Patents by Inventor Jan Rhensius

Jan Rhensius has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Scanning sensor having a spin defect
    Patent number: 11293940
    Abstract: A sensor device includes a carrier, a force feedback sensor, and a probe containing a spin defect, the probe being connected to the force feedback sensor either directly or indirectly via a handle structure. In order to couple the spin defect to a microwave field in an efficient and robust manner, the sensor device includes an integrated microwave antenna arranged at a distance of less than 500 micrometers from the spin defect. The sensor device can be configured as a self-contained exchangeable cartridge that can easily be mounted in a sensor mount of a scanning probe microscope.
    Type: Grant
    Filed: March 14, 2018
    Date of Patent: April 5, 2022
    Assignee: ETH Zurich
    Inventors: Christian Degen, Jens Boss, Kevin Chang, Jan Rhensius
  • Scanning Sensor Having a Spin Defect
    Publication number: 20210140996
    Abstract: A sensor device includes a carrier, a force feedback sensor, and a probe containing a spin defect, the probe being connected to the force feedback sensor either directly or indirectly via a handle structure. In order to couple the spin defect to a microwave field in an efficient and robust manner, the sensor device includes an integrated microwave antenna arranged at a distance of less than 500 micrometers from the spin defect. The sensor device can be configured as a self-contained exchangeable cartridge that can easily be mounted in a sensor mount of a scanning probe microscope.
    Type: Application
    Filed: March 14, 2018
    Publication date: May 13, 2021
    Inventors: Christian Degen, Jens Boss, Kevin Chang, Jan Rhensius