Patents by Inventor Jared D. Juniel

Jared D. Juniel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods, systems, and computer readable mediums for generating key performance indicator metric test data
    Patent number: 10176075
    Abstract: Methods, systems, and computer readable mediums for generating key performance indicator (KPI) metric test data are disclosed. According to one method, the method includes receiving KPI parameter data associated with a KPI metric corresponding to a system element hosted by a computing system, generating KPI metric test data values for the KPI metric in accordance to a defined time period and a collection frequency interval specified by the KPI parameter data, and utilizing the KPI metric test data values to subject at least one of an interface layer or service logic of the computing system to a validation assessment.
    Type: Grant
    Filed: November 10, 2016
    Date of Patent: January 8, 2019
    Assignee: VCE IP HOLDING COMPANY LLC
    Inventor: Jared D. Juniel