Patents by Inventor Jason D. Lohr

Jason D. Lohr has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • High precison calibration and feature measurement system for a scanning probe microscope
    Patent number: 5825670
    Abstract: The present invention allows for calibration of a scanning probe microscope under computer control. The present invention comprehends either the removal of nonlinear artifacts in the microscope output data after measurement has been taken (a off-line process), or the correction of nonlinear movements in the microscope scanner such that the scanner moves in a linear fashion during measurement (a realtime process). The realtime process may be operated in both an open-loop and a closed-loop process. The processes of the present invention uses an average cross-section of the scan in order to simplify the calculation and to improve the signal-to-noise ratio. Interpolation methods and centroid calculations are used to locate features on the scanned sample to subpixel precision.
    Type: Grant
    Filed: March 5, 1997
    Date of Patent: October 20, 1998
    Assignee: Advanced Surface Microscopy
    Inventors: Donald A. Chernoff, Jason D. Lohr
  • High precision calibration and feature measurement system for a scanning probe microscope
    Patent number: 5644512
    Abstract: The present invention allows for calibration of a scanning probe microscope under computer control. The present invention comprehends either the removal of nonlinear artifacts in the microscope output data after measurement has been taken (a off-line process), or the correction of nonlinear movements in the microscope scanner such that the scanner moves in a linear fashion during measurement (a realtime process). The realtime process may be operated in both an open-loop and a closed-loop process. The processes of the present invention uses an average cross-section of the scan in order to simplify the calculation and to improve the signal-to-noise ratio. Interpolation methods and centroid calculations are used to locate features on the scanned sample to subpixel precision.
    Type: Grant
    Filed: March 4, 1996
    Date of Patent: July 1, 1997
    Assignee: Advanced Surface Microscopy, Inc.
    Inventors: Donald A. Chernoff, Jason D. Lohr