James Wyant

James Wyant has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9774561
    Abstract: A distribution host may receive an electronic document from a sender device that includes content distribution designations. Based on the content distribution designations, the distribution host may determine that a portion of the electronic document is designated for distribution to multiple recipients. The distribution host may further determine that an additional portion of the electronic document is designated for distribution to a particular recipient of the multiple recipients. Accordingly, the distribution host may distribute the portion as a version of the electronic document to the recipient devices of one or more recipients that does not include the particular recipient. Further, the distribution host may distribute the portion and the additional portion as an additional version of the electronic document exclusively to a recipient device of the particular recipient.
    Type: Grant
    Filed: March 10, 2014
    Date of Patent: September 26, 2017
    Assignee: Amazon Technologies, Inc.
    Inventors: Monica Marie Rapp, Benjamin James Wyant
  • Publication number: 20060203251
    Abstract: The tilted relationship between the reference and test mirrors (24,26) of a Fizeau interferometer is used to spatially separate the reflections (R,T) from the two surfaces. The separate beams (R,T) are filtered through a spatial polarization element (32) that provides different states of polarization to the beams. The beams (R,T) are subsequently recombined to form a substantially collinear beam that is processed using a spatial-phase-shift interferometer (44) that permits quantitative phase measurement in a single video frame. Alternatively, two beams (104,106) with orthogonal polarization are injected into the Fizeau cavity (20) at different angles, such that after reflection from the reference and test optics (24,26) they are substantially collinear. Unwanted reflections are blocked at the focal plane through the use of a circular aperture (112).
    Type: Application
    Filed: May 9, 2006
    Publication date: September 14, 2006
    Inventors: James Millerd, James Wyant
  • Publication number: 20050046864
    Abstract: The tilted relationship between the reference and test mirrors of a Fizeau interferometer is used to spatially separate the reflections from the two surfaces. The separate beams are filtered through a spatial polarization element that provides different states of polarization to the beams. The beams are subsequently recombined to form a substantially collinear beam that is processed using a spatial-phase-shift interferometer that permits quantitative phase measurement in a single video frame. Alternatively, two beams with orthogonal polarization are injected into the Fizeau cavity at different angles, such that after reflection from the reference and test optics they are substantially collinear. Unwanted reflections are blocked at the focal plane through the use of a circular aperture. Short coherence length light and a delay line may be used to mitigate stray reflections, reduce measurement integration times, and implement temporal phase averaging.
    Type: Application
    Filed: December 24, 2003
    Publication date: March 3, 2005
    Inventors: James Millerd, James Wyant
  • Publication number: 20050046863
    Abstract: A polarizing point-diffraction plate is used to produce common-path test and reference wavefronts with mutually orthogonal polarizations from an input wavefront. The common-path test and reference wavefronts are collimated, phase shifted and interfered, and the resulting interferograms are imaged on a detector. The interference patterns are then processed using conventional algorithms to characterize the input light wavefront.
    Type: Application
    Filed: August 29, 2003
    Publication date: March 3, 2005
    Inventors: James Millerd, Neal Brock, John Hayes, James Wyant
  • Publication number: 20050046865
    Abstract: A phase-difference sensor measures the spatially resolved difference in phase between orthogonally polarized reference and test wavefronts. The sensor is constructed as a pixelated phase-mask aligned to and imaged on a pixelated detector array. Each adjacent pixel of the phase-mask measures a predetermined relative phase shift between the orthogonally polarized reference and test beams. Thus, multiple phase-shifted interferograms can be synthesized at the same time by combining pixels with identical phase-shifts. The multiple phase-shifted interferograms can be combined to calculate standard parameters such as modulation index or average phase step. Any configuration of interferometer that produces orthogonally polarized reference and object beams may be combined with the phase-difference sensor of the invention to provide, single-shot, simultaneous phase-shifting measurements.
    Type: Application
    Filed: May 4, 2004
    Publication date: March 3, 2005
    Inventors: Neal Brock, James Millerd, James Wyant, John Hayes