Abstract: A method of mass analysis and a mass spectrometer are provided wherein a batch of ions is accumulated in a mass analyser; the batch of ions accumulated in the mass analyser is detected using image current detection to provide a detected signal; the number of ions in the batch of ions accumulated in the mass analyser is controlled using an algorithm based on a previous detected signal obtained using image current detection from a previous batch of ions accumulated in the mass analyser; wherein one or more parameters of the algorithm are adjusted based on a measurement of ion current or charge obtained using an independent detector located outside of the mass analyser.

Abstract: A method of mass analysis and a mass spectrometer are provided wherein a batch of ions is accumulated in a mass analyzer; the batch of ions accumulated in the mass analyzer is detected using image current detection to provide a detected signal; the number of ions in the batch of ions accumulated in the mass analyzer is controlled using an algorithm based on a previous detected signal obtained using image current detection from a previous batch of ions accumulated in the mass analyzer; wherein one or more parameters of the algorithm are adjusted based on a measurement of ion current or charge obtained using an independent detector located outside of the mass analyzer.

Abstract: An ion guide for mass spectrometry comprising an electrode arrangement of at least two electrodes, at least one of which is an RF electrode, arranged adjacent to each other but spaced apart on a planar surface of a dielectric material and arranged at a distance from an ion flow path, wherein a portion of the dielectric surface is exposed between an adjacent pair of the spaced apart electrodes and wherein at least one electrode of said adjacent pair of electrodes is arranged to overhang the exposed portion of surface between them such that there is no direct line of sight from the ion flow path to the exposed portion of dielectric surface. The device enables RF guiding of ions accompanied by much reduced charging-up of dielectric surfaces and reduced amount of collisions of neutral species with electrodes.

Abstract: A device and/or method mount and affix a microchannel plate in a micro system. The device and/or method has at least one conductive spring structure, formed to accept a microchannel plate, for aligning, fixing and making electrical contact with the microchannel plate. The device and/or method also has at least one stop against which the microchannel plate is pushed or pressed when affixed by at least one conductive spring structure, wherein the at least one conductive spring structure and the at least one stop are being applied on a non-conductive substrate.

Abstract: A mass analyzer comprises: an electrical field generator, providing a time-varying electric field for injection of ions to be analyzed, excitation of ions to be analyzed or both; first and second detection electrodes, each of which receives a respective voltage pickup due to the time-varying electric field and provides a respective detection signal based on a respective image current at the detection electrode; and a differential amplifier, providing an output based on the difference between the detection signal for the first detection electrode and the detection signal for the second detection electrode. It may also be provided that the electrical field generator comprises at least one field generating electrode without a spatially symmetrical counterpart and the capacitance between each field generating electrode and the first detection electrode is substantially the same as the capacitance between that field generating electrode and the second detection electrode.

Abstract: Disclosed herein is a mass spectrometry method having steps of: transmitting ions from an ion source through a mass filter; processing ions received from the mass filter in a discontinuous ion optical device downstream of the mass filter; operating the mass filter for a plurality of periods in a mass/charge ratio (m/z) filtering mode to transmit ions in one or more selected ranges of m/z to the discontinuous ion optical device; and operating the mass filter in a broad mass range mode transmitting ions of a mass range substantially wider than any mass range transmitted in the m/z filtering mode during one or more periods in which the discontinuous ion optical device is not processing ions from the mass filter. Utilization of this method assists to reduce contamination in the mass filter.

Abstract: A mass analyser comprises: an electrical field generator, providing a time-varying electric field for injection of ions to be analysed, excitation of ions to be analysed or both; first and second detection electrodes, each of which receives a respective voltage pickup due to the time-varying electric field and provides a respective detection signal based on a respective image current at the detection electrode; and a differential amplifier, providing an output based on the difference between the detection signal for the first detection electrode and the detection signal for the second detection electrode. It may also be provided that the electrical field generator comprises at least one field generating electrode without a spatially symmetrical counterpart and the capacitance between each field generating electrode and the first detection electrode is substantially the same as the capacitance between that field generating electrode and the second detection electrode.

Abstract: A method of mass analysis and a mass spectrometer are provided wherein a batch of ions is accumulated in a mass analyser; the batch of ions accumulated in the mass analyser is detected using image current detection to provide a detected signal; the number of ions in the batch of ions accumulated in the mass analyser is controlled using an algorithm based on a previous detected signal obtained using image current detection from a previous batch of ions accumulated in the mass analyser; wherein one or more parameters of the algorithm are adjusted based on a measurement of ion current or charge obtained using an independent detector located outside of the mass analyser.

Abstract: A mass spectrometer with an ionization chamber with a feed channel for a gas to be examined, including an electron source (d, n) for ionizing the gas to be examined, electrodes (c) for accelerating the ionizing electrons, electrodes (g, h, j, m) for the mass-dependent separation of the ions by acceleration/deceleration thereof, a detector (l) for the separated ions, a wiring with metallic conductors. The components are arranged on a plane nonconductive substrate (1), having an energy filter (k) for the ions, the energy filter being embodied as a 90° sector, is constructed in completely planar fashion. The ionization chamber (b), the electrodes (g, h, j, m) for accelerating the electrons and ions, the detector (l) for the ions and the energy filter (k) are produced by a single step of photolithography and etching of a doped semiconductor die (6) applied to the substrate (1) and the wiring (2) and the abovementioned parts are covered by a second flat nonconductive substrate (7).

Abstract: A fixture and a device for use in micro systems, such as the self-aligning mounting and fixture of micro channel plates, including a micro channel plate. The fixture includes structures composed of a conductive material for accommodating a component of the micro system, which are applied on a non-conductive carrier, resilient structures that position the component in a self-aligning manner and simultaneously perform electrical contact-connection and at least one stop for positioning the component.

Abstract: A mass spectrometer with an ionization chamber with a feed channel for a gas to be examined, including an electron source (d, n) for ionizing the gas to be examined, electrodes (c) for accelerating the ionizing electrons, electrodes (g, h, j, m) for the mass-dependent separation of the ions by acceleration/deceleration thereof, a detector (l) for the separated ions, a wiring with metallic conductors. The components are arranged on a plane nonconductive substrate (1), having an energy filter (k) for the ions, the energy filter being embodied as a 90° sector, is constructed in completely planar fashion. The ionization chamber (b), the electrodes (g, h, j, m) for accelerating the electrons and ions, the detector (l) for the ions and the energy filter (k) are produced by a single step of photolithography and etching of a doped semiconductor die (6) applied to the substrate (1) and the wiring (2) and the abovementioned parts are covered by a second flat nonconductive substrate (7).