Patents by Inventor Jan A. P. VAN Riet

Jan A. P. VAN Riet has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Testing method for the separate determination of varying work surface flaws and arrangement for said method
    Patent number: 4055382
    Abstract: A process and apparatus for the automatic checking of machined part surfaces for surface flaws by means of bundled light rays which are directed onto the surface to be checked by means of optical instruments, whereby the light rays are reflected by the surface with varying intensity and in accordance with the nature of the surface, and whereby the light rays, at least partly, are redirected via optical instruments towards at least one light-sensitive element which converts the reflected light energy into electrical signals, and the step of separately evaluating the reflected amount of light as far as its varying intensity and dispersion is concerned, in order to indicate surface flaws of different types, as for example, material and machining flaws.
    Type: Grant
    Filed: January 27, 1976
    Date of Patent: October 25, 1977
    Assignee: SKF Industrial Trading and Development Company, B.V.
    Inventors: Paul Ziekman, Jan A. P. VAN Riet