Patents by Inventor Jason Cleveland
Jason Cleveland has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20160313369Abstract: Improvements for rapidly calibrating and automatically operating a scanning probe microscope are disclosed. A central component of the SPM is the force transducer, typically a consumable cantilever element. By automatically calibrating transducer characteristics along with other instrumental parameters, scanning parameters can be rapidly and easily optimized, resulting in high-throughput, repeatable and accurate measurements. In contrast to dynamic optimization schemes, this can be accomplished before the surface is contacted, avoiding tip or sample damage from the beginning of the measurement process.Type: ApplicationFiled: July 5, 2016Publication date: October 27, 2016Inventors: Roger Proksch, Roger C. Callahan, Frank Stetter, Ted Limpoco, Sophia Hohlbauch, Jason Bemis, Jason Cleveland
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Patent number: 9383388Abstract: Improvements for rapidly calibrating and automatically operating a scanning probe microscope are disclosed. A central component of the SPM is the force transducer, typically a consumable cantilever element. By automatically calibrating transducer characteristics along with other instrumental parameters, scanning parameters can be rapidly and easily optimized, resulting in high-throughput, repeatable and accurate measurements. In contrast to dynamic optimization schemes, this can be accomplished before the surface is contacted, avoiding tip or sample damage from the beginning of the measurement process.Type: GrantFiled: April 21, 2015Date of Patent: July 5, 2016Assignee: Oxford Instruments Asylum Research, IncInventors: Roger Proksch, Roger C. Callahan, Frank Stetter, Ted Limpoco, Sophia Hohlbach, Jason Bemis, Jason Cleveland
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Patent number: 9383386Abstract: This invention relates to an optical light beam positioning system that enables the combination of two or more light beams of different wavelengths to be focused onto a probe or sample of a scientific instrument, such as an atomic force microscope, for a number of specific uses typical to AFMs, like measuring the deflection or oscillation of the probe and illuminating an object for optical imaging, and less traditional ones like photothermal excitation of the probe, photothermal activated changes in the sample, photothermal cleaning of the probe and photochemical, photovoltaic, photothermal and other light beam induced changes in the sample. The focused light beams may be independently positioned relative to each other.Type: GrantFiled: March 12, 2014Date of Patent: July 5, 2016Assignee: OXFORD INSTRUMENTS ASYLUM RESEARCH, INC.Inventors: Aleksander Labuda, Jason Cleveland, Deron Walters, Roger Proksch
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Publication number: 20160169937Abstract: This invention relates to a metrological scanning probe microscope system combining an SPM which employs an optical lever arrangement to measure displacement of the probe indirectly with another SPM which measures the displacement of the probe directly through the use of an interferometric detection scheme.Type: ApplicationFiled: November 3, 2015Publication date: June 16, 2016Inventors: Aleksander Labuda, Deron Walters, Jason Cleveland, Roger Proksch
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Publication number: 20150338438Abstract: A modular Atomic Force Microscope that allows ultra-high resolution imaging and measurements in a wide variety of environmental conditions is described. The instrument permits such imaging and measurements in environments ranging from ambient to liquid or gas or extremely high or extremely low temperatures.Type: ApplicationFiled: August 4, 2015Publication date: November 26, 2015Inventors: Mario Viani, Roger Proksch, Maarten Rutgers, Jason Cleveland, Jim Hodgson
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Publication number: 20150301080Abstract: Improvements for rapidly calibrating and automatically operating a scanning probe microscope are disclosed. A central component of the SPM is the force transducer, typically a consumable cantilever element. By automatically calibrating transducer characteristics along with other instrumental parameters, scanning parameters can be rapidly and easily optimized, resulting in high-throughput, repeatable and accurate measurements. In contrast to dynamic optimization schemes, this can be accomplished before the surface is contacted, avoiding tip or sample damage from the beginning of the measurement process.Type: ApplicationFiled: April 21, 2015Publication date: October 22, 2015Inventors: Roger Proksch, Roger C. Callahan, Frank Stetter, Ted Limpoco, Sophia Hohlbach, Jason Bemis, Jason Cleveland
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Patent number: 9097737Abstract: A modular Atomic Force Microscope that allows ultra-high resolution imaging and measurements in a wide variety of environmental conditions is described. The instrument permits such imaging and measurements in environments ranging from ambient to liquid or gas or extremely high or extremely low temperatures.Type: GrantFiled: November 25, 2013Date of Patent: August 4, 2015Assignee: Oxford Instruments Asylum Research, Inc.Inventors: Mario Viani, Roger Proksch, Maarten Rutgers, Jason Cleveland, Jim Hodgson
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Patent number: 9063042Abstract: A new type of indenter is described. This device combines certain sensing and structural elements of atomic force microscopy with a module designed for the use of indentation probes, conventional diamond and otherwise, as well as unconventional designs, to produce high resolution and otherwise superior indentation measurements.Type: GrantFiled: June 12, 2012Date of Patent: June 23, 2015Assignees: Oxford Instruments PLC, Oxford Instruments AFM IncInventors: Flavio Alejandro Bonilla, Roger Proksch, Jason Cleveland, Tim Sauter
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Publication number: 20150150163Abstract: A modular Atomic Force Microscope that allows ultra-high resolution imaging and measurements in a wide variety of environmental conditions is described. The instrument permits such imaging and measurements in environments ranging from ambient to liquid or gas or extremely high or extremely low temperatures.Type: ApplicationFiled: November 25, 2013Publication date: May 28, 2015Applicant: Oxford Instruments Asylum Research, Inc.Inventors: Mario Viani, Roger Proksch, Maarten Rutgers, Jason Cleveland, Jim Hodgeson
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Publication number: 20150113687Abstract: A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to detect cantilever deflection in these instruments with a very fast analog/digital converter (ADC). The resulting digitized representation of the output signal is then processed with field programmable gate arrays and digital signal processors without making use of analog electronics. Analog signal processing is inherently noisy while digital calculations are inherently “perfect” in that they do not add any random noise to the measured signal. Processing by field programmable gate arrays and digital signal processors maximizes the flexibility of the controller because it can be varied through programming means, without modification of the controller hardware.Type: ApplicationFiled: January 6, 2015Publication date: April 23, 2015Inventors: Roger Proksch, Jason Cleveland, Dan Bocek, Todd Day, Mario Viani, Clint Callahan
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Patent number: 8925376Abstract: A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to detect cantilever deflection in these instruments with a very fast analog/digital converter (ADC). The resulting digitized representation of the output signal is then processed with field programmable gate arrays and digital signal processors without making use of analog electronics. Analog signal processing is inherently noisy while digital calculations are inherently “perfect” in that they do not add any random noise to the measured signal. Processing by field programmable gate arrays and digital signal processors maximizes the flexibility of the controller because it can be varied through programming means, without modification of the controller hardware.Type: GrantFiled: June 26, 2012Date of Patent: January 6, 2015Assignees: Oxford Instruments PLC, Oxford Instruments AFM, IncInventors: Roger Proksch, Jason Cleveland, Dan Bocek, Todd Day, Mario B. Viani, Clint Callahan
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Publication number: 20140317790Abstract: This invention relates to an optical light beam positioning system that enables the combination of two or more light beams of different wavelengths to be focused onto a probe or sample of a scientific instrument, such as an atomic force microscope, for a number of specific uses typical to AFMs, like measuring the deflection or oscillation of the probe and illuminating an object for optical imaging, and less traditional ones like photothermal excitation of the probe, photothermal activated changes in the sample, photothermal cleaning of the probe and photochemical, photovoltaic, photothermal and other light beam induced changes in the sample. The focused light beams may be independently positioned relative to each other.Type: ApplicationFiled: March 12, 2014Publication date: October 23, 2014Inventors: Aleksander Labuda, Jason Cleveland, Deron Walters, Roger Proksch
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Publication number: 20140223612Abstract: A modular AFM/SPM which provides faster measurements, in part through the use of smaller probes, of smaller forces and movements, free of noise artifacts, that the old generations of these devices have increasingly been unable to provide. The modular AFM/SPM includes a chassis, the foundation on which the modules of the instrument are supported; a view module providing the optics for viewing the sample and the probe; a head module providing the components for the optical lever arrangement and for steering and focusing those components; a scanner module providing the XYZ translation stage that actuates the sample in those dimensions and the engage mechanism; a isolation module that encloses the chassis and provides acoustic and/or thermal isolation for the instrument and an electronics module which, together with the separate controller, provide the electronics for acquiring and processing images and controlling the other functions of the instrument.Type: ApplicationFiled: February 5, 2013Publication date: August 7, 2014Applicant: ASYLUM CORPORATIONInventors: Roger Proksch, Mario Viani, Jason Cleveland, Maarten Rutgers, Matthew Klonowski, Deron Walters, James Hodgson, Jonathan Hensel, Paul Costales
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Publication number: 20130314078Abstract: A single housing with a non-ferromagnetic piezo-driven flexure has primary and secondary coil forms of different diameters, one coaxially inside the other, integrated in the flexure. The cylinders defining the planes of the primary and secondaries do not spatially overlap. The secondary coil forms may be wound in opposite directions and wired to provide a transformer device. Movement of the primary relative to the secondaries in the direction of the central axis of the coils can be differentially detected with high precision.Type: ApplicationFiled: August 6, 2013Publication date: November 28, 2013Applicants: OXFORD INSTRUMENTS AFM INC, OXFORD INSTRUMENTS PLCInventors: Roger Proksch, Dan Bocek, Jason Cleveland, Matthew Longmire, Matthew Klonowski
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Patent number: 8502525Abstract: A single housing with a non-ferromagnetic piezo-driven flexure has primary and secondary coil forms of different diameters, one coaxially inside the other, integrated in the flexure. The cylinders defining the planes of the primary and secondaries do not spatially overlap. The secondary coil forms may be wound in opposite directions and wired to provide a transformer device. Movement of the primary relative to the secondaries in the direction of the central axis of the coils can be differentially detected with high precision.Type: GrantFiled: October 14, 2009Date of Patent: August 6, 2013Assignees: Oxford Instruments PLC, Oxford Instruments AFM, IncInventors: Roger Proksch, Dan Bocek, Jason Cleveland, Matthew Longmire, Matthew Klonowski
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Patent number: 8459102Abstract: A digital system for controlling the quality factor in a resonant device. The resonant device can be a a device that includes a cantilever within its system, such as an atomic force microscope. The quality factor can be digitally controlled to avoid noise effect in the analog components. A direct digital synthesizer implemented in a way that provides access to the output of the phase accumulator. That output is a number which usually drives a lookup table to produce a cosine or sine output wave. The output wave is created, but the number is also adjusted to form a second number that drives a second lookup table to create an adjustment factor to adjust the output from the cosine table. The adjusted digital signal than drives a DA converter which produces an output drive for the cantilever.Type: GrantFiled: October 25, 2011Date of Patent: June 11, 2013Assignees: Oxford Instruments PLC, Oxford Instruments AFM Inc.Inventors: Dan Bocek, Jason Cleveland
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Patent number: 8370960Abstract: A modular AFM/SPM which provides faster measurements, in part through the use of smaller probes, of smaller forces and movements, free of noise artifacts, that the old generations of these devices have increasingly been unable to provide. The modular AFM/SPM includes a chassis, the foundation on which the modules of the instrument are supported; a view module providing the optics for viewing the sample and the probe; a head module providing the components for the optical lever arrangement and for steering and focusing those components; a scanner module providing the XYZ translation stage that actuates the sample in those dimensions and the engage mechanism; a isolation module that encloses the chassis and provides acoustic and/or thermal isolation for the instrument and an electronics module which, together with the separate controller, provide the electronics for acquiring and processing images and controlling the other functions of the instrument.Type: GrantFiled: October 14, 2009Date of Patent: February 5, 2013Assignee: Asylum Research CorporationInventors: Roger Proksch, Mario Viani, Jason Cleveland, Maarten Rutgers, Matthew Klonowski, Daren Walters, James Hodgson, Jonathan Hensel, Paul Costales, Anil Gannepalli
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Publication number: 20120272411Abstract: A new type of indenter is described. This device combines certain sensing and structural elements of atomic force microscopy with a module designed for the use of indentation probes, conventional diamond and otherwise, as well as unconventional designs, to produce high resolution and otherwise superior indentation measurements.Type: ApplicationFiled: June 12, 2012Publication date: October 25, 2012Applicant: ASYLUM RESEARCH CORPORATIONInventors: Flavio Alejandro Bonilla, Roger Proksch, Jason Cleveland, Tim Sauter
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Publication number: 20120266336Abstract: A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to detect cantilever deflection in these instruments with a very fast analog/digital converter (ADC). The resulting digitized representation of the output signal is then processed with field programmable gate arrays and digital signal processors without making use of analog electronics. Analog signal processing is inherently noisy while digital calculations are inherently “perfect” in that they do not add any random noise to the measured signal. Processing by field programmable gate arrays and digital signal processors maximizes the flexibility of the controller because it can be varied through programming means, without modification of the controller hardware.Type: ApplicationFiled: June 26, 2012Publication date: October 18, 2012Applicant: ASYLUM RESEARCH CORPORATIONInventors: Roger Proksch, Jason Cleveland, Dan Bocek, Todd Day, Mario B. Viani, Clint Callahan
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Publication number: 20120216322Abstract: A digital system for controlling the quality factor in a resonant device. The resonant device can be a a device that includes a cantilever within its system, such as an atomic force microscope. The quality factor can be digitally controlled to avoid noise effect in the analog components. A direct digital synthesizer implemented in a way that provides access to the output of the phase accumulator. That output is a number which usually drives a lookup table to produce a cosine or sine output wave. The output wave is created, but the number is also adjusted to form a second number that drives a second lookup table to create an adjustment factor to adjust the output from the cosine table. The adjusted digital signal than drives a DA converter which produces an output drive for the cantilever.Type: ApplicationFiled: October 25, 2011Publication date: August 23, 2012Applicant: Asylum Research CorporationInventors: Dan Bocek, Jason Cleveland