Patents by Inventor Jason Graalum
Jason Graalum has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Publication number: 20050201135Abstract: Circuitry for programming antifuse elements is provided which permits all antifuse elements in a bank to be programmed simultaneously, thereby enhancing the speed at which antifuse elements may be programmed. In one embodiment, a feedback circuit is associated with each antifuse element to stop the flow of current through the antifuse element once it is programmed. In another embodiment, circuitry is provided for generating a separate programming pulse for each antifuse element, which is selected for programming.Type: ApplicationFiled: April 28, 2005Publication date: September 15, 2005Inventors: Patrick Mullarkey, Casey Kurth, Jason Graalum, Daryl Habersetzer
-
Patent number: 6903991Abstract: Circuitry for programming antifuse elements is provided which permits all antifuse elements in a bank to be programmed simultaneously, thereby enhancing the speed at which antifuse elements may be programmed. In one embodiment, a feedback circuit is associated with each antifuse element to stop the flow of current through the antifuse element once it is programmed. In another embodiment, circuitry is provided for generating a separate programming pulse for each antifuse element, which is selected for programming.Type: GrantFiled: June 24, 2002Date of Patent: June 7, 2005Assignee: Micron Technology, Inc.Inventors: Patrick J. Mullarkey, Casey R. Kurth, Jason Graalum, Daryl L. Habersetzer
-
Patent number: 6826071Abstract: A method of verifying whether unprogrammed antifuses are leaky in a semiconductor memory. The method involves the steps of: connecting the antifuse in series with a node; providing current to the node, the current being sufficient to charge the node from a first to a second voltage; detecting whether the voltage at the node charges to the second voltage, or remains at the first voltage to indicate that the antifuse is leaky; outputting signals indicating the result of the detection; and detecting the voltage at the node remains at the first voltage indicates that the antifuse is leaky. In another embodiment, a method of verifying whether antifuses have been programmed properly in a semiconductor memory.Type: GrantFiled: March 15, 2002Date of Patent: November 30, 2004Assignee: Micron Technology, Inc.Inventors: Patrick J. Mullarkey, Casey R. Kurth, Jason Graalum, Daryl L. Habersetzer
-
Publication number: 20040223397Abstract: A method of verifying whether unprogrammed antifuses are leaky in a semiconductor memory. The method involves the steps of: connecting the antifuse in series with a node; providing current to the node, the current being sufficient to charge the node from a first to a second voltage; detecting whether the voltage at the node charges to the second voltage, or remains at the first voltage to indicate that the antifuse is leaky; outputting signals indicating the result of the detection; and detecting the voltage at the node remains at the first voltage indicates that the antifuse is leaky. In another embodiment, a method of verifying whether antifuses have been programmed properly in a semiconductor memory.Type: ApplicationFiled: March 15, 2002Publication date: November 11, 2004Applicant: MICRON TECHNOLOGY, INC.Inventors: Patick J. Mullarkey, Casey R. Kurth, Jason Graalum, Daryl L. Habersetzer
-
Patent number: 6661693Abstract: Circuitry for programming antifuse elements is provided which permits all antifuse elements in a bank to be programmed simultaneously, thereby enhancing the speed at which antifuse elements may be programmed. In one embodiment, a feedback circuit is associated with each antifuse element to stop the flow of current through the antifuse element once it is programmed. In another embodiment, circuitry is provided for generating a separate programming pulse for each antifuse element, which is selected for programming.Type: GrantFiled: June 24, 2002Date of Patent: December 9, 2003Assignee: Micron TechnologyInventors: Patrick J. Mullarkey, Casey R. Kurth, Jason Graalum, Daryl L. Habersetzer
-
Publication number: 20030185080Abstract: A method of verifying whether unprogrammed antifuses are leaky in a semiconductor memory. The method involves the steps of: connecting the antifuse in series with a node; providing current to the node, the current being sufficient to charge the node from a first to a second voltage; detecting whether the voltage at the node charges to the second voltage, or remains at the first voltage to indicate that the antifuse is leaky; outputting signals indicating the result of the detection; and detecting the voltage at the node remains at the first voltage indicates that the antifuse is leaky. In another embodiment, a method of verifying whether antifuses have been programmed properly in a semiconductor memory.Type: ApplicationFiled: March 15, 2002Publication date: October 2, 2003Applicant: MICRON TECHNOLOGY, INC.Inventors: Patick J. Mullarkey, Casey R. Kurth, Jason Graalum, Daryl L. Habersetzer
-
Publication number: 20020167831Abstract: Circuitry for programming antifuse elements is provided which permits all antifuse elements in a bank to be programmed simultaneously, thereby enhancing the speed at which antifuse elements may be programmed. In one embodiment, a feedback circuit is associated with each antifuse element to stop the flow of current through the antifuse element once it is programmed. In another embodiment, circuitry is provided for generating a separate programming pulse for each antifuse element, which is selected for programming.Type: ApplicationFiled: June 24, 2002Publication date: November 14, 2002Applicant: MICRON TECHNOLOGY, INC.Inventors: Patrick J. Mullarkey, Casey R. Kurth, Jason Graalum, Daryl L. Habersetzer
-
Publication number: 20020163827Abstract: Circuitry for programming antifuse elements is provided which permits all antifuse elements in a bank to be programmed simultaneously, thereby enhancing the speed at which antifuse elements may be programmed. In one embodiment, a feedback circuit is associated with each antifuse element to stop the flow of current through the antifuse element once it is programmed. In another embodiment, circuitry is provided for generating a separate programming pulse for each antifuse element, which is selected for programming.Type: ApplicationFiled: June 24, 2002Publication date: November 7, 2002Applicant: MICRON TECHNOLOGY, INC.Inventors: Patrick J. Mullarkey, Casey R. Kurth, Jason Graalum, Daryl L. Habersetzer
-
Patent number: 6445605Abstract: A method of verifying whether unprogrammed antifuses are leaky in a semiconductor memory. The method involves the steps of: connecting the antifuse in series with a node; providing current to the node, the current being sufficient to charge the node from a first to a second voltage; detecting whether the voltage at the node charges to the second voltage, or remains at the first voltage to indicate that the antifuse is leaky; outputting signals indicating the result of the detection; and detecting the voltage at the node remains at the first voltage indicates that the antifuse is leaky. In another embodiment, a method of verifying whether antifuses have been programmed properly in a semiconductor memory.Type: GrantFiled: August 10, 2000Date of Patent: September 3, 2002Assignee: Micron Technology, Inc.Inventors: Patrick J. Mullarkey, Casey R. Kurth, Jason Graalum, Daryl L. Habersetzer
-
Patent number: 6130834Abstract: Circuitry for programming antifuse elements is provided which permits all antifuse elements in a bank to be programmed simultaneously, thereby enhancing the speed at which antifuse elements may be programmed. In one embodiment, a feedback circuit is associated with each antifuse element to stop the flow of current through the antifuse element once it is programmed. In another embodiment, circuitry is provided for generating a separate programming pulse for each antifuse element, which is selected for programming.Type: GrantFiled: March 23, 1999Date of Patent: October 10, 2000Assignee: Micron Technology, Inc.Inventors: Patrick J. Mullarkey, Casey R. Kurth, Jason Graalum, Daryl L. Habersetzer
-
Patent number: 6055173Abstract: A method of verifying whether unprogrammed antifuses are leaky in a semiconductor memory. The method involves the steps of: connecting the antifuse in series with a node; providing current to the node, the current being sufficient to charge the node from a first to a second voltage; detecting whether the voltage at the node charges to the second voltage, or remains at the first voltage to indicate that the antifuse is leaky; outputting signals indicating the result of the detection; and detecting the voltage at the node remains at the first voltage indicates that the antifuse is leaky. In another embodiment, a method of verfying whether antifuses have been programmed properly in a semiconductor memory.Type: GrantFiled: July 11, 1997Date of Patent: April 25, 2000Assignee: Micron Technology, Inc.Inventors: Patrick J. Mullarkey, Casey R. Kurth, Jason Graalum, Daryl L. Habersetzer
-
Patent number: 5689455Abstract: Circuitry for programming antifuse elements is provided which permits all antifuse elements in a bank to be programmed simultaneously, thereby enhancing the speed at which antifuse elements may be programmed. In one embodiment, a feedback circuit is associated with each antifuse element to stop the flow of current through the antifuse element once it is programmed. In another embodiment, circuitry is provided for generating a separate programming pulse for each antifuse element, which is selected for programming.Type: GrantFiled: August 31, 1995Date of Patent: November 18, 1997Assignee: Micron Technology, Inc.Inventors: Patrick J. Mullarkey, Casey R. Kurth, Jason Graalum, Daryl L. Habersetzer