Patents by Inventor Janusz B. Pawliszyn

Janusz B. Pawliszyn has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4940333
    Abstract: Concentration gradients in samples to be evaluated are detected by measuring the deflection of a probe light beam passed through the sample using the principals of Schlieren optics. Specific chemical compounds in a sample can be detected and identified by supplying excitation energy to the sample where such energy is selected to be absorbed by the chemical compound to be specifically identified and not by other compounds in the sample. The absorption of the excitation energy by the absorbing compound produces a temperature gradient within the sample which causes deflection of the probe light beam and signals representative of such deflection may be separated from signals representative of deflections caused by other refractive index gradient present in the sample. A light emitting diode may be used to generate the probe light beam.
    Type: Grant
    Filed: November 14, 1988
    Date of Patent: July 10, 1990
    Assignee: Anthony R. Torres
    Inventor: Janusz B. Pawliszyn
  • Patent number: 4784494
    Abstract: Concentration gradients in samples to be evaluated are detected by measuring the deflection of a probe light beam passed through the sample using the principals of Shlieren optics. Specific chemical compounds in a sample can be detected and identified by supplying excitation energy to the sample where such energy is selected to be absorbed by the chemical compound to be specifically identified and not by other compounds in the sample. The absorption of the excitation energy by the absorbing compound produces a temperature gradient within the sample which causes deflection of the probe light beam and signals representative of such deflection may be separated from signals representative of deflections caused by other refractive index gradients present in the sample. A light emitting diode may be used to generate the probe light beam.
    Type: Grant
    Filed: December 31, 1986
    Date of Patent: November 15, 1988
    Assignee: Anthony R. Torres
    Inventor: Janusz B. Pawliszyn