Abstract: A system and method for triggering data acquisition in a semiconductor laser system including outputting electromagnetic energy from the semiconductor laser over a range of wavelengths according to a signaling path. The signaling path includes a plurality of discrete data inputs to the semiconductor laser for outputting electromagnetic energy over a range of wavelengths and the signaling path includes one or more perturbances in transitioning from one wavelength to another wavelength along the signaling path. A series of triggering signals are generated for input to a measurement system by the semiconductor laser. The series of triggering signals include a non-uniform period between at least a first triggering signal and an adjacent second triggering signal, and the non-uniform period corresponds to at least one perturbance. The electromagnetic energy output from the semiconductor laser is detected based on the series of triggering signals.

Abstract: A system and method for triggering data acquisition in a semiconductor laser system including outputting electromagnetic energy from the semiconductor laser over a range of wavelengths according to a signaling path. The signaling path includes a plurality of discrete data inputs to the semiconductor laser for outputting electromagnetic energy over a range of wavelengths and the signaling path includes one or more perturbances in transitioning from one wavelength to another wavelength along the signaling path. A series of triggering signals are generated for input to a measurement system by the semiconductor laser. The electromagnetic energy output from the semiconductor laser is detected based on the series of triggering signals. The detected electromagnetic energy is compared with a valid data vector, wherein the valid data vector includes one or more criteria and/or values that is used to differentiate valid data from invalid data corresponding to the detected electromagnetic energy.

Abstract: Embodiments of systems and methods are provided for a tunable laser device. The tunable laser device may include a diffraction grating connected to a pivot arm that pivots the diffraction grating about a pivot point to tune the laser device. In pivoting the diffraction grating about the pivot point, both the wavelength to which the diffraction grating is tuned and the length of the optical cavity may be changed. The length of the pivot arm may be selected to reduce the number of mode hops of the tunable laser device when tuning the laser device over its tuning range.

Abstract: A system and method for correcting non-linearities in the output of a tunable laser over a sweep range. Electromagnetic radiation is directed over a range of wavelengths to a measurement system from the tunable laser source, wherein the measurement system collects data over the range of wavelengths. The electromagnetic radiation emitted over the range of wavelengths is monitored. A non-linearity in one or more wavelengths over the range of wavelengths is determined. A signal is transmitted to the measurement system to cease collecting data when the one or more wavelengths having the non-linearity is output from the tunable laser source or the data is ignored.

Abstract: A system and method for adjusting the coherence length of a tunable laser to optimize measurements and reduce artifacts. A tuning element of the laser system modulates, adjusts, or controls parameters associate with the tunable laser, such that the output wavelength of the tunable laser is modulated or adjusted over a wavelength range within a time interval. Modulation of the parameter has the effect of increasing a linewidth of the tunable laser.

Abstract: A system and method to determine data sets of front mirror current, back mirror current and phase current that change the wavelength output by a semiconductor laser in a prescribed trajectory versus time, while maintaining the maximum side-mode suppression ratio at each point during the sweep.

Abstract: A method for sweeping an electromagnetic radiation source (12) to produce single mode operation having an optimized side-mode suppression ratio over a continuous range of wavelengths within a prescribed temporal profile, the electromagnetic radiation source is configured to output electromagnetic radiation at a given wavelength based upon parameters. The method includes determining a set of parameter combinations that satisfy a condition for a desired set of wavelengths and a maximum side mode suppression ratio over the range of wavelengths. The set of parameter combinations define sub-paths for transitioning from one wavelength to another wavelength. Combinations of select sub-paths provide a multivariate path for transitioning over the range of wavelengths. The method also includes controlling the semiconductor laser to emit electromagnetic radiation over the range of wavelengths by traversing the multivariate path in a desired manner.

Abstract: A system and method for measuring an interferometric signal from a swept-wavelength interferometer by scanning a tunable laser source over two wavelength ranges, whose centers are separated substantially more than the length of wavelength ranges. The spatial resolution of the measurement is determined by the inverse of the wavelength separation between a first and second wavelength region, as well as by the wavelength range of the first and second regions. An electronically tunable laser may be utilized to produce two wavelength ranges that are widely separated in wavelength. Such a system and method has wide applications to the fields of optical frequency domain reflectometry (OFDR) and swept-wavelength optical coherence tomography (OCT), for example.

Abstract: A system (10, 20) and method including a wavelength tuning mechanism and a laser path length tuning mechanism for reducing discontinuities in a sweep range. A processor (14) is coupled to a wavelength monitoring device (18) and the tuning mechanisms. The processor analyzes data from the wavelength monitor to adjust the wavelength tuning and cavity length tuning at discontinuities in the wavelength sweep to reduce the discontinuities.

Abstract: A system and method for passive combination of two or more laser sources (e.g., sampled grating distributed Bragg reflector (SG-DBR) lasers) into a single sweep that encompasses the combined range of the wavelengths of each laser source.

Abstract: A system and method for passive combination of two or more laser sources (e.g., sampled grating distributed Bragg reflector (SG-DBR) lasers) into a single sweep that encompasses the combined range of the wavelengths of each laser source.

Abstract: A system and method for adjusting the coherence length of a tunable laser to optimize measurements and reduce artifacts. A tuning element of the laser system modulates, adjusts, or controls parameters associate with the tunable laser, such that the output wavelength of the tunable laser is modulated or adjusted over a wavelength range within a time interval. Modulation of the parameter has the effect of increasing a linewidth of the tunable laser.

Abstract: A system and method for sweeping electromagnetic radiation over a first coherence length and a second length over a range of wavelengths to generate an image. Electromagnetic radiation having a first coherence length is generated and swept over a range of wavelengths. Electromagnetic radiation having a second coherence length is generated and swept over a range of wavelengths. The electromagnetic radiation is splitting through a reference path and a sample path; Electromagnetic radiation returned from the reference path and the sample path is detected, wherein the detector generates output signals corresponding to the received electromagnetic radiation. In one embodiment, the output signals are processed to generate an image. The image may be interleaved with data corresponding to the electromagnetic radiation having the first coherence length and the second coherence length.

Abstract: A system and method for correcting non-linearities in the output of a tunable laser over a sweep range. Electromagnetic radiation is directed over a range of wavelengths to a measurement system from the tunable laser source, wherein the measurement system collects data over the range of wavelengths. The electromagnetic radiation emitted over the range of wavelengths is monitored. A non-linearity in one or more wavelengths over the range of wavelengths is determined. A signal is transmitted to the measurement system to cease collecting data when the one or more wavelengths having the non-linearity is output from the tunable laser source or the data is ignored.

Abstract: A system and method for measuring an interferometric signal from a swept-wavelength interferometer by scanning a tunable laser source over two wavelength ranges, whose centers are separated substantially more than the length of wavelength ranges. The spatial resolution of the measurement is determined by the inverse of the wavelength separation between a first and second wavelength region, as well as by the wavelength range of the first and second regions. An electronically tunable laser may be utilized to produce two wavelength ranges that are widely separated in wavelength. Such a system and method has wide applications to the fields of optical frequency domain reflectometry (OFDR) and swept-wavelength optical coherence tomography (OCT), for example.

Abstract: Embodiments of systems and methods are provided for a tunable laser device. The tunable laser device may include a diffraction grating connected to a pivot arm that pivots the diffraction grating about a pivot point to tune the laser device. In pivoting the diffraction grating about the pivot point, both the wavelength to which the diffraction grating is tuned and the length of the optical cavity may be changed. The length of the pivot arm may be selected to reduce the number of mode hops of the tunable laser device when tuning the laser device over its tuning range.