Patents by Inventor Jan Bonnet

Jan Bonnet has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Automated scanning method for pathology samples
    Patent number: 7133543
    Abstract: Scanning and analysis of cytology and histology samples uses a flatbed scanner to capture images of the structures of interest such as tumor cells in a manner that results in sufficient image resolution to allow for the analysis of such common pathology staining techniques as ICC (immunocytochemistry), IHC (immunohistochemistry) or in situ hybridization. Very large volumes of such material are scanned in order to identify cells or clusters of cells which are positive or warrant more detailed examination, and if analysis at higher resolution is necessary, information regarding these positive events is transferred to a secondary microscope, such as a conventional scanning microscope, to allow further analysis and review of the selected regions of the slide containing the sample.
    Type: Grant
    Filed: June 6, 2002
    Date of Patent: November 7, 2006
    Assignee: Applied Imaging Corporation
    Inventors: Nico Peter Verwoerd, Johannes Vrolijk, Wilhelmina E. Mesker, Willem C. R. Sloos, Jan Bonnet, Padraig S. O'Kelly, Mark Gregson, Kevin Shields, Hendrikus J. Tanke
  • Automated scanning method for pathology samples
    Publication number: 20030012420
    Abstract: Scanning and analysis of cytology and histology samples uses a flatbed scanner to capture images of the structures of interest such as tumor cells in a manner that results in sufficient image resolution to allow for the analysis of such common pathology staining techniques as ICC (immunocytochemistry), IHC (immunohistochemistry) or in situ hybridization. Very large volumes of such material are scanned in order to identify cells or clusters of cells which are positive or warrant more detailed examination, and if analysis at higher resolution is necessary, information regarding these positive events is transferred to a secondary microscope, such as a conventional scanning microscope, to allow further analysis and review of the selected regions of the slide containing the sample.
    Type: Application
    Filed: June 6, 2002
    Publication date: January 16, 2003
    Applicant: Applied Imaging Corporation
    Inventors: Nico Peter Verwoerd, Johannes Vrolijk, Wilhelmina E. Mesker, Willem C.R. Sloos, Jan Bonnet, Padraig S. O'Kelly, Mark Gregson, Kevin Shields, Hendrikus J. Tanke