Patents by Inventor Jan Jaap Kuit

Jan Jaap Kuit has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7345736
    Abstract: A lithographic apparatus having an improved transfer unit, is presented. The lithographic apparatus includes a processing unit that performs a lithographic process involving exchangeable objects in which the processing unit includes an illumination system that provides a beam of radiation, a support structure configured to support a patterning device that imparts a desired pattern to the beam of radiation, a substrate holder configured to hold a substrate, and a projection system configured to project the patterned beam onto a target portion of the substrate. The lithographic apparatus also includes a transfer unit comprising a single robot. The single robot is configured to transfer a first exchangeable object from a loading station to the processing unit and to transfer a second exchangeable object from the processing unit to a discharge station.
    Type: Grant
    Filed: August 27, 2004
    Date of Patent: March 18, 2008
    Assignee: ASML Netherlands B.V.
    Inventors: Jan Jaap Kuit, Petrus Rutgerus Bartray, Dirk Jan Bijvoet, Jan Frederik Hoogkamp
  • Publication number: 20070070324
    Abstract: A lithographic apparatus arranged to transfer a pattern from a patterning structure onto a substrate is disclosed that includes a substrate holder configured to hold a substrate and a substrate temperature conditioner configured to condition a temperature of the substrate prior to, during, or both, a transfer of the substrate to the substrate holder to substantially match a temperature of the substrate holder.
    Type: Application
    Filed: September 29, 2005
    Publication date: March 29, 2007
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Jan Jaap Kuit, Peter Schaap
  • Patent number: 7193722
    Abstract: A lithographic projection apparatus is presented, which includes a housing, which comprises therein a first exposure system that has at least one movable part (e.g. a movable first substrate holder or a movable second substrate holder in a twin stage apparatus). The apparatus also includes a position disturbance correction system for correcting a position of the first substrate holder with respect to the patterned projection beam due to the influence of gas pressure differences or gas movements, caused by movements of the movable part. A related device manufacturing method is also presented in which, during the exposure of a first substrate, the position thereof is corrected by means of position disturbance correction system.
    Type: Grant
    Filed: December 30, 2003
    Date of Patent: March 20, 2007
    Assignee: ASML Netherlands B.V.
    Inventors: Martinus Godefridus Helena Boogaarts, Hans Butler, Henrikus Herman Marie Cox, Martinus Agnes Willem Cuijpers, Jan Jaap Kuit
  • Patent number: 7151590
    Abstract: A lithographic apparatus and a device manufacturing method is disclosed. In particular, a transport system configured to transport substrates between the lithographic apparatus and a track is disclosed, the track comprising one or more processing devices. The transport system may also transport substrates between the processing devices within the track. In an embodiment, the transport system comprises a transporter pathway along which one or more tracks and lithographic apparatuses are spaced. The substrates can be transported along the transporter pathway by a transporting device adapted to hold a substrate.
    Type: Grant
    Filed: February 24, 2004
    Date of Patent: December 19, 2006
    Assignee: ASML Netherlands B.V.
    Inventor: Jan Jaap Kuit
  • Publication number: 20060279721
    Abstract: A stage apparatus for displacing an object having a substantially flat surface is described. The apparatus includes an object table for supporting the object and a positioning device for displacing the object table in a first direction. The apparatus further includes a clamping device for clamping the object to the object table by a first clamping force, the first clamping force being controlled by an electronic control unit based upon a state of the object.
    Type: Application
    Filed: June 8, 2005
    Publication date: December 14, 2006
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Marcel Baggen, Dirk-Jan Bijvoet, Sjoerd Donders, Jan Hoogkamp, Albert Jansen, Jan-Jaap Kuit, Peter Schaap, Joep Janssen, Hubrecht Jasperse, Arjan Van Der Wel
  • Patent number: 7136147
    Abstract: The present invention relates to a lithographic apparatus including an illumination system configured to condition a radiation beam, a patterning device support constructed to support a patterning device, the patterning device being capable of imparting the radiation beam with a pattern in its cross-section to form a patterned radiation beam, a substrate support constructed to hold a substrate, and a projection system configured to project the patterned radiation beam onto a target portion of the substrate, wherein the lithographic apparatus includes an exchangeable object handling apparatus for exchanging an exchangeable object with an exchangeable object loading station and a support, the exchangeable object handling apparatus including three or more end-effectors each capable of exchanging an exchangeable object with one of the supports. Such lithographic apparatus is in particular suited for the streaming of subsequent double exposure jobs.
    Type: Grant
    Filed: December 20, 2004
    Date of Patent: November 14, 2006
    Assignee: ASML Netherlands B.V.
    Inventor: Jan Jaap Kuit
  • Patent number: 7131999
    Abstract: A lithographic apparatus includes an illumination system configured to condition a radiation beam; a support configured to support a patterning device, the patterning device being capable of imparting the radiation beam with a pattern in its cross-section to form a patterned radiation beam; a substrate table configured to hold a substrate; a projection system configured to project the patterned radiation beam onto a target portion of the substrate; and a robot configured to transfer an exchangeable object to and from a support region, the robot including an arm and an end effector, the end effector including a first and second carrier configured to carry respective exchangeable objects, and the end effector being rotatably connected to the arm of the robot around a rotation axis which extends substantially parallel to the support region.
    Type: Grant
    Filed: September 28, 2004
    Date of Patent: November 7, 2006
    Assignee: ASML Netherlands B.V.
    Inventors: Jan Frederik Hoogkamp, Jan Jaap Kuit, Raimond Visser
  • Patent number: 7130019
    Abstract: A lithographic apparatus is provided that includes an illumination system for conditioning a beam of radiation, and a support for supporting a patterning device. The patterning device serves to impart the beam of radiation with a pattern in its cross-section. The apparatus also includes a substrate table for holding a substrate, a projection system for projecting the patterned beam onto a target portion of the substrate, an isolated reference frame for providing a reference surface, and a measuring system for measuring the substrate with respect to the reference surface. The reference frame includes a material having a coefficient of thermal expansion of greater than about 2.9×10?6/K.
    Type: Grant
    Filed: November 12, 2004
    Date of Patent: October 31, 2006
    Assignee: ASML Netherlands B.V.
    Inventors: Petrus Rutgerus Bartray, Wilhelmus Josephus Box, Carlo Cornelis Maria Luijten, Bernardus Antonius Johannes Luttikhuis, Michael Ten Bhomer, Ferdy Migchelbrink, Jan Jaap Kuit
  • Patent number: 7106420
    Abstract: The present invention relates to a lithographic apparatus including a projection system configured to project a patterned radiation beam onto a target portion of a substrate held on a substrate support, the patterned beam of radiation being patterned with a patterning device held by a patterning device support.
    Type: Grant
    Filed: December 20, 2004
    Date of Patent: September 12, 2006
    Assignee: ASML Netherlands B.V.
    Inventors: Jan Jaap Kuit, Dirk Jan Bijvoet, Jan Frederik Hoogkamp, Hubert Marie Segers, Raimond Visser, Johannes Maquine
  • Publication number: 20060066832
    Abstract: A lithographic apparatus includes an illumination system configured to condition a radiation beam; a support configured to support a patterning device, the patterning device being capable of imparting the radiation beam with a pattern in its cross-section to form a patterned radiation beam; a substrate table configured to hold a substrate; a projection system configured to project the patterned radiation beam onto a target portion of the substrate; and a robot configured to transfer an exchangeable object to and from a support region, the robot including an arm and an end effector, the end effector including a first and second carrier configured to carry respective exchangeable objects, and the end effector being rotatably connected to the arm of the robot around a rotation axis which extends substantially parallel to the support region.
    Type: Application
    Filed: September 28, 2004
    Publication date: March 30, 2006
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Jan Frederik Hoogkamp, Jan Jaap Kuit, Raimond Visser
  • Patent number: 6406834
    Abstract: A method of projecting an image onto a plurality of target areas on a substrate whereby use is made of a lithographic projection apparatus comprising: a radiation system for supplying a projection beam of radiation; a mask table provided with a mask holder for holding a mask; a substrate table provided with a substrate holder for holding a substrate; a projection system for imaging an irradiated portion of the mask onto a target area of the substrate, whereby the substrate is to be irradiated with images from at least two different masks, characterized by the following steps: (a) providing a batch of substrates, each at least partially coated with a layer of radiation-sensitive material; (b) providing storage means for temporary storage of the batch; (c) providing a first mask on the mask table; (d) irradiating a first set of target areas of a first substrate with an image from the first mask, and then placing that substrate in the storage means; (e) repeating step (d) for each of the other substrat
    Type: Grant
    Filed: June 7, 2000
    Date of Patent: June 18, 2002
    Assignee: ASML Netherlands B.V.
    Inventors: Jan Jaap Kuit, Jan A. M. Smits, Judocus M. D. Stoeldraijer