Patents by Inventor Jang Sup Yoon
Jang Sup Yoon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240131922Abstract: A variable grille apparatus can adjust a flow rate of air flowing through a grille and upgrade an opening/closing operation when adjusting the flow rate of the air, thereby improving merchantability. In addition, by diversifying the opening/closing operation of the grille such as sequentially operating or simultaneously operating the opening/closing operation of the grille, it is possible to upgrade the opening/closing operation of the grille, diversify the exterior design, and secure the flow rate of air through the optimization of the structural arrangement.Type: ApplicationFiled: September 24, 2023Publication date: April 25, 2024Applicants: HYUNDAI MOTOR COMPANY, KIA CORPORATION, HYUNDAI MOBIS CO., LTD.Inventors: Jin Young Yoon, Dong Eun Cha, Hong Heui Lee, Jae Sup Byun, Jang Ho Kim
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Publication number: 20240132166Abstract: An active air skirt apparatus controls an airflow flowing to a lower side of a mobility device according to a traveling state of the mobility device, thereby securing optimal aerodynamic performance. In addition, disclosed herein is an active air skirt apparatus, which stably moves a flap for controlling the airflow when a vehicle travels at high speed, thereby improving durability and reliability.Type: ApplicationFiled: March 10, 2023Publication date: April 25, 2024Inventors: Jin Young Yoon, Dong Eun Cha, Hong Heui Lee, Jae Sup Byun, Jang Ho Kim
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Publication number: 20240123817Abstract: A variable grille apparatus controls a flow rate of air circulated through the grille. Commercial properties are improved through an advanced opening and closing operation during adjustment of the air flow rate. The opening and closing operation of the grille is diversified, such as by sequential or simultaneous operation, so that the sense of operation is enhanced, an exterior design is diversified, and the air flow is secured through an optimization of the structural arrangement.Type: ApplicationFiled: July 6, 2023Publication date: April 18, 2024Applicants: HYUNDAI MOTOR COMPANY, KIA CORPORATION, HYUNDAI MOBIS CO., LTD.Inventors: Jin Young Yoon, Dong Eun Cha, Hong Heui Lee, Jae Sup Byun, Jang Ho Kim
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Patent number: 7924025Abstract: An embedded s-parameter measurement system for measuring or determining an s-parameter is provided. The system includes an s-parameter test circuit for connecting to a port of a high-frequency multi-port device-under-test (DUT). The s-parameter test circuit includes a directional coupler for sampling a forward signal conveyed to the DUT and for sampling a reverse signal reflected by the DUT. The s-parameter test circuit also includes a peak detector electrically connected to the directional coupler for detecting a magnitude of a signal conveyed to the peak detector by the directional coupler. The s-parameter test circuit further includes a phase detector electrically connected to the directional coupler for determining a phase of a signal conveyed to the phase detector by the directional coupler, and at least one other s-parameter test circuit for connecting to another port of the high-frequency multi-port DUT.Type: GrantFiled: July 25, 2006Date of Patent: April 12, 2011Assignee: University of Florida Research Foundation, Inc.Inventors: William R. Eisenstadt, Robert M. Fox, Jang Sup Yoon
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Patent number: 7925229Abstract: A self-testing transceiver having an on-chip power detection capability is provided. The self-testing transceiver can include a semiconductor substrate and a transmitter having a high-power amplifier disposed on the substrate. The self-testing transceiver also can include a receiver disposed on the substrate for selectively coupling to an antenna. The self-testing transceiver can further include at least one power detector disposed on the semiconductor substrate for determining a power such as an RMS and/or peak-power of a signal at an internal node of the self-testing transceiver. Additionally, the self-testing transceiver can include a loopback circuit disposed on the substrate.Type: GrantFiled: April 25, 2008Date of Patent: April 12, 2011Assignee: University of Florida Research Foundation, Inc.Inventors: William R. Eisenstadt, Robert M. Fox, Jang Sup Yoon, Tao Zhang
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Publication number: 20090005103Abstract: A self-testing transceiver having an on-chip power detection capability is provided. The self-testing transceiver can include a semiconductor substrate and a transmitter having a high-power amplifier disposed on the substrate. The self-testing transceiver also can include a receiver disposed on the substrate for selectively coupling to an antenna. The self-testing transceiver can further include at least one power detector disposed on the semiconductor substrate for determining a power such as an RMS and/or peak-power of a signal at an internal node of the self-testing transceiver. Additionally, the self-testing transceiver can include a loopback circuit disposed on the substrate.Type: ApplicationFiled: April 25, 2008Publication date: January 1, 2009Applicant: UNIVERSITY OF FLORIDA RESEARCH FOUNDATION, INC.Inventors: William R. Eisenstadt, Robert M. Fox, Jang Sup Yoon, Tao Zhang
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Publication number: 20080191712Abstract: An embedded s-parameter measurement system for measuring or determining an s-parameter is provided. The system includes an s-parameter test circuit for connecting to a port of a high-frequency multi-port device-under-test (DUT). The s-parameter test circuit includes a directional coupler for sampling a forward signal conveyed to the DUT and for sampling a reverse signal reflected by the DUT. The s-parameter test circuit also includes a peak detector electrically connected to the directional coupler for detecting a magnitude of a signal conveyed to the peak detector by the directional coupler. The s-parameter test circuit further includes a phase detector electrically connected to the directional coupler for determining a phase of a signal conveyed to the phase detector by the directional coupler, and at least one other s-parameter test circuit for connecting to another port of the high-frequency multi-port DUT.Type: ApplicationFiled: July 25, 2006Publication date: August 14, 2008Applicant: University of Florida Research Foundation, Inc.Inventors: William R. Eisenstadt, Robert M. Fox, Tao Zhang, Jang Sup Yoon
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Patent number: 7379716Abstract: A self-testing transceiver having an on-chip power detection capability is provided. The self-testing transceiver can include a semiconductor substrate and a transmitter having a high-power amplifier disposed on the substrate. The self-testing transceiver also can include a receiver disposed on the substrate for selectively coupling to an antenna. The self-testing transceiver can further include at least one power detector disposed on the semiconductor substrate for determining a power such as an RMS and/or peak-power of a signal at an internal node of the self-testing transceiver. Additionally, the self-testing transceiver can include a loopback circuit disposed on the substrate.Type: GrantFiled: March 24, 2005Date of Patent: May 27, 2008Assignee: University of Florida Research Foundation, Inc.Inventors: William R. Eisenstadt, Robert M. Fox, Jang Sup Yoon, Tao Zhang