Patents by Inventor Jared A. MAGOLINE

Jared A. MAGOLINE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Fabrication of micro/nanoscale barcodes using cantilever-free scanning probe lithography
    Patent number: 11143960
    Abstract: Cantilever-Free Scanning Probe Lithography (CF-SPL) techniques are used to enable generation of 1-, 2-, 3-, and 4-D information containing patterns in a mask-free manner that, in turn, enables instantaneous change of pattern design.
    Type: Grant
    Filed: June 4, 2018
    Date of Patent: October 12, 2021
    Inventors: Andrey Ivankin, Jared A. Magoline
  • Electrical contact auto-alignment strategy for highly parallel pen arrays in cantilever free scanning probe lithography
    Patent number: 10459004
    Abstract: Disclosed embodiments provide an electrical contact alignment strategy for leveling an array of probes, pens, tips, etc., in relationship to a substrate, for example, wherein a plurality of independent electrical circuits are formed by configuring regions of the array and substrate regions to be partially conductive and connected to opposite electrodes or vice versa.
    Type: Grant
    Filed: February 2, 2018
    Date of Patent: October 29, 2019
    Inventors: Andrey Ivankin, Jared A. Magoline
  • FABRICATION OF MICRO/NANOSCALE BARCODES USING CANTILEVER-FREE SCANNING PROBE LITHOGRAPHY
    Publication number: 20180348640
    Abstract: Cantilever-Free Scanning Probe Lithography (CF-SPL) techniques are used to enable generation of 1-, 2-, 3-, and 4-D information containing patterns in a mask-free manner that, in turn, enables instantaneous change of pattern design.
    Type: Application
    Filed: June 4, 2018
    Publication date: December 6, 2018
    Inventors: Andrey IVANKIN, Jared A. MAGOLINE
  • ELECTRICAL CONTACT AUTO-ALIGNMENT STRATEGY FOR HIGHLY PARALLEL PEN ARRAYS IN CANTILEVER FREE SCANNING PROBE LITHOGRAPHY
    Publication number: 20180217183
    Abstract: Disclosed embodiments provide an electrical contact alignment strategy for leveling an array of probes, pens, tips, etc., in relationship to a substrate, for example, wherein a plurality of independent electrical circuits are formed by configuring regions of the array and substrate regions to be partially conductive and connected to opposite electrodes or vice versa.
    Type: Application
    Filed: February 2, 2018
    Publication date: August 2, 2018
    Inventors: Andrey IVANKIN, Jared A. MAGOLINE