Patents by Inventor Jaroslav Ve{haeck over (c)}e{haeck over (r)}

Jaroslav Ve{haeck over (c)}e{haeck over (r)} has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and device for the spectral analysis of light
    Patent number: 6646743
    Abstract: The method utilizes the physical phenomenon known as dispersion of the optical rotation. After passage of linearly polarized electromagnetic radiation through the optically active environment (rotator), with the rotating power characterized by a parameter p, and then through the analyzing polarizer, the function R(p) can be measured. For the given active medium and the relative orientation of polarization planes of the input light beam and the analyzing polarizer, R(p) has an unambiguous relation with the spectrum I(&lgr;) of the analyzed radiation (&lgr; stands for wavelength) and allows its unambiguous determination by special mathematical methods. In devices based on the above mentioned principle a linearly polarized collimated beam of analyzed radiation propagates through the optical rotator then passes through the analyzer and strikes a single-channel or multi-channel detector which measures R(p) as a function of the parameter p.
    Type: Grant
    Filed: March 8, 2002
    Date of Patent: November 11, 2003
    Inventors: Petr Herman, Jaroslav Ve{haeck over (c)}e{haeck over (r)}
  • Method and device for the spectral analysis of light
    Patent number: 6373569
    Abstract: The method utilizes the physical phenomenon known as dispersion of the optical rotation. After passage of linearly polarized electromagnetic radiation through the optically active environment (rotator), with the rotating power characterized by a parameter p, and then through the analyzing polarizer, the function R(p) can be measured. For the given active medium and the relative orientation of polarization planes of the input light beam and the analyzing polarizer, R(p) has an unambiguous relation with the spectrum I(&lgr;) of the analyzed radiation (&lgr; stands for wavelength) and allows its unambiguous determination by special mathematical methods. In devices based on the above mentioned principle a linearly polarized collimated beam of analyzed radiation propagates through the optical rotator then passes through the analyzer and strikes a single-channel or multi-channel detector which measures R(p) as a function of the parameter p.
    Type: Grant
    Filed: April 28, 1999
    Date of Patent: April 16, 2002
    Inventors: Petr He{haeck over (r)}man, Jaroslav Ve{haeck over (c)}e{haeck over (r)}