Patents by Inventor Jason Osborne

Jason Osborne has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240070186
    Abstract: Playback and distribution systems and methods for multimedia files are provided. The multimedia files are encoded with flags associated with the content data of the multimedia files. Through the use of the flags, playback of the content is enhanced without significantly increasing the file size of the multimedia file.
    Type: Application
    Filed: November 6, 2023
    Publication date: February 29, 2024
    Applicant: DIVX, LLC
    Inventors: Kourosh Soroushian, Shaiwal Priyadarshi, Jason Braness, Roland Osborne, William Frantz, Jerome Vashisht-Rota, Daniel Salmonsen, John Funnell, Michael Floyd
  • Patent number: 11796565
    Abstract: A method of operating an atomic force microscope (AFM), using a denoising algorithm, real-time, during AFM data acquisition. Total Variation and Non-Local Means denoising are preferred. Real time images with minimized sensor noise needing no post-image acquisition processing to account for noise as described herein results.
    Type: Grant
    Filed: April 9, 2021
    Date of Patent: October 24, 2023
    Assignee: Bruker Nano, Inc.
    Inventors: Vladimir Fonoberov, James Young, Jason Osborne, Sean Hand
  • Patent number: 11714104
    Abstract: An atomic force microscope (AFM) and method of operating the same includes a separate Z height sensor to measure, simultaneously with AFM system control, probe sample distance, pixel-by-pixel during AFM data acquisition. By mapping the AFM data to low resolution data of the Z height data, a high resolution final data image corrected for creep is generated in real time.
    Type: Grant
    Filed: May 25, 2021
    Date of Patent: August 1, 2023
    Assignee: Bruker Nano, Inc.
    Inventors: Jason Osborne, Sean Hand, Vladimir Fonoberov, James Young
  • Patent number: 11668730
    Abstract: An apparatus and method of operating an atomic force profiler (AFP), such as an AFM, using a feedforward control signal in subsequent scan lines of a large area sample to achieve large throughput advantages in, for example, automated applications.
    Type: Grant
    Filed: April 6, 2021
    Date of Patent: June 6, 2023
    Assignee: Bruker Nano, Inc.
    Inventors: Jason Osborne, Vladimir Fonoberov, Sean Michael Hand
  • Patent number: 11604210
    Abstract: A system and method of operating an atomic force microscope (AFM) that includes providing relative scanning motion between a probe of the AFM and a sample in a slow scan direction of a data scan to generate a reference image (plane) of a region of interest. Then, relative scanning motion between the probe and the sample is provided in a fast scan direction of a final data scan to generate a data image. By mapping the data image against the reference image in real-time during the supplying step, the preferred embodiments generate a final drift corrected data image without post-image acquisition processing.
    Type: Grant
    Filed: July 8, 2021
    Date of Patent: March 14, 2023
    Assignee: Bruker Nano, Inc.
    Inventors: Vladimir Fonoberov, Jason Osborne, Sean Hand
  • Publication number: 20230009857
    Abstract: A system and method of operating an atomic force microscope (AFM) that includes providing relative scanning motion between a probe of the AFM and a sample in a slow scan direction of a data scan to generate a reference image (plane) of a region of interest. Then, relative scanning motion between the probe and the sample is provided in a fast scan direction of a final data scan to generate a data image. By mapping the data image against the reference image in real-time during the supplying step, the preferred embodiments generate a final drift corrected data image without post-image acquisition processing.
    Type: Application
    Filed: July 8, 2021
    Publication date: January 12, 2023
    Inventors: Vladimir Fonoberov, Jason Osborne, Sean Hand
  • Publication number: 20220381803
    Abstract: An atomic force microscope (AFM) and method of operating the same includes a separate Z height sensor to measure, simultaneously with AFM system control, probe sample distance, pixel-by-pixel during AFM data acquisition. By mapping the AFM data to low resolution data of the Z height data, a high resolution final data image corrected for creep is generated in real time.
    Type: Application
    Filed: May 25, 2021
    Publication date: December 1, 2022
    Inventors: Jason Osborne, Sean Hand, Vladimir Fonoberov, James Young
  • Publication number: 20220326277
    Abstract: A method of operating an atomic force microscope (AFM), using a denoising algorithm, real-time, during AFM data acquisition. Total Variation and Non-Local Means denoising are preferred. Real time images with minimized sensor noise needing no post-image acquisition processing to account for noise as described herein results.
    Type: Application
    Filed: April 9, 2021
    Publication date: October 13, 2022
    Inventors: Vladimir Fonoberov, James Young, Jason Osborne, Sean Hand
  • Publication number: 20210396784
    Abstract: A mechanical method of removing nanoscale debris from a sample surface using an atomic force microscope (AFM) probe. The probe is shaped to include an edge that provides shovel-type action on the debris as the probe is moved laterally to the sample surface. Advantageously, the probe is able to lift the debris without damaging the debris for more efficient cleaning of the surface. The edge is preferably made by focused ion beam (FIB) milling the diamond apex of the tip.
    Type: Application
    Filed: June 18, 2021
    Publication date: December 23, 2021
    Inventors: Weijie Wang, Shuiqing Hu, Jason Osborne, Chanmin Su
  • Publication number: 20210341513
    Abstract: An apparatus and method of operating an atomic force profiler (AFP), such as an AFM, using a feedforward control signal in subsequent scan lines of a large area sample to achieve large throughput advantages in, for example, automated applications.
    Type: Application
    Filed: April 6, 2021
    Publication date: November 4, 2021
    Inventors: Jason OSBORNE, Vladimir FONOBEROV, Sean Michael HAND
  • Patent number: 10969406
    Abstract: An apparatus and method of operating an atomic force profiler (AFP), such as an AFM, using a feedforward control signal in subsequent scan lines of a large area sample to achieve large throughput advantages in, for example, automated applications.
    Type: Grant
    Filed: August 12, 2019
    Date of Patent: April 6, 2021
    Assignee: Bruker Nano, Inc.
    Inventors: Jason Osborne, Vladimir Fonoberov, Sean Michael Hand
  • Publication number: 20200049734
    Abstract: An apparatus and method of operating an atomic force profiler (AFP), such as an AFM, using a feedforward control signal in subsequent scan lines of a large area sample to achieve large throughput advantages in, for example, automated applications.
    Type: Application
    Filed: August 12, 2019
    Publication date: February 13, 2020
    Inventors: Jason Osborne, Vladimir Fonoberov, Sean Michael Hand
  • Patent number: 9995763
    Abstract: A scanning probe microscope (SPM) system and associated method. The SPM system having a probe adapted to interact with nanoscale features of a sample and scan within a target region to produce a three-dimensional image of that target region, the system maintaining location information for a plurality of features of interest of the sample according to a sample-specific coordinate system, wherein the SPM system is configured to adjust positioning of the probe relative to the sample according to a SPM coordinate system, the SPM system further configured to manage a dynamic relationship between the sample-specific coordinate system and the SPM coordinate system by determining a set of alignment errors between the sample-specific coordinate system and the SPM coordinate system and apply corrections to the SPM coordinate system to offset the determined alignment errors.
    Type: Grant
    Filed: February 24, 2015
    Date of Patent: June 12, 2018
    Assignee: Bruker Nano, Inc.
    Inventors: Jason Osborne, Eric Milligan, Andrew Lopez, Xianghai Wu, Sean Hand, Vladimir Fonoberov
  • Publication number: 20150241469
    Abstract: A scanning probe microscope (SPM) system and associated method. The SPM system having a probe adapted to interact with nanoscale features of a sample and scan within a target region to produce a three-dimensional image of that target region, the system maintaining location information for a plurality of features of interest of the sample according to a sample-specific coordinate system, wherein the SPM system is configured to adjust positioning of the probe relative to the sample according to a SPM coordinate system, the SPM system further configured to manage a dynamic relationship between the sample-specific coordinate system and the SPM coordinate system by determining a set of alignment errors between the sample-specific coordinate system and the SPM coordinate system and apply corrections to the SPM coordinate system to offset the determined alignment errors.
    Type: Application
    Filed: February 24, 2015
    Publication date: August 27, 2015
    Inventors: Jason Osborne, Eric Milligan, Andrew Lopez, Robert Wu, Sean Hand, Vladimir Fonoberov
  • Publication number: 20150067107
    Abstract: An occurrence of a particular event related to a local radio access network may be detected. The local radio access network may be configured to provide wireless service to WCDs. Possibly in response to the occurrence of the particular event, a local content server device or a remote content server device may be selected. At least some transactions involving a particular WCD served by the local radio access network may be routed between the particular WCD and the selected content server device. The local content server device may contain at least some content that is also contained by the remote content server device.
    Type: Application
    Filed: August 30, 2013
    Publication date: March 5, 2015
    Applicant: EXTENET SYSTEMS, INC.
    Inventors: Tormod Larsen, Eric Abbott, Eric Lekacz, Martin Jensen, Jason Osborne, Nimish Adhvaryu
  • Patent number: 7848613
    Abstract: Systems and methods for managing time-shift buffering in a digital media recording device are disclosed. One embodiment of a method comprises receiving media content through at least a first tuner of the digital media recording device, the media content comprising at least a first instance of media content received consecutive to a second instance of media content. The method further includes directing the first instance of media content into a first time-shift buffer, the first instance of the media content received through the first tuner of the digital media recording device. After directing the first instance of the media content into the first time-shift buffer, the second instance of media content is directed into one of the first time-shift buffer and a second time-shift buffer while continuing to direct media content received through the first tuner of the digital media recording device into the first time-shift buffer for at least a predetermined duration of time.
    Type: Grant
    Filed: June 29, 2006
    Date of Patent: December 7, 2010
    Inventor: Jason Osborne
  • Publication number: 20080002938
    Abstract: Systems and methods for managing time-shift buffering in a digital media recording device are disclosed. One embodiment of a method comprises receiving media content through at least a first tuner of the digital media recording device, the media content comprising at least a first instance of media content received consecutive to a second instance of media content. The method further includes directing the first instance of media content into a first time-shift buffer, the first instance of the media content received through the first tuner of the digital media recording device. After directing the first instance of the media content into the first time-shift buffer, the second instance of media content is directed into one of the first time-shift buffer and a second time-shift buffer while continuing to direct media content received through the first tuner of the digital media recording device into the first time-shift buffer for at least a predetermined duration of time.
    Type: Application
    Filed: June 29, 2006
    Publication date: January 3, 2008
    Applicant: SCIENTIFIC-ATLANTA, INC.
    Inventor: Jason Osborne
  • Publication number: 20070075243
    Abstract: The preferred embodiments are directed to a method and apparatus of operating a scanning probe microscope (SPM) to perform sample measurements using a survey scan that is less than five lines, and more preferably two lines, to accurately locate a field of features of a sample. This is accomplished by selecting a step distance between adjacent lines of the survey scan that does not equal the pitch of the features in a direction orthogonal to the direction the survey scan traverses, i.e., does not equal the pitch of the features in the scan direction, XPO. The aspect ratio of the scans can also be modified to further improve sample throughput.
    Type: Application
    Filed: September 30, 2005
    Publication date: April 5, 2007
    Inventors: David Kneeburg, Rohit Jain, Jason Osborne, Wei Yao, Matthew Klonowski, Ingo Schmitz
  • Publication number: 20060230474
    Abstract: A method and apparatus of engaging a probe with a sample surface including automatically reducing the spacing between a probe of a probe based instrument and a sample from an initial separation to one in which the probe is positioned for obtaining a sample surface measurement in less than ten seconds without damaging either the probe or the sample. The method includes oscillating the probe, measuring at least one parameter of probe oscillation and then engaging the probe and the sample by generally continuously controlling the reducing step based on the measuring step to reduce the separation from an initial separation to an engage position. In addition to feeding back directly on the tip-sample interaction, a direct communication line is provided between the processor used to generate control signals that govern the engage and a conventional motion controller.
    Type: Application
    Filed: May 19, 2005
    Publication date: October 12, 2006
    Inventors: Paul Mininni, Jason Osborne, James Young, Charles Meyer
  • Publication number: 20050111633
    Abstract: A method and system for allowing voice enabled information retrieval. A voice enabled information retrieval system inputs voice data that represents an information request from a user. The voice data travels to the voice enabled information retrieval system either via a PSTN or a wireless network. The voice enabled information retrieval system then performs speech recognition on the voice data, determines the search criteria (e.g., keywords) based on the speech recognition, searches a data network for appropriate contents based on the search criteria, extracts the contents most relevant to the search criteria and forwards the extracted contents to the user. These extracted contents are displayed to the user on a television via a set-top box in response to his or her requested information.
    Type: Application
    Filed: November 25, 2003
    Publication date: May 26, 2005
    Inventor: Jason Osborne