Patents by Inventor Jangseon Park

Jangseon Park has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11301317
    Abstract: A method of controlling repair of a volatile memory device, includes, performing a patrol read operation repeatedly to provide error position information of errors included in read data from a volatile memory device, generating accumulated error information by accumulating the error position information based on the patrol read operation performed repeatedly, determining error attribute based on the accumulated error information, the error attribute indicating correlation between the errors and a structure of the volatile memory device, and performing a runtime repair operation with respect to the volatile memory device based on the accumulated error information and the error attribute. The errors may be managed efficiently to prevent failure of the volatile memory device, and thus performance and lifetime of the volatile memory device and the storage device may be enhanced.
    Type: Grant
    Filed: February 13, 2020
    Date of Patent: April 12, 2022
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Dong Kim, Inhoon Park, Jangseon Park, Hyunglae Eun
  • Publication number: 20210026728
    Abstract: A method of controlling repair of a volatile memory device, includes, performing a patrol read operation repeatedly to provide error position information of errors included in read data from a volatile memory device, generating accumulated error information by accumulating the error position information based on the patrol read operation performed repeatedly, determining error attribute based on the accumulated error information, the error attribute indicating correlation between the errors and a structure of the volatile memory device, and performing a runtime repair operation with respect to the volatile memory device based on the accumulated error information and the error attribute. The errors may be managed efficiently to prevent failure of the volatile memory device, and thus performance and lifetime of the volatile memory device and the storage device may be enhanced.
    Type: Application
    Filed: February 13, 2020
    Publication date: January 28, 2021
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Dong Kim, Inhoon Park, Jangseon Park, Hyunglae Eun