Patents by Inventor Jared W. McDaniel

Jared W. McDaniel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • SYSTEMS AND METHODS FOR DYNAMIC EVALUATION OF METADATA CONSISTENCY AND DATA RELIABILITY
    Publication number: 20260003840
    Abstract: Systems and methods for dynamically evaluating metadata consistency and data reliability in a data management system are disclosed herein. The system may retrieve first metadata and second metadata. The system may retrieve a metadata ruleset. Based on the metadata ruleset, the system may generate a first metadata consistency metric indicating a first measure of consistency. The system may determine to process each record of the first metadata as a batch. The system may generate a second metadata consistency metric indicating a second measure of consistency. The system may determine to process each record of the second metadata independently.
    Type: Application
    Filed: September 4, 2025
    Publication date: January 1, 2026
    Applicant: Capital One Services, LLC
    Inventors: Shitij Kulshreshtha, Rama Mohan Boppana, Sean Murray, Jared W. McDaniel, Rahul Babu Mummaneni, Andrew Seaton, Rachel Rogers, Sudeesh Madhusudanan
  • SYSTEMS AND METHODS FOR DYNAMIC EVALUATION OF METADATA CONSISTENCY AND DATA RELIABILITY
    Publication number: 20250321941
    Abstract: Systems and methods for dynamically evaluating metadata consistency and data reliability in a data management system are disclosed herein. The system may retrieve first metadata and second metadata. The system may retrieve a metadata ruleset. Based on the metadata ruleset, the system may generate a first metadata consistency metric indicating a first measure of consistency. The system may determine to process each record of the first metadata as a batch. The system may generate a second metadata consistency metric indicating a second measure of consistency. The system may determine to process each record of the second metadata independently.
    Type: Application
    Filed: April 11, 2024
    Publication date: October 16, 2025
    Applicant: Capital One Services, LLC
    Inventors: Shitij KULSHRESHTHA, Rama Mohan BOPPANA, Sean MURRAY, Jared W. MCDANIEL, Rahul Babu MUMMANENI, Andrew SEATON, Rachel ROGERS, Sudeesh MADHUSUDANAN
  • Systems and methods for dynamic evaluation of metadata consistency and data reliability
    Patent number: 12443574
    Abstract: Systems and methods for dynamically evaluating metadata consistency and data reliability in a data management system are disclosed herein. The system may retrieve first metadata and second metadata. The system may retrieve a metadata ruleset. Based on the metadata ruleset, the system may generate a first metadata consistency metric indicating a first measure of consistency. The system may determine to process each record of the first metadata as a batch. The system may generate a second metadata consistency metric indicating a second measure of consistency. The system may determine to process each record of the second metadata independently.
    Type: Grant
    Filed: April 11, 2024
    Date of Patent: October 14, 2025
    Assignee: Capital One Services, LLC
    Inventors: Shitij Kulshreshtha, Rama Mohan Boppana, Sean Murray, Jared W. McDaniel, Rahul Babu Mummaneni, Andrew Seaton, Rachel Rogers, Sudeesh Madhusudanan