Patents by Inventor Jarkko Sarmaala

Jarkko Sarmaala has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8542349
    Abstract: An optical measurement instrument includes a measurement head and mechanical support elements arranged to support a sample well plate. The measurement head is moved towards the sample well plate and, after the measurement head has touched the sample well plate, the measurement head is moved backwards away from the sample well plate so as to provide a desired distance between the measurement head and the sample well plate. A sensor device is attached to the mechanical support elements and arranged detect a mechanical effect occurring in the mechanical support elements due to force directed by the measurement head to the sample well plate. Hence, the situation in which the measurement head touches the sample well plate can be detected without a need to provide the measurement head with a force sensor. This is advantageous because the measurement head can be a changeable module of the optical measurement instrument.
    Type: Grant
    Filed: January 18, 2010
    Date of Patent: September 24, 2013
    Assignee: Perkinelmer Singapore Pte. Ltd.
    Inventors: Jyrki Laitinen, Markku Ojala, Jarkko Sarmaala, Christer Isaksson
  • Patent number: 8340489
    Abstract: An bidirectional optical component position adjustment device includes a first member having a flat sliding surface, and a second member movable relative to the first member contacting the sliding surface. The optical component attaches to the second member. An elongated third member connects with the first and second members so the second member is movable relative to the first in a direction of a rotation axis of the third member when the third member is moved in the direction of its rotation axis. The rotation axis is substantially parallel to the sliding surface. The third member includes an eccentric part which is eccentric in relation to the rotation axis. The eccentric part is operationally connected with the second member so the second member moves relative to the first perpendicular to the rotation axis when the third member is rotated around its rotation axis. An optical adjustment method is also provided.
    Type: Grant
    Filed: December 11, 2008
    Date of Patent: December 25, 2012
    Assignee: PerkinElmer Singapore Pte. Ltd.
    Inventor: Jarkko Sarmaala
  • Publication number: 20120002190
    Abstract: An optical measurement instrument includes a measurement head and mechanical support elements arranged to support a sample well plate. The measurement head is moved towards the sample well plate and, after the measurement head has touched the sample well plate, the measurement head is moved backwards away from the sample well plate so as to provide a desired distance between the measurement head and the sample well plate. A sensor device is attached to the mechanical support elements and arranged detect a mechanical effect occurring in the mechanical support elements due to force directed by the measurement head to the sample well plate. Hence, the situation in which the measurement head touches the sample well plate can be detected without a need to provide the measurement head with a force sensor. This is advantageous because the measurement head can be a changeable module of the optical measurement instrument.
    Type: Application
    Filed: January 18, 2010
    Publication date: January 5, 2012
    Applicant: WALLAC OY
    Inventors: Jyrki Laitinen, Markku Ojala, Jarkko Sarmaala, Christer Isaksson
  • Publication number: 20100308234
    Abstract: The invention concerns a measurement system and method for optical spectroscopic measurement of samples. The system comprises an illumination source for forming a primary light beam, a first tunable monochromator for spectrally filtering the primary light beam, a sample-receiving zone to which the spectrally filtered primary beam is directed for producing a secondary light beam affected by a sample in the sample receiving zone, and a second tunable monochromator for spectrally filtering the secondary light beam, and a detector for measuring the intensity of the spectrally filtered secondary beam. In particular, the system is adapted to scan a predefined wavelength range using one of the monochromators and to tune the other monochromator sequentially to one of at least two predefined separate wavelengths in order to eliminate the effect of undesired diffraction orders of the second monochromator on the measurement.
    Type: Application
    Filed: January 23, 2009
    Publication date: December 9, 2010
    Applicant: Wallac OY
    Inventors: Raimo Harju, Petri Kivelä, Jyrki Laitinen, Pauli Salmelainen, Jarkko Sarmaala
  • Publication number: 20100266252
    Abstract: An bidirectional optical component position adjustment device includes a first member having a flat sliding surface, and a second member movable relative to the first member contacting the sliding surface. The optical component attaches to the second member. An elongated third member connects with the first and second members so the second member is movable relative to the first in a direction of a rotation axis of the third member when the third member is moved in the direction of its rotation axis. The rotation axis is substantially parallel to the sliding surface. The third member includes an eccentric part which is eccentric in relation to the rotation axis. The eccentric part is operationally connected with the second member so the second member moves relative to the first perpendicular to the rotation axis when the third member is rotated around its rotation axis. An optical adjustment method is also provided.
    Type: Application
    Filed: December 11, 2008
    Publication date: October 21, 2010
    Applicant: WALLAC OY
    Inventor: Jarkko Sarmaala