Patents by Inventor Jan Linnenkohl

Jan Linnenkohl has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20070292629
    Abstract: Disclosed is a method or device for recognizing a structure, preferably a bead or trace of adhesive material (20), which is to be applied to a substrate (30), with the aid of at least two cameras, more particularly three or more cameras (12, 13, 14). The structure, which is to be applied, is applied to the substrate using an applicator device (11), whereupon the structure, which is applied to the substrate by means of the applicator device, is monitored by the cameras in such a way that the cameras are oriented towards the applied structure with at least one overlapping area, wherein the applied structure, particularly the edges of the trace of adhesive, is determined on a revolving orbit around the applicator device and the revolving orbit is pre-defined in such a way that the applied structure intersects the revolving orbit after it has been applied to the substrate.
    Type: Application
    Filed: December 23, 2004
    Publication date: December 20, 2007
    Applicant: QUISS GMBH
    Inventors: Jan Linnenkohl, Andreas Tomtschko, Mirko Berger, Roman Raab
  • Publication number: 20060147103
    Abstract: A device and method are provided for the detection of a structure, preferably an adhesive extrusion line, to be applied to a substrate. The device includes an illumination module and a sensor unit. The sensor unit is provided on the facility that applies the structure. An analytical unit is provided which places a set of calipers over the set of data determined by the image elements, whereby the calipers preferably extend orthogonal to the track of the substrate structure. The structure is determined by based on the brightness profile of the gray values along the calipers. A second derivative of the profile of the gray values is used for structure determination. The structure determination is performed according to the following criteria: a. level of edge contrast; b. width of structure; c. difference between set vs actual position; e. difference between set vs actual width of the structure; g. difference between set vs actual brightness of the structure; i.
    Type: Application
    Filed: November 5, 2003
    Publication date: July 6, 2006
    Inventors: Jan Linnenkohl, Dubravico Srsan, Witold Ganzke, Kenneth Weisheit