Patents by Inventor Jarno Waetzig

Jarno Waetzig has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Optical position-measuring device
    Patent number: 9395214
    Abstract: An optical position-measuring device includes a measuring standard having a first grating in a form of a periodic incremental graduation and an absolute mark. A scanning unit is displaceable relative to the measuring standard in a measuring direction. The scanning unit has at least one second grating disposed at a scanning distance from the first grating. A first detector array is configured to obtain a first scanning signal for purposes of position determination in which the gratings are illuminated with light of a first wavelength. A second detector array is configured to obtain a second scanning signal for purposes of position determination in which the absolute mark is illuminated with light of a second wavelength. The first wavelength is shorter than the second wavelength.
    Type: Grant
    Filed: November 14, 2013
    Date of Patent: July 19, 2016
    Assignee: DR. JOHANNES HEIDENHAIN GMBH
    Inventors: Mario Himmel, Jarno Waetzig, Thomas Juenemann
  • OPTICAL POSITION-MEASURING DEVICE
    Publication number: 20140146326
    Abstract: An optical position-measuring device includes a measuring standard having a first grating in a form of a periodic incremental graduation and an absolute mark. A scanning unit is displaceable relative to the measuring standard in a measuring direction. The scanning unit has at least one second grating disposed at a scanning distance from the first grating. A first detector array is configured to obtain a first scanning signal for purposes of position determination in which the gratings are illuminated with light of a first wavelength. A second detector array is configured to obtain a second scanning signal for purposes of position determination in which the absolute mark is illuminated with light of a second wavelength. The first wavelength is shorter than the second wavelength.
    Type: Application
    Filed: November 14, 2013
    Publication date: May 29, 2014
    Applicant: DR. JOHANNES HEIDENHAIN GmbH
    Inventors: Mario Himmel, Jarno Waetzig, Thomas Juenemann