Patents by Inventor JAN STEINBRENER

JAN STEINBRENER has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220270279
    Abstract: Methods and systems for sample imaging via two-pass light-field reconstruction. In an exemplary method, a light-field image of a sample may be captured in a light-field plane. The light-field image may be forward-projected computationally to each of a plurality of z-planes in object space to generate a set of forward-projected z-plane images. Backward-projections computationally to the light-field plane of the same xy-region in object space from each z-plane image may be compared with the light-field image, to determine a respective degree of correspondence between the backward-projected xy-region from each of the z-plane images and the light-field image. For each different xy-region, at least one of the forward-projected z-plane images may be selected to contribute data for the different xy-region in a 2D or 3D object-space image of the sample.
    Type: Application
    Filed: August 11, 2020
    Publication date: August 25, 2022
    Applicant: MOLECULAR DEVICES (AUSTRIA) GMBH
    Inventors: Raimund LEITNER, Jan STEINBRENER
  • Publication number: 20220092820
    Abstract: Methods of calibrating a light-field imaging system, a light-field imaging system to perform the calibration methods, a calibration target for the calibration methods, and methods of projecting a light-field image into object space with a calibrated light-field imaging system. An exemplary calibration method is performed with a light-field imaging system including a microlens array (72) and an image sensor (76). A z-stack of light-field images of a calibration target may be captured using the image sensor, while the calibration target is on the stage and located at a plurality of different z-positions. A total magnification of the imaging system and a microlens magnification of the microlens array may be determined from each light-field image of the z-stack.
    Type: Application
    Filed: January 29, 2020
    Publication date: March 24, 2022
    Inventors: Marcus BAUMGART, Tibor BERECZKI, Jaka PRIBOSEK, Jan STEINBRENER, Andreas TORTSCHANOFF
  • Patent number: 11030776
    Abstract: Methods of calibrating a light-field imaging system, a light-field imaging system to perform the calibration methods, a calibration target for the calibration methods, and methods of projecting a light-field image into object space with a calibrated light-field imaging system. An exemplary calibration method is performed with a light-field imaging system including a microlens array and an image sensor. A z-stack of light-field images of a calibration target may be captured using the image sensor, while the calibration target is on the stage and located at a plurality of different z-positions. A total magnification of the imaging system and a microlens magnification of the microlens array may be determined from each light-field image of the z-stack.
    Type: Grant
    Filed: February 1, 2019
    Date of Patent: June 8, 2021
    Inventors: Marcus Baumgart, Tibor Bereczki, Jaka Pribosek, Jan Steinbrener, Andreas Tortschanoff
  • Publication number: 20200250856
    Abstract: Methods of calibrating a light-field imaging system, a light-field imaging system to perform the calibration methods, a calibration target for the calibration methods, and methods of projecting a light-field image into object space with a calibrated light-field imaging system. An exemplary calibration method is performed with a light-field imaging system including a microlens array and an image sensor. A z-stack of light-field images of a calibration target may be captured using the image sensor, while the calibration target is on the stage and located at a plurality of different z-positions. A total magnification of the imaging system and a microlens magnification of the microlens array may be determined from each light-field image of the z-stack.
    Type: Application
    Filed: February 1, 2019
    Publication date: August 6, 2020
    Inventors: Marcus Baumgart, Tibor Bereczki, Jaka Pribosek, Jan Steinbrener, Andreas Tortschanoff
  • Patent number: 10231685
    Abstract: A method operates an x-ray system for examining an object. In order to optimize the operation of an x-ray system, in particular the dose regulation and/or the image processing, the following method steps are performed. Radiation is passed through the object to be examined and a number of fluoroscopic images of the object are generated. A relevant image region of a fluoroscopic image is selected by a user of the x-ray system. An image-based dose regulation of the radiation dose used for passing radiation through the object is carried out using the selected image region and/or image processing is carried out using the selected image region.
    Type: Grant
    Filed: July 11, 2016
    Date of Patent: March 19, 2019
    Assignee: Siemens Healthcare GmbH
    Inventors: Jens Bialkowski, Bernhard Geiger, Stefan Schneider, Jan Steinbrener
  • Publication number: 20170007194
    Abstract: A method operates an x-ray system for examining an object. In order to optimize the operation of an x-ray system, in particular the dose regulation and/or the image processing, the following method steps are performed. Radiation is passed through the object to be examined and a number of fluoroscopic images of the object are generated. A relevant image region of a fluoroscopic image is selected by a user of the x-ray system. An image-based dose regulation of the radiation dose used for passing radiation through the object is carried out using the selected image region and/or image processing is carried out using the selected image region.
    Type: Application
    Filed: July 11, 2016
    Publication date: January 12, 2017
    Inventors: JENS BIALKOWSKI, BERNHARD GEIGER, STEFAN SCHNEIDER, JAN STEINBRENER