Abstract: A method for detecting nets physically changed and electrically affected by a design ECO includes steps as follows. An ECO is executed on an IC design to produce a post-ECO IC design. A first group of nets of the IC design physically changed by the ECO is identified by comparing a pre-ECO database with a post-ECO database. A pre-ECO design SPEF file of the IC design is parsed with a script to identify a second group of nets in the pre-ECO database based on the first group of nets, the second group of nets being coupled to the first group of nets. The second group of nets is pre-ECO electrically affected nets. Parasitics for the first group of nets in the post-ECO database are extracted to generate a parasitic data file for the first group of nets. The parasitic data file is parsed with the script to identify a third group of nets in the post-ECO database based on the first group of nets, the third group of nets being coupled to the first group of nets.

Abstract: A method of implementing an engineering change order includes steps of: (a) receiving as input an integrated circuit design; (b) receiving as input an engineering change order to the integrated circuit design; (c) creating at least one window in the integrated circuit design that encloses a change to the integrated circuit design introduced by the engineering change order wherein the window is bounded by coordinates that define an area that is less than an entire area of the integrated circuit design; (d) performing a routing of the integrated circuit design that excludes routing of any net that is not enclosed by the window; (e) replacing an area in a copy of the integrated circuit design that is bounded by the coordinates of the window with results of the incremental routing to generate a revised integrated circuit design; and (f) generating as output the revised integrated circuit design.

Abstract: A method for detecting nets physically changed and electrically affected by a design ECO includes steps as follows. An ECO is executed on an IC design to produce a post-ECO IC design. A first group of nets of the IC design physically changed by the ECO is identified by comparing a pre-ECO database with a post-ECO database. A pre-ECO design SPEF file of the IC design is parsed with a script to identify a second group of nets in the pre-ECO database based on the first group of nets, the second group of nets being coupled to the first group of nets. The second group of nets is pre-ECO electrically affected nets. Parasitics for the first group of nets in the post-ECO database are extracted to generate a parasitic data file for the first group of nets. The parasitic data file is parsed with the script to identify a third group of nets in the post-ECO database based on the first group of nets, the third group of nets being coupled to the first group of nets.

Abstract: A long channel transistor and a shorter channel transistor operate in conjunction to drive an output node. The long channel device is first activated by a drive signal and the drive signal is input to a delay element that then activates the shorter channel device. By enabling the long channel device first, hot carrier injection effects are reduced. Employing two transistors that are sized to operate in different voltage ranges reduces surge current. The two-transistor configuration of the present invention occupies less area than a single long channel device with similar drive capabilities.

Abstract: A long channel transistor and a shorter channel transistor operate in conjunction to drive an output node. The long channel device is first activated by a drive signal and the drive signal is input to a delay element that then activates the shorter channel device. By enabling the long channel device first, hot carrier injection effects are reduced. Employing two transistors that are sized to operate in different voltage ranges reduces surge current. The two-transistor configuration of the present invention occupies less area than a single long channel device with similar drive capabilities.