Abstract: The invention provides testing of a chemically-sensitive transistor device, such as an ISFET device, without exposing the device to liquids. In one embodiment, the invention performs a first test to calculate a resistance of the transistor. Based on the resistance, the invention performs a second test to transition the testing transistor among a plurality of modes. Based on corresponding measurements, a floating gate voltage is then calculated with little or no circuitry overhead. In another embodiment, the parasitic capacitance of at least either the source or drain is used to bias the floating gate of an ISFET. A driving voltage and biasing current are applied to exploit the parasitic capacitance to test the functionality of the transistor.

Abstract: The invention provides testing of a chemically-sensitive transistor device, such as an ISFET device, without exposing the device to liquids. In one embodiment, the invention performs a first test to calculate a resistance of the transistor. Based on the resistance, the invention performs a second test to transition the testing transistor among a plurality of modes. Based on corresponding measurements, a floating gate voltage is then calculated with little or no circuitry overhead. In another embodiment, the parasitic capacitance of at least either the source or drain is used to bias the floating gate of an ISFET. A driving voltage and biasing current are applied to exploit the parasitic capacitance to test the functionality of the transistor.

Abstract: The invention provides testing of a chemically-sensitive transistor device, such as an ISFET device, without exposing the device to liquids. In one embodiment, the invention performs a first test to calculate a resistance of the transistor. Based on the resistance, the invention performs a second test to transition the testing transistor among a plurality of modes. Based on corresponding measurements, a floating gate voltage is then calculated with little or no circuitry overhead. In another embodiment, the parasitic capacitance of at least either the source or drain is used to bias the floating gate of an ISFET. A driving voltage and biasing current are applied to exploit the parasitic capacitance to test the functionality of the transistor.

Abstract: The invention provides testing of a chemically-sensitive transistor device, such as an ISFET device, without exposing the device to liquids. In one embodiment, the invention performs a first test to calculate a resistance of the transistor. Based on the resistance, the invention performs a second test to transition the testing transistor among a plurality of modes. Based on corresponding measurements, a floating gate voltage is then calculated with little or no circuitry overhead. In another embodiment, the parasitic capacitance of at least either the source or drain is used to bias the floating gate of an ISFET. A driving voltage and biasing current are applied to exploit the parasitic capacitance to test the functionality of the transistor.

Abstract: A radio frequency ID tag, very small in size and with an onboard antenna, is manufactured, tested and applied cost-efficiently. The transmit frequency for the tag is set during manufacture approximately, within a selected range, in a gross tuning step. The gross calibration is based on one or more measured characteristics of electronic componentry on wafers, and based on such measured characteristics, the chips can be grossly calibrated and parallel so that all tags will be within a fairly close tolerance of the target transmit frequency. A second tuning step fine tunes each tag by RF communication to set values of capacitance, resistance, etc., and this can be at the point of application of the tags. Other disclosed aspects of the invention also add to economy of producing the tag and reliability of the tags in service.

Abstract: A method, system, and computer program product for designing an integrated circuit. In one example, a standard library is provided having a plurality of standard circuit cells, and a substitute library is provided having a plurality of substitute circuit cells wherein one or more substitute circuit cells correspond to one or more standard circuit cells and the one or more substitute circuit cells have at least one differing electrical characteristic—such as power consumption, quiescent current consumption, speed/response time, leakage current, etc.—than the corresponding one or more standard circuit cells. An initial circuit design is created using the plurality of standard circuit cells of the standard library; and one or more non-critical timing paths are identified in the initial circuit design, the non-critical timing paths including one or more standard circuit cells.

Abstract: An electronic identification tag, usually in very small size, responds to a reader with an identification code unique to the object to which the tag is attached. The stand-alone device responds to a reader signal by storing energy received from the signal, then using the stored energy to generate another signal that is encoded with identification information. In operation, a reader generates RF energy which can reach a multiplicity of such tags over a distance of several meters. The system minimizes power requirements for the tag by minimizing intelligence in the IC. Use of a transmit frequency which is different from the reader's power frequency reduces interference between the power pulse and information pulse, eliminates the need for filters and enables the multiplied clock reference frequency as the transmit carrier frequency.