Patents by Inventor Jason Cho Fox

Jason Cho Fox has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Process mapping of transient thermal response due to value changes in a process variable
    Patent number: 10035220
    Abstract: A method includes conducting a plurality of tests on process variables of a manufacturing process, with a test of the plurality of tests being associated with two combinations of process variables, the test having first values for a first combination of process variables at a first time and second values for a second combination of process variables at a second time, the test comprising: locally heating a region of a structure, wherein the local heating results in formation of a thermal field in the structure; assessing one or more thermal characteristics of the thermal field during a transition between the first combination of process variables and the second combination of process variables; and based on results of the plurality of tests, generating a process map of a transient response of the one or more thermal characteristics of the thermal field.
    Type: Grant
    Filed: March 14, 2014
    Date of Patent: July 31, 2018
    Assignee: Carnegie Mellon University
    Inventors: Jack Lee Beuth, Jr., Jason Cho Fox
  • PROCESS MAPPING OF TRANSIENT THERMAL RESPONSE DUE TO VALUE CHANGES IN A PROCESS VARIABLE
    Publication number: 20160041111
    Abstract: A method includes conducting a plurality of tests on process variables of a manufacturing process, with a test of the plurality of tests being associated with two combinations of process variables, the test having first values for a first combination of process variables at a first time and second values for a second combination of process variables at a second time, the test comprising: locally heating a region of a structure, wherein the local heating results in formation of a thermal field in the structure; assessing one or more thermal characteristics of the thermal field during a transition between the first combination of process variables and the second combination of process variables; and based on results of the plurality of tests, generating a process map of a transient response of the one or more thermal characteristics of the thermal field.
    Type: Application
    Filed: March 14, 2014
    Publication date: February 11, 2016
    Inventors: Jack Lee Beuth, Jason Cho Fox