Abstract: A probe is connectable to a test instrument for measuring signals of a DUT, where the probe includes a probe head that includes multiple leads configured to connect to signal probe points of the DUT, and a sensor connected between two of the leads; at least one probe output configured to connect to the test instrument; a current detection circuit configured to detect current of the DUT through the sensor, and to provide a detected current signal; a voltage detection circuit configured to detect voltage of the DUT between the sensor and ground, and to provide a detected voltage signal; a combiner configured to combine the detected current signal and the detected voltage signal, and to provide a power signal indicating power of the DUT; and switches configured to selectively output at least one of the detected current signal, the detected voltage signal, and the power signal.

Abstract: A probe is connectable to a test instrument for measuring signals of a DUT, where the probe includes a probe head that includes multiple leads configured to connect to signal probe points of the DUT, and a sensor connected between two of the leads; at least one probe output configured to connect to the test instrument; a current detection circuit configured to detect current of the DUT through the sensor, and to provide a detected current signal; a voltage detection circuit configured to detect voltage of the DUT between the sensor and ground, and to provide a detected voltage signal; a combiner configured to combine the detected current signal and the detected voltage signal, and to provide a power signal indicating power of the DUT; and switches configured to selectively output at least one of the detected current signal, the detected voltage signal, and the power signal.

Abstract: A handheld differential contact probe includes a housing configured to be held in a hand of a user, a pair of probe arms carried by the housing, and a pair of opposing probe tip assemblies each carried by one of the respective probe arms and each having a probe tip circuit coupled to a probe tip at a distal end thereof. A probe tip span adjustment mechanism is carried by the housing and coupled to the pair of probe arms, and configured to adjust a span between the probe tips. A ground path mechanism is coupled between the probe tip circuits of the respective probe tip assemblies, and includes a pair of curved conductive ribbon springs each coupled at an outer end thereof to a respective probe tip circuit, and each curved conductive ribbon spring slidably engaging each other at a respective inner end thereof.

Abstract: A handheld differential contact probe includes a housing configured to be held in a hand of a user, a pair of probe arms carried by the housing, and a pair of opposing probe tip assemblies each carried by one of the respective probe arms and each having a probe tip circuit coupled to a probe tip at a distal end thereof. A probe tip span adjustment mechanism is carried by the housing and coupled to the pair of probe arms, and configured to adjust a span between the probe tips. A ground path mechanism is coupled between the probe tip circuits of the respective probe tip assemblies, and includes a pair of curved conductive ribbon springs each coupled at an outer end thereof to a respective probe tip circuit, and each curved conductive ribbon spring slidably engaging each other at a respective inner end thereof.

Abstract: A handheld differential contact probe includes a housing configured to be held in a hand of a user, a pair of probe arms carried by the housing, and a pair of opposing probe tip assemblies each carried by one of the respective probe arms and each having a probe tip circuit coupled to a probe tip at a distal end thereof. A probe tip span adjustment mechanism is carried by the housing and coupled to the pair of probe arms, and configured to adjust a span between the probe tips. A ground path mechanism is coupled between the probe tip circuits of the respective probe tip assemblies, and includes a pair of curved conductive ribbon springs each coupled at an outer end thereof to a respective probe tip circuit, and each curved conductive ribbon spring slidably engaging each other at a respective inner end thereof.

Abstract: A single-ended test probe includes a probe body such as a coaxial cable, a signal tip integral with the core (signal conductor), to ground arm having a ground tip and mounted to the coaxial cable, and an electrically conductive ground member projecting outside the coaxial cable and electrically conductively connecting the ground arm to the shield (ground conductor) of the coaxial cable. The ground member may be located closer to the end of the cable than the location at which the ground arm is mounted to the cable to minimize inductance in the connection between the probe and a device under test. The ground member may also be a cam by which the span between the ground and signal tips can be adjusted. Also, the test probe may include a second ground arm that is detachable connectable to the probe body independently of the first.

Abstract: A handheld differential contact probe includes a housing configured to be held in a hand of a user, a pair of probe arms carried by the housing, and a pair of opposing probe tip assemblies each carried by one of the respective probe arms and each having a probe tip circuit coupled to a probe tip at a distal end thereof. A probe tip span adjustment mechanism is carried by the housing and coupled to the pair of probe arms, and configured to adjust a span between the probe tips. A ground path mechanism is coupled between the probe tip circuits of the respective probe tip assemblies, and includes a pair of curved conductive ribbon springs each coupled at an outer end thereof to a respective probe tip circuit, and each curved conductive ribbon spring slidably engaging each other at a respective inner end thereof.

Abstract: A single-ended test probe includes a probe body such as a coaxial cable, a signal tip integral with the core (signal conductor), to ground arm haying a ground tip and mounted to the coaxial cable, and an electrically conductive ground member projecting outside the coaxial cable and electrically conductively connecting the ground arm to the shield (ground conductor) of the coaxial cable. The ground member may be located closer to the end of the cable than the location at which the ground arm is mounted to the cable to minimize inductance in the connection between the probe and a device under test. The ground member may also be a cam by which the span between the ground and signal tips can be adjusted. Also, the test probe may include a second ground arm that is detachable connectable to the probe body independently of the first.

Abstract: A probe device is provided that has a clip-on wireless device attached thereto for communicating over a wireless communication link with test equipment having a wireless transceiver attached thereto. The clip-on wireless device may have one or more components that provide additional functionality to the probe device over that which is currently available on most probe devices.

Abstract: A probe device is provided that has light source thereon that can be activated and deactivated. In accordance with an embodiment, the light source operates as a visual indicator to provide a visual indication of whether a good connection exists between the tips of the probe device and the intended contact points on the DUT. In accordance with another embodiment, the light source operates as a source of illumination to illuminate the probe tips and the contact pads on the DUT as the user is attempting to place the probe tips in contact with the contact pads on the DUT. In accordance with yet another embodiment, the light source performs the dual functions of providing a visual indication of connection status and of illuminating the probe device tips and the intended contact points on the DUT.

Abstract: A differential probe device is provided that has a scissor-type configuration that allows the inter-tip ground path length to be very short, thereby ensuring that the probe device will have a small ground inductance. Providing the probe device with a small ground inductance ensures that the ground inductance will not cause the bandwidth of the probe device to be unduly limited, even at higher frequencies. The configuration of the probe device also enables the ground areas on the arms to remain in continuous contact over the range of available span widths between the tips, which also helps to ensure that the ground inductance is kept small and generally fixed. Also, the configuration of the probe device enables the proximal ends of the probe arms to be kept small in size to accommodate DUT layouts having small test features and/or test features that are close together.

Abstract: A torque-limiting connector includes an outer clutch having a plurality of biased outer teeth and an inner clutch configured to fit within the outer clutch, the inner clutch having a plurality of cantilevered inner members. Each of the plurality of cantilevered inner members has an inner tooth, wherein upon the application of a predetermined amount of torque, each of the plurality of biased outer teeth slips over a respective inner tooth.