Patents by Inventor Jason Andrew Koehn

Jason Andrew Koehn has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Velocity profile mapping system
    Patent number: 9523703
    Abstract: A velocity mapping system comprising a sensor system and an airflow mapper. The sensor system is configured to generate data about a velocity of airflow for a location in a duct system. The airflow mapper is configured to receive the data from the sensor system and generate a profile of the velocity of the airflow at the location in the duct system.
    Type: Grant
    Filed: March 27, 2012
    Date of Patent: December 20, 2016
    Assignee: THE BOEING COMPANY
    Inventors: Jason Andrew Koehn, James K. Whitley, Shawn Paul Snell
  • Velocity Profile Mapping System
    Publication number: 20130261992
    Abstract: A velocity mapping system comprising a sensor system and an airflow mapper. The sensor system is configured to generate data about a velocity of airflow for a location in a duct system. The airflow mapper is configured to receive the data from the sensor system and generate a profile of the velocity of the airflow at the location in the duct system.
    Type: Application
    Filed: March 27, 2012
    Publication date: October 3, 2013
    Applicant: THE BOEING COMPANY
    Inventors: Jason Andrew Koehn, James K. Whitley, Shawn Paul Snell
  • Charged particle beam profile measurement
    Patent number: 7875860
    Abstract: According to an embodiment, an apparatus for measuring the uniformity of a beam of charged particles at an exposure location includes a plurality of Faraday cups, each cup including an electrometer for determining the current collected by said cup, at least one multi-channel low current scanner card electrically coupled to the electrometers, a processor electrically coupled to said at least one scanner card, computational analysis software for receiving signals from said processor and calculating beam parameters, and display software for generating a graphical representation of the beam parameters calculated by said computational analysis software.
    Type: Grant
    Filed: September 19, 2008
    Date of Patent: January 25, 2011
    Assignee: The Boeing Company
    Inventors: Jason Andrew Koehn, Dennis A. Russell
  • Charged particle beam profile measurement
    Publication number: 20100072392
    Abstract: According to an embodiment, an apparatus for measuring the uniformity of a beam of charged particles at an exposure location includes a plurality of Faraday cups, each cup including an electrometer for determining the current collected by said cup, at least one multi-channel low current scanner card electrically coupled to the electrometers, a processor electrically coupled to said at least one scanner card, computational analysis software for receiving signals from said processor and calculating beam parameters, and display software for generating a graphical representation of the beam parameters calculated by said computational analysis software.
    Type: Application
    Filed: September 19, 2008
    Publication date: March 25, 2010
    Inventors: Jason Andrew Koehn, Dennis A. Russell