Abstract: Provided herein are an optical test platform and corresponding method of manufacturing the same. The test platform may include a shell defining a cavity for receiving a sample tube, a first aperture, and a second aperture. The first aperture and the second aperture of the shell may each be configured to optically couple the cavity with an exterior of the shell. The test platform may further include a first window and a second window embedded in the shell. The first window may seal a first aperture and the second window may seal a second aperture. The first window and second window may each permit the optical coupling of the cavity with the exterior of the shell. The first window and the second window may be optically coupled via the cavity, and the shell may prohibit optical coupling between the first window and the second window through the shell.

Abstract: An organic light-emitting diode (OLED) display may have an array of organic light-emitting diode pixels that each have OLED layers interposed between a cathode and an anode. Voltage may be applied to the anode of each pixel to control the magnitude of emitted light. The conductivity of the OLED layers may allow leakage current to pass between neighboring anodes in the display. To reduce leakage current and the accompanying cross-talk, resistance of a laterally conductive OLED layer may be increased. The laterally conductive layer may include an organic host material, dopants, and a resistance-increasing additive. Another way to reduce leakage current is to apply bias voltages to the anodes of the display and/or expose the laterally conductive layer to ultraviolet light, causing dopants within the laterally conductive layer to degrade.

Abstract: A display may include pixels (such as light-emitting diode pixels) that are susceptible aging effects (burn-in). To help avoid visible artifacts caused by burn-in during operation of the display, compensation circuitry may be used to compensate image data for the display. An optical sensor may be included behind the pixels to directly measure pixel brightness levels. The optical sensor may provide optical sensor data from testing operations to the compensation circuitry. The optical sensor may gather data during burn-in testing operations. During the burn-in testing operations, pixel groups including both high-usage pixels and low-usage pixels may sequentially emit light while the optical sensor gathers data. Brightness differences between the high-usage pixels and low-usage pixels may be used to characterize pixel aging in the display and compensate image data to mitigate visible artifacts caused by burn-in. The optical sensor may also gather data during global brightness testing operations.