Abstract: A programmable time event and waveform generator for the application of precise timing patterns to a logic circuit and the capture of response data from the logic circuit. The time event and waveform generator comprises a programmable delay element that is programmed with values stored in pattern memory. For scan based testing, the time event and waveform generator is programmed between test pattern scan sequences by serial loading from the test pattern memory. The generator may be used to generate precise signal transitions to input pins of a circuit under test, and to capture at precise times the signal states from the output pins of a circuit under test. The data for programming the delay element is accessed from test pattern memory.

Abstract: A programmable time event and waveform generator for the application of precise timing patterns to a logic circuit and the capture of response data from the logic circuit. The time event and waveform generator comprises a programmable delay element that is programmed with values stored in pattern memory. For scan based testing, the time event and waveform generator is programmed between test pattern scan sequences by serial loading from the test pattern memory. The generator may be used to generate precise signal transitions to input pins of a circuit under test, and to capture at precise times the signal states from the output pins of a circuit under test. The data for programming the delay element is accessed from test pattern memory.

Abstract: A programmable time event and waveform generator for the application of precise timing patterns to a logic circuit and the capture of response data from the logic circuit. The time event and waveform generator comprises a programmable delay element that is programmed with values stored in pattern memory. For scan based testing, the time event and waveform generator is programmed between test pattern scan sequences by serial loading from the test pattern memory. The generator may be used to generate precise signal transitions to input pins of a circuit under test, and to capture at precise times the signal states from the output pins of a circuit under test. The data for programming the delay element is accessed from test pattern memory.

Abstract: A method and implementation for providing an improved testable design for an integrated circuit (IC) device. The integrated circuit includes a functional path for the implementation of a functional specification as well as a testing path for testing the timing specifications for the integrated circuit. Input switching devices are connected between input terminals of the IC and inputs to sequential circuit elements, for example flip-flop devices, in the IC. Similarly, output switching devices are connected between outputs of the flip-flop devices and output terminals of the IC. The switching devices are selectively operable to alternately connect the flip-flop devices into either a functional IC path for providing functional output signals during functional cycles, or into a testing IC path for providing testing output signals indicative of timing points throughout the IC during testing cycles. The IC is also operable to selectively disable tristate bus drivers during the testing cycles.