Patents by Inventor Jang Soo Choi

Jang Soo Choi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • On-line measuring system for measuring substrate thickness and the method thereof
    Patent number: 6590221
    Abstract: An on-line measuring system for measuring a thickness of a transferred substrate includes a first image detector, a second image detector, an elevator, and a display device. After the first image detector indicates a vertical variation of a bottom surface of the substrate, the second image detector captures an image of the bottom surface of the substrate. The elevator perpendicularly moves the second image detector with respect to the bottom surface of the glass substrate, depending on the vertical variation of the bottom surface, such that a vertical distance between the bottom surface and the second image detector remains constant. Then, a controller processes the image of the bottom surface to calculate a distance between opposite edges of the bottom surface, thereby obtaining a thickness of the substrate.
    Type: Grant
    Filed: December 5, 2001
    Date of Patent: July 8, 2003
    Assignee: Samsung Corning Co., Ltd.
    Inventors: Jong Eun Ha, Taek Cheon Kim, Ju Yeol Baek, Jae Seok Choi, Jang Soo Choi
  • Superabrasive composition and superabrasive article comprising same for grinding CRT front panel
    Publication number: 20030114085
    Abstract: A grinding article, which has a grinding layer derived from a superabrasive composition comprising a mixture of diamond and cubic boron nitride (CBN) particles in a volume ratio of 8.5:1.5 to 9.5:0.5 and a substrate element assembled for securing the grinding layer by way of forming a three-dimensional bonding interface therewith provides excellent grinding efficiency when used in grinding a CRT front glass panel.
    Type: Application
    Filed: September 27, 2001
    Publication date: June 19, 2003
    Inventors: Sung-Kook Choi, Hyun-Myung Cho, Young-Mo Kang, Hun-Jin Lee, Jang-Soo Choi, Jong-Beg Chun, Han-Baik Lee, Kyoung-Jun Kim, Chan-Hae Hwang, Hyuck-Jae Jung
  • On-line measuring system for measuring substrate thickness and the method thereof
    Publication number: 20020072134
    Abstract: An on-line measuring system for measuring a thickness of a transferred substrate includes a first image detector, a second image detector, an elevator, and a display device. After the first image detector indicates a vertical variation of a bottom surface of the substrate, the second image detector captures an image of the bottom surface of the substrate. The elevator perpendicularly moves the second image detector with respect to the bottom surface of the glass substrate, depending on the vertical variation of the bottom surface, such that a vertical distance between the bottom surface and the second image detector remains constant. Then, a controller processes the image of the bottom surface to calculate a distance between opposite edges of the bottom surface, thereby obtaining a thickness of the substrate.
    Type: Application
    Filed: December 5, 2001
    Publication date: June 13, 2002
    Inventors: Jong Eun Ha, Taek Cheon Kim, Ju Yeol Baek, Jae Seok Choi, Jang Soo Choi