Patents by Inventor Jan NISSINEN

Jan NISSINEN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for measuring inelastic scattering
    Patent number: 10371641
    Abstract: An apparatus, includes an illuminating light source and illuminating optics arranged to illuminate a sample region with illuminating light pulses, light gathering optics to gather Raman scattered light pulses from the sample region, a spectral disperser and a detector array for measuring the spectral intensity distribution of Raman scattered light pulses obtained from the sample region and an auxiliary detector for providing an indicator signal indicative of elastic scattering coefficient of the sample region. The apparatus is arranged to form a first output spectrum from the spectral intensity distribution of a first group of Raman scattered light pulses. The pulses of the first group of Raman scattered light pulses are obtained from the sample region when the indicator signal indicates that an object is located in the sample region.
    Type: Grant
    Filed: January 20, 2017
    Date of Patent: August 6, 2019
    Assignee: TimeGate Instruments Oy
    Inventors: Juha Kostamovaara, Ilkka Nissinen, Jan Nissinen, Rami Aikio, Jussi Tenhunen, Lauri Kurki
  • METHOD AND APPARATUS FOR MEASURING INELASTIC SCATTERING
    Publication number: 20170234797
    Abstract: An apparatus, includes an illuminating light source and illuminating optics arranged to illuminate a sample region with illuminating light pulses, light gathering optics to gather Raman scattered light pulses from the sample region, a spectral disperser and a detector array for measuring the spectral intensity distribution of Raman scattered light pulses obtained from the sample region and an auxiliary detector for providing an indicator signal indicative of elastic scattering coefficient of the sample region. The apparatus is arranged to form a first output spectrum from the spectral intensity distribution of a first group of Raman scattered light pulses. The pulses of the first group of Raman scattered light pulses are obtained from the sample region when the indicator signal indicates that an object is located in the sample region.
    Type: Application
    Filed: January 20, 2017
    Publication date: August 17, 2017
    Inventors: Juha KOSTAMOVAARA, Ilkka NISSINEN, Jan NISSINEN, Rami AIKIO, Jussi TENHUNEN, Lauri KURKI