Patents by Inventor Jason David Harper
Jason David Harper has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10290483Abstract: The invention generally relates to systems and methods for transferring ions for analysis. In certain embodiments, the invention provides a system for analyzing a sample including an ionizing source for converting molecules of a sample into gas phase ions in a region at about atmospheric pressure, an ion analysis device, and an ion transfer member operably coupled to a gas flow generating device, in which the gas flow generating device produces a laminar gas flow that transfers the gas phase ions through the ion transfer member to an inlet of the ion analysis device.Type: GrantFiled: May 24, 2018Date of Patent: May 14, 2019Assignee: Purdue Research FoundationInventors: Zheng Ouyang, Robert Graham Cooks, Sandilya Venkata Garimella, Jason David Harper, Nicholas Alan Charipar
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Publication number: 20180286651Abstract: The invention generally relates to systems and methods for transferring ions for analysis. In certain embodiments, the invention provides a system for analyzing a sample including an ionizing source for converting molecules of a sample into gas phase ions in a region at about atmospheric pressure, an ion analysis device, and an ion transfer member operably coupled to a gas flow generating device, in which the gas flow generating device produces a laminar gas flow that transfers the gas phase ions through the ion transfer member to an inlet of the ion analysis device.Type: ApplicationFiled: May 24, 2018Publication date: October 4, 2018Inventors: Zheng Ouyang, Robert Graham Cooks, Sandilya Venkata Garimella, Jason David Harper, Nicholas Alan Charipar
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Patent number: 10008374Abstract: The invention generally relates to systems and methods for transferring ions for analysis. In certain embodiments, the invention provides a system for analyzing a sample including an ionizing source for converting molecules of a sample into gas phase ions in a region at about atmospheric pressure, an ion analysis device, and an ion transfer member operably coupled to a gas flow generating device, in which the gas flow generating device produces a laminar gas flow that transfers the gas phase ions through the ion transfer member to an inlet of the ion analysis device.Type: GrantFiled: November 1, 2016Date of Patent: June 26, 2018Assignee: Purdue Research FoundationInventors: Zheng Ouyang, Robert Graham Cooks, Sandilya Venkata Garimella, Jason David Harper, Nicholas Alan Charipar
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Publication number: 20170154761Abstract: The invention generally relates to systems and methods for transferring ions for analysis. In certain embodiments, the invention provides a system for analyzing a sample including an ionizing source for converting molecules of a sample into gas phase ions in a region at about atmospheric pressure, an ion analysis device, and an ion transfer member operably coupled to a gas flow generating device, in which the gas flow generating device produces a laminar gas flow that transfers the gas phase ions through the ion transfer member to an inlet of the ion analysis device.Type: ApplicationFiled: November 1, 2016Publication date: June 1, 2017Inventors: Zheng Ouyang, Robert Graham Cooks, Sandilya Venkata Garimella, Jason David Harper, Nicholas Alan Charipar
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Patent number: 9484195Abstract: The invention generally relates to systems and methods for transferring ions for analysis. In certain embodiments, the invention provides a system for analyzing a sample including an ionizing source for converting molecules of a sample into gas phase ions in a region at about atmospheric pressure, an ion analysis device, and an ion transfer member operably coupled to a gas flow generating device, in which the gas flow generating device produces a laminar gas flow that transfers the gas phase ions through the ion transfer member to an inlet of the ion analysis device.Type: GrantFiled: October 12, 2015Date of Patent: November 1, 2016Assignee: Purdue Research FoundationInventors: Zheng Ouyang, Robert Graham Cooks, Sandilya Venkata Garimella, Jason David Harper, Nicholas Alan Charipar
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Publication number: 20160118237Abstract: The invention generally relates to systems and methods for transferring ions for analysis. In certain embodiments, the invention provides a system for analyzing a sample including an ionizing source for converting molecules of a sample into gas phase ions in a region at about atmospheric pressure, an ion analysis device, and an ion transfer member operably coupled to a gas flow generating device, in which the gas flow generating device produces a laminar gas flow that transfers the gas phase ions through the ion transfer member to an inlet of the ion analysis device.Type: ApplicationFiled: October 12, 2015Publication date: April 28, 2016Inventors: Zheng Ouyang, Robert Graham Cooks, Sandilya Venkata Garimella, Jason David Harper, Nicholas Alan Charipar
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Patent number: 9159540Abstract: The invention generally relates to systems and methods for transferring ions for analysis. In certain embodiments, the invention provides a system for analyzing a sample including an ionizing source for converting molecules of a sample into gas phase ions in a region at about atmospheric pressure, an ion analysis device, and an ion transfer member operably coupled to a gas flow generating device, in which the gas flow generating device produces a laminar gas flow that transfers the gas phase ions through the ion transfer member to an inlet of the ion analysis device.Type: GrantFiled: January 12, 2015Date of Patent: October 13, 2015Assignee: Purdue Research FoundationInventors: Zheng Ouyang, Robert Graham Cooks, Sandilya Venkata Garimella, Jason David Harper, Nicholas Alan Charipar
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Publication number: 20150262803Abstract: The invention generally relates to systems and methods for transferring ions for analysis. In certain embodiments, the invention provides a system for analyzing a sample including an ionizing source for converting molecules of a sample into gas phase ions in a region at about atmospheric pressure, an ion analysis device, and an ion transfer member operably coupled to a gas flow generating device, in which the gas flow generating device produces a laminar gas flow that transfers the gas phase ions through the ion transfer member to an inlet of the ion analysis device.Type: ApplicationFiled: January 12, 2015Publication date: September 17, 2015Inventors: Zheng Ouyang, Robert Graham Cooks, Sandilya Venkata Garimella, Jason David Harper, Nicholas Alan Charipar
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Patent number: 9064674Abstract: The present invention generally relates to a low temperature plasma probe for desorbing and ionizing at least one analyte in a sample material and methods of use thereof. In one embodiment, the invention generally relates to a low temperature plasma probe including: a housing having a discharge gas inlet port, a probe tip, two electrodes, and a dielectric barrier, in which the two electrodes are separated by the dielectric barrier, in which application of voltage from a power supply generates a low temperature plasma, and in which the low temperature plasma is propelled out of the discharge region by the electric field and/or the discharge gas flow.Type: GrantFiled: May 14, 2014Date of Patent: June 23, 2015Assignee: Purdue Research FoundationInventors: Zheng Ouyang, Jason David Harper, Nicholas Alan Charipar, Robert Graham Cooks
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Patent number: 8963079Abstract: The invention generally relates to systems and methods for transferring ions for analysis. In certain embodiments, the invention provides a system for analyzing a sample including an ionizing source for converting molecules of a sample into gas phase ions in a region at about atmospheric pressure, an ion analysis device, and an ion transfer member operably coupled to a gas flow generating device, in which the gas flow generating device produces a laminar gas flow that transfers the gas phase ions through the ion transfer member to an inlet of the ion analysis device.Type: GrantFiled: August 8, 2014Date of Patent: February 24, 2015Assignee: Purdue Research FoundationInventors: Zheng Ouyang, Robert Graham Cooks, Sandilya Venkata Garimella, Jason David Harper, Nicholas Alan Charipar
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Publication number: 20150014525Abstract: The invention generally relates to systems and methods for transferring ions for analysis. In certain embodiments, the invention provides a system for analyzing a sample including an ionizing source for converting molecules of a sample into gas phase ions in a region at about atmospheric pressure, an ion analysis device, and an ion transfer member operably coupled to a gas flow generating device, in which the gas flow generating device produces a laminar gas flow that transfers the gas phase ions through the ion transfer member to an inlet of the ion analysis device.Type: ApplicationFiled: August 8, 2014Publication date: January 15, 2015Inventors: Zheng Ouyang, Robert Graham Cooks, Sandilya Venkata Garimella, Jason David Harper, Nicholas Alan Charipar
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Publication number: 20140299764Abstract: The present invention generally relates to a low temperature plasma probe for desorbing and ionizing at least one analyte in a sample material and methods of use thereof. In one embodiment, the invention generally relates to a low temperature plasma probe including: a housing having a discharge gas inlet port, a probe tip, two electrodes, and a dielectric barrier, in which the two electrodes are separated by the dielectric barrier, in which application of voltage from a power supply generates a low temperature plasma, and in which the low temperature plasma is propelled out of the discharge region by the electric field and/or the discharge gas flow.Type: ApplicationFiled: May 14, 2014Publication date: October 9, 2014Applicant: Purdue Research FoundationInventors: Zheng Ouyang, Jason David Harper, Nicholas Alan Charipar, Robert Graham Cooks
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Patent number: 8803085Abstract: The invention generally relates to systems and methods for transferring ions for analysis. In certain embodiments, the invention provides a system for analyzing a sample including an ionizing source for converting molecules of a sample into gas phase ions in a region at about atmospheric pressure, an ion analysis device, and an ion transfer member operably coupled to a gas flow generating device, in which the gas flow generating device produces a laminar gas flow that transfers the gas phase ions through the ion transfer member to an inlet of the ion analysis device.Type: GrantFiled: February 14, 2014Date of Patent: August 12, 2014Assignee: Purdue Research FoundationInventors: Zheng Ouyang, Robert Graham Cooks, Sandilya Venkata Garimella, Jason David Harper, Nicholas Alan Charipar
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Publication number: 20140158882Abstract: The invention generally relates to systems and methods for transferring ions for analysis. In certain embodiments, the invention provides a system for analyzing a sample including an ionizing source for converting molecules of a sample into gas phase ions in a region at about atmospheric pressure, an ion analysis device, and an ion transfer member operably coupled to a gas flow generating device, in which the gas flow generating device produces a laminar gas flow that transfers the gas phase ions through the ion transfer member to an inlet of the ion analysis device.Type: ApplicationFiled: February 14, 2014Publication date: June 12, 2014Applicant: Purdue Research FoundationInventors: Zheng Ouyang, Robert Graham Cooks, Sandilya Venkata Garimella, Jason David Harper, Nicholas Alan Charipar
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Patent number: 8686351Abstract: The invention generally relates to systems and methods for transferring ions for analysis. In certain embodiments, the invention provides a system for analyzing a sample including an ionizing source for converting molecules of a sample into gas phase ions in a region at about atmospheric pressure, an ion analysis device, and an ion transfer member operably coupled to a gas flow generating device, in which the gas flow generating device produces a laminar gas flow that transfers the gas phase ions through the ion transfer member to an inlet of the ion analysis device.Type: GrantFiled: July 9, 2013Date of Patent: April 1, 2014Assignee: Purdue Research FoundationInventors: Zheng Ouyang, Robert Graham Cooks, Sandilya Venkata Garimella, Jason David Harper, Nicholas Alan Charipar
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Patent number: 8592756Abstract: The invention generally relates to systems and methods for transferring ions for analysis. In certain embodiments, the invention provides a system for analyzing a sample including an ionizing source for converting molecules of a sample into gas phase ions in a region at about atmospheric pressure, an ion analysis device, and an ion transfer member operably coupled to a gas flow generating device, in which the gas flow generating device produces a laminar gas flow that transfers the gas phase ions through the ion transfer member to an inlet of the ion analysis device.Type: GrantFiled: December 27, 2012Date of Patent: November 26, 2013Assignee: Purdue Research FoundationInventors: Zheng Ouyang, Robert Graham Cooks, Sandilya Venkata Garimella, Jason David Harper, Nicholas Alan Charipar
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Publication number: 20130292564Abstract: The invention generally relates to systems and methods for transferring ions for analysis. In certain embodiments, the invention provides a system for analyzing a sample including an ionizing source for converting molecules of a sample into gas phase ions in a region at about atmospheric pressure, an ion analysis device, and an ion transfer member operably coupled to a gas flow generating device, in which the gas flow generating device produces a laminar gas flow that transfers the gas phase ions through the ion transfer member to an inlet of the ion analysis device.Type: ApplicationFiled: July 9, 2013Publication date: November 7, 2013Inventors: Zheng Ouyang, Robert Graham Cooks, Sandilya Venkata Garimella, Jason David Harper, Nicholas Alan Charipar
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Publication number: 20130126723Abstract: The invention generally relates to systems and methods for transferring ions for analysis. In certain embodiments, the invention provides a system for analyzing a sample including an ionizing source for converting molecules of a sample into gas phase ions in a region at about atmospheric pressure, an ion analysis device, and an ion transfer member operably coupled to a gas flow generating device, in which the gas flow generating device produces a laminar gas flow that transfers the gas phase ions through the ion transfer member to an inlet of the ion analysis device.Type: ApplicationFiled: December 27, 2012Publication date: May 23, 2013Inventors: Zheng Ouyang, Robert Graham Cooks, Sandilya Venkata Garimella, Jason David Harper, Nicholas Alan Charipar
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Patent number: 8410431Abstract: The invention generally relates to systems and methods for transferring ions for analysis. In certain embodiments, the invention provides a system for analyzing a sample including an ionizing source for converting molecules of a sample into gas phase ions in a region at about atmospheric pressure, an ion analysis device, and an ion transfer member operably coupled to a gas flow generating device, in which the gas flow generating device produces a laminar gas flow that transfers the gas phase ions through the ion transfer member to an inlet of the ion analysis device.Type: GrantFiled: October 5, 2009Date of Patent: April 2, 2013Assignee: Purdue Research FoundationInventors: Zheng Ouyang, Robert Graham Cooks, Sandilya Venkata Garimella, Jason David Harper, Nicholas Alan Charipar
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Publication number: 20110240844Abstract: The invention generally relates to systems and methods for transferring ions for analysis. In certain embodiments, the invention provides a system for analyzing a sample including an ionizing source for converting molecules of a sample into gas phase ions in a region at about atmospheric pressure, an ion analysis device, and an ion transfer member operably coupled to a gas flow generating device, in which the gas flow generating device produces a laminar gas flow that transfers the gas phase ions through the ion transfer member to an inlet of the ion analysis device.Type: ApplicationFiled: October 5, 2009Publication date: October 6, 2011Applicant: PURDUE RESEARCH FOUNDATIONInventors: Zheng Ouyang, Robert Graham Cooks, Sandilya Venkata Garimella, Jason David Harper, Nicholas Alan Charipar