Abstract: Provided is a current-mode semiconductor integrated circuit device that operates in a voltage mode during a test mode. The current-mode semiconductor integrated circuit device includes a first transmitting converter, a first receiving converter, a second transmitting converter, and a second receiving converter. During the test mode, one of a first signal path and a second signal path is selected according to the location of the chip. In the first signal path, the first transmitting converter, the first receiving converter, and the second transmitting converter operate. In the second signal path, the second transmitting converter, the second receiving converter, and the first transmitting converter operate. Each of the first and second transmitting converters receives a test voltage signal and converts it into a current signal. Each of the first and second receiving converters generates a reference voltage signal, compares it with the test voltage signal, and outputs the comparing result.

Abstract: A current mode comparator for a semiconductor device is disclosed. The current mode comparator may include a logic circuit coupled to a voltage sensing node, a first cascode coupled to the voltage sensing node and a first power node, and a second cascode coupled to the voltage sensing node and a second power node. The logic circuit may convert a voltage of the voltage sensing node to an output signal.

Abstract: Provided is a current-mode semiconductor integrated circuit device that operates in a voltage mode during a test mode. The current-mode semiconductor integrated circuit device includes a first transmitting converter, a first receiving converter, a second transmitting converter, and a second receiving converter. During the test mode, one of a first signal path and a second signal path is selected according to the location of the chip. In the first signal path, the first transmitting converter, the first receiving converter, and the second transmitting converter operate. In the second signal path, the second transmitting converter, the second receiving converter, and the first transmitting converter operate. Each of the first and second transmitting converters receives a test voltage signal and converts it into a current signal. Each of the first and second receiving converters generates a reference voltage signal, compares it with the test voltage signal, and outputs the comparing result.

Abstract: A current mode comparator for a semiconductor device is disclosed. The current mode comparator may include a logic circuit coupled to a voltage sensing node, a first cascode coupled to the voltage sensing node and a first power node, and a second cascode coupled to the voltage sensing node and a second power node. The logic circuit may convert a voltage of the voltage sensing node to an output signal.