Abstract: A Bessel beam laser-cutting system may comprise an ultrafast laser light source, an axicon, a first lens, and a second lens. The ultrafast light source may be configured to emit a beam into the axicon. The axicon may be configured to diffract the beam into a first/primary Bessel beam in a near field of the axicon and an annular beam in a far field of the axicon. The first lens may be configured to focus the annular beam. The second lens may be configured to converge the focused annular beam into a second/secondary Bessel beam to modify a transparent material, wherein a modification depth of the modification generated by the second/secondary Bessel beam is to be within a range of tens of micrometers to several millimeters inside the transparent material.

Abstract: A device assembly (16) for a precision apparatus (10) includes a device housing (30), a device (32), a device mover assembly (34), and a measurement system (36). The device mover assembly (34) moves the device (32) relative to the device housing (30) about a first axis and about a second axis that is orthogonal to the first axis. The measurement system (36) monitors movement of the device (32). The measurement system (36) monitors movement of the device (32) and can include a first sensor assembly (260) that monitors movement about the first axis and a second sensor assembly (262) that monitors movement about a second axis. Each sensor assembly (260) (262) can include a sensor adjuster (474) (476) that adjusts the position of a portion of the respective sensor assembly (260) (262) to independently tune the sensor assemblies (260) (262) and independently enhance the performance of each sensor assembly (260) (262). Further, each sensor assembly (260) (262) can be a magnetic type sensor.

Abstract: A device assembly (16) for a precision apparatus (10) includes a device housing (30), a device (32), a device mover assembly (34), and a measurement system (36). The device mover assembly (34) moves the device (32) relative to the device housing (30) about a first axis and about a second axis that is orthogonal to the first axis. The measurement system (36) monitors movement of the device (32). The measurement system (36) monitors movement of the device (32) and can include a first sensor assembly (260) that monitors movement about the first axis and a second sensor assembly (262) that monitors movement about a second axis. Each sensor assembly (260) (262) can include a sensor adjuster (474) (476) that adjusts the position of a portion of the respective sensor assembly (260) (262) to independently tune the sensor assemblies (260) (262) and independently enhance the performance of each sensor assembly (260) (262). Further, each sensor assembly (260) (262) can be a magnetic type sensor.

Abstract: A system is provided for producing wavelength tunable laser light and a signal indicative of the wavelength of the produced laser light; a laser cavity includes an optical gain medium and a wavelength selective element disposed in a path of light emitted by the optical gain medium such that changing a position of the element changes a wavelength emitted by the medium; a position sensor that senses position of the element; position signal circuitry that produces a position signal indicative of position of the element sensed by the position sensor; a storage medium storing at least one position signal corresponding to a respective predetermined position of the element; comparison circuitry for comparing the produced position signal with the at least one stored position signal and for producing a comparison result indicative of whether the element has reached to the predetermined position; marker signal circuitry providing an external wavelength marker signal when the comparison result indicates that the element

Abstract: An apparatus and method for determining a physical parameter affecting an optical sensor or a number of sensors in a network. The apparatus uses a narrow linewidth source at an emission wavelength ?e and an arrangement for varying the emission wavelength ?e of the radiation. An analysis module with curve fitting is used to generate a fit to the response signal obtained from the optical sensor. The physical parameter is determined form the fit rather than from the response signal. The apparatus can be employed with Bragg gratings, etalons, Fabry Perot elements or other optical sensors.

Abstract: An apparatus and method for determining a physical parameter affecting an optical sensor or a number of sensors in a network. The apparatus uses a narrow linewidth source at an emission wavelength &lgr;e and an arrangement for varying the emission wavelength &lgr;e of the radiation. An analysis module with curve fitting is used to generate a fit to the response signal obtained from the optical sensor. The physical parameter is determined form the fit rather than from the response signal. The apparatus can be employed with Bragg gratings, etalons, Fabry Perot elements or other optical sensors.

Abstract: Apparatus and methods that provide a tunable laser output wavelength which varies linearly or with high predictability over time, and which can provide tuning speeds of greater than 100 nanometers per second. The apparatus includes a laser resonator cavity having first and second reflective elements, at least one of which is movable to provide a constant change in output wavelength with respect to time. A tuning assembly associated with the movable reflective element is structured, configured, and positioned to adjust the movable reflective elements such that constant changes in output wavelength and high tuning speeds are provided.

Abstract: A method and apparatus for minimizing the effects of noise when measuring a response of a device under test to laser light. Laser light provided from a laser source is provided to an interferometer, which splits the source laser light into a first laser light portion and a second laser light portion and then interferometrically combines the first laser light and the second laser light, resulting in a time-varying interference modulated test laser light and a time-varying interference modulated reference laser light. The time-varying interference modulated test laser light is propagated to a device under test so as to cause the device under test to propagate responsive time-varying interference modulated test laser light. The responsive time-varying interference modulated test laser light is converted to an responsive amplitude modulated electrical test signal, which is high pass filtered.

Abstract: A method and apparatus for minimizing the effects of noise when measuring a response of a device under test to laser light. Laser light provided from a laser source is provided to an interferometer, which splits the source laser light into a first laser light portion and a second laser light portion and then interferometrically combines the first laser light and the second laser light, resulting in a time-varying interference modulated test laser light and a time-varying interference modulated reference laser light. The time-varying interference modulated test laser light is propagated to a device under test so as to cause the device under test to propagate responsive time-varying interference modulated test laser light. The responsive time-varying interference modulated test laser light is converted to an responsive amplitude modulated electrical test signal, which is high pass filtered.

Abstract: A diode pumped laser includes a high reflector and an output coupler defining a resonator. The resonator includes a gain medium and a Q-switch and produces a fundamental beam. A first non-linear crystal is positioned extra-cavity of the resonator along a path of the fundamental beam. The first non-linear crystal generates a second harmonic beam from the fundamental beam. The first non-linear crystal is critically phased matched. A second non-linear crystal is portioned extra-cavity of the resonator along a path of the fundamental beam and the path of the second harmonic beam. The second non-linear crystal produces a third harmonic beam. The second non-linear crystal is critically phased matched.

Abstract: A laser system has a high reflector and an output coupler defining a laser cavity with an optical axis. Included is a pump source, a mode-locking apparatus and at least one fold mirror positioned in the laser cavity along the optical axis. A gain media is positioned adjacent to the fold mirror. The gain media has an overlap region where an intracavity beam entering the gain media substantially overlaps the intracavity beam exiting the gain media.

Abstract: A multi-axial mode frequency conversion system includes two resonators. At least two resonator mirrors define a first resonator cavity. A gain medium is positioned in the first resonator cavity. A pump source supplies energy to the gain medium. The first resonator cavity produces a first beam with a plurality of axial modes that are incident on a doubling crystal in the first resonator and produce a frequency doubled output beam. The first resonator cavity provides a sufficient number of axial modes to oscillate so that the doubled output beam has a noise of less than 3% RMS. At least two resonator mirrors define a second resonator cavity coupled to the output beam from the first resonator cavity. The second resonator is configured to provide resonant enhancement of at least a portion of the plurality of axial modes. A non-linear optical material is positioned in the second resonator and configured to produce a harmonic output beam.