Abstract: A method for operating a hand-held material investigation device includes transmitting a measurement signal into an object under investigation, and acquiring a position of the material investigation device in relation to a surface of the object under investigation in order to determine a material property of a region, concealed behind the surface, of the object under investigation in a space-resolved and/or direction-resolved manner. The method further includes displaying the material property as at least one digital display object with a physical display unit, and displaying additional measurement information with the same at least one digital display object by way of color coding of the at least one digital display object.

Abstract: A hand tool device comprises a computation unit and at least one locating device that is configured to receive a locating signal having a circularly polarized component. The computation unit is configured to ascertain a piece of position information of a locatable object from the circularly polarized part of the locating signal.

Abstract: The disclosure relates to a locating system, comprising at least one hand-held locating sensor, which is provided for capturing locating data related to objects to be located that are hidden under an examination surface, a position sensor, which is provided for capturing position data, which can be associated with the locating data, and an evaluating unit, which is provided for determining at least two-dimensional map information from the locating data and the position data and providing said at least two-dimensional map information. According to the disclosure, the locating system comprises at least one data source, which is provided for providing data for the purpose of a modification of the at least two-dimensional map information.

Abstract: An imaging locating device includes a first locating apparatus, a position sensor, and an evaluation apparatus. The first locating apparatus is configured to detect locating data in relation to objects to be located. The objects are concealed under an examination surface. The position sensor is configured to detect position data of the locating device in relation to the examination surface. The evaluation apparatus is configured to determine a first at least two-dimensional map information items by assigning the locating data of a first category from the first locating apparatus to the position data. The evaluation data is further configured to determine at least one further at least two-dimensional map information item. The at least one further at least two-dimensional map information item differs from the first at least two-dimensional map information item.

Abstract: A hand tool device comprises a computing unit and at least one locating device configured to receive two orthogonal polarization directions of at least one reflected locating signal. The computing unit is configured to determine, from two received polarization directions of the reflected locating signal, an item of orientation information of a concealed, elongate object.

Abstract: The disclosure relates to a locating system, comprising at least one hand-held locating sensor, which is provided for capturing locating data related to objects to be located that are hidden under an examination surface, a position sensor, which is provided for capturing position data, which can be associated with the locating data, and an evaluating unit, which is provided for determining at least two-dimensional map information from the locating data and the position data and providing said at least two-dimensional map information. According to the disclosure, the locating system comprises at least one data source, which is provided for providing data for the purpose of a modification of the at least two-dimensional map information.

Abstract: An imaging locating device includes a first locating apparatus, a position sensor, and an evaluation apparatus. The first locating apparatus is configured to detect locating data in relation to objects to be located. The objects are concealed under an examination surface. The position sensor is configured to detect position data of the locating device in relation to the examination surface. The evaluation apparatus is configured to determine a first at least two-dimensional map information items by assigning the locating data of a first category from the first locating apparatus to the position data. The evaluation data is further configured to determine at least one further at least two-dimensional map information item. The at least one further at least two-dimensional map information item differs from the first at least two-dimensional map information item.

Abstract: The disclosure relates to a hand tool device having at least one locating device which is provided in order to locate a low-frequency ac voltage in a workpiece and which has a first locating antenna and a second locating antenna. According to the disclosure the hand tool device has a shielding means for shielding a low-frequency locating signal, which shielding means is disposed between the first locating antenna and the second locating antenna.

Abstract: A hand tool device comprises a computation unit and at least one locating device that is configured to receive a locating signal having a circularly polarized component. The computation unit is configured to ascertain a piece of position information of a locatable object from the circularly polarized part of the locating signal.

Abstract: A hand tool device comprises a computing unit and at least one locating device configured to receive two orthogonal polarization directions of at least one reflected locating signal. The computing unit is configured to determine, from two received polarization directions of the reflected locating signal, an item of orientation information of a concealed, elongate object.

Abstract: A high-index contrast waveguide component is presented, which is based on the fast changing of the transmission properties of an optical waveguide by applying electric voltages, or by embossing electric currents. The waveguide consists of a high-refractive waveguide core surrounded by a low-refractive surrounding material, which at least area by area has electro-optical properties. By applying a voltage to completely or partially optically transparent electrodes, an electric field is generated having a strong overlap with the optical mode, being in interaction with it, and therefore changing the transmission properties of the waveguide. The transparent electrodes or supply line areas are laminar, connected at low resistance with conductor paths of high conductivity by means of structures continually repeated along the propagation direction. Thus, it is possible for example to very fast load the capacity being effective between the electrodes, and to thus achieve a high electric band width.

Abstract: A high-index contrast waveguide component is presented, which is based on the fast changing of the transmission properties of an optical waveguide by applying electric voltages, or by embossing electric currents. The waveguide consists of a high-refractive waveguide core surrounded by a low-refractive surrounding material, which at least area by area has electro-optical properties. By applying a voltage to completely or partially optically transparent electrodes, an electric field is generated having a strong overlap with the optical mode, being in interaction with it, and therefore changing the transmission properties of the waveguide. The transparent electrodes or supply line areas are laminar, connected at low resistance with conductor paths of high conductivity by means of structures continually repeated along the propagation direction. Thus, it is possible for example to very fast load the capacity being effective between the electrodes, and to thus achieve a high electric band width.