Abstract: A method and apparatus are provided for automatic application and monitoring of a structure to be applied onto substrate. A plurality of cameras positioned around an application facility are utilized to monitor the automatic application of a structure on a substrate by means of a stereometry procedure. Three-dimensional recognition of a reference contour position results in the overlapping area to be used for gross adjustment of the application facility prior to applying the structure.

Abstract: A method and apparatus are provided for automatic application and monitoring of a structure to be applied onto substrate. A plurality of cameras positioned around an application facility are utilized to monitor the automatic application of a structure on a substrate by means of a stereometry procedure. Three-dimensional recognition of a reference contour position results in the overlapping area to be used for gross adjustment of the application facility prior to applying the structure.

Abstract: Disclosed is a method or device for recognizing a structure, preferably a bead or trace of adhesive material (20), which is to be applied to a substrate (30), with the aid of at least two cameras, more particularly three or more cameras (12, 13, 14). The structure, which is to be applied, is applied to the substrate using an applicator device (11), whereupon the structure, which is applied to the substrate by means of the applicator device, is monitored by the cameras in such a way that the cameras are oriented towards the applied structure with at least one overlapping area, wherein the applied structure, particularly the edges of the trace of adhesive, is determined on a revolving orbit around the applicator device and the revolving orbit is pre-defined in such a way that the applied structure intersects the revolving orbit after it has been applied to the substrate.

Abstract: A method and apparatus are provided for automatic application and monitoring of a structure to be applied onto substrate. A plurality of cameras positioned around an application facility are utilized to monitor the automatic application of a structure on a substrate by means of a stereometry procedure. Three-dimensional recognition of a reference contour position results in the overlapping area to be used for gross adjustment of the application facility prior to applying the structure.

Abstract: A method and apparatus are provided for automatic application and monitoring of a structure to be applied onto substrate. A plurality of cameras positioned around an application facility are utilized to monitor the automatic application of a structure on a substrate by means of a stereometry procedure. Three-dimensional recognition of a reference contour position results in the overlapping area to be used for gross adjustment of the application facility prior to applying the structure.