Abstract: A method, system and computer program product for analyzing and modifying a static timing slack of a timing path in a static timing analysis of a design of an integrated circuit (IC) with a transient power supply are disclosed. A static timing slack analysis is performed at a selected endpoint in an IC to obtain a candidate timing path leading to the endpoint with a worst static timing slack. A transient static timing slack is determined for the candidate timing path for each clock cycle of a clock signal under the transient power supply. The determined transient static timing slack is used to adjust the timing of the IC and to modify the static timing slack of the candidate timing path.

Abstract: A method and apparatus for transmitting data between cores residing in an integrated circuit. Data is transmitted by using hubs located between the cores and an arbiter. The arbiter maintains a table that contains all the valid combinations of routing paths between the cores.

Abstract: A method and circuit for dynamically changing the frequency of clock signals. The method including: detecting an edge of a first clock signal operating at a first frequency using a second clock signal operating at a second frequency; detecting an edge of the second clock signal using the first clock signal; detecting coincident edges of the first and the second clock signals; and changing the second frequency to a third frequency different from the second frequency upon detection of the coincident edges.

Abstract: A method and apparatus for providing communication between various cores located in an integrated circuit. The method and apparatus uses Hubs/Routers to facilitate and manage communication of data from/between the cores according to a specified methodology.

Abstract: A match line circuit in a content addressable memory (CAM) has a match line coupled to a first pull-up device and a first pull-down device at a match node. The first pull-up device has selectively adjustable pull-up impedances associated with it. The match line circuit also includes a second pull-up device coupled to a second pull-down device at a float node, and an enabling signal for activating the match line circuit during a memory comparison operation. The enabling signal precharges the match node to a logic low level and the float node to a logic high level in between memory comparison operations.

Abstract: A method for determining a desired operating impedance for a computer memory circuit is disclosed, the computer memory circuit having a plurality of discrete, selectively adjustable impedance values associated therewith. In an exemplary embodiment of the invention, the method includes applying, to a reference circuit, a test impedance value to a reference circuit. The test impedance value is controlled by a binary count. A determination is made, based upon the applied test impedance value, whether the reference circuit is in either a first state or a second state. The binary count is incremented if the reference circuit is in the first state and decremented if the reference circuit is in the second state. A condition is determined in which the reference circuit oscillates between the first state and said second state, and a pair of binary count values is stored. The desired operating impedance for the computer memory circuit corresponds to the lower of the stored pair of binary count values.

Abstract: A method for determining a desired operating impedance for a computer memory circuit includes applying, to a reference circuit, a test impedance value to a reference circuit. The test impedance value is controlled by a binary count. A determination is made, based upon the applied test impedance value, whether the reference circuit is in either a first state or a second state. The binary count is incremented if the reference circuit is in the first state and decremented if the reference circuit is in the second state. A condition is determined in which the reference circuit oscillates between the first state and said second state, and a pair of binary count values is stored. The desired operating impedance for the computer memory circuit corresponds to the lower of the stored pair of binary count values.

Abstract: A method for determining a desired operating impedance for a computer memory circuit is disclosed, the computer memory circuit having a plurality of discrete, selectively adjustable impedance values associated therewith. In an exemplary embodiment of the invention, the method includes applying, to a reference circuit, a test impedance value to a reference circuit. The test impedance value is controlled by a binary count. A determination is made, based upon the applied test impedance value, whether the reference circuit is in either a first state or a second state. The binary count is incremented if the reference circuit is in the first state and decremented if the reference circuit is in the second state. A condition is determined in which the reference circuit oscillates between the first state and said second state, and a pair of binary count values is stored. The desired operating impedance for the computer memory circuit corresponds to the lower of the stored pair of binary count values.

Abstract: An adjustable clock multiplier circuit is disclosed which is believed to be of advantage for inexpensively and locally generating an adjustable high frequency clock, such as may be useful for built-in self test of an embedded memory element of a digital logic integrated circuit. The clock multiplier circuit uses a pulse generator of the monostable type to generate a pulse in response to the leading edge of an input clock signal. The pulse is delayed through a programmable delay circuit and then provided as a feedback input to the pulse generator. In such manner, an output clock signal comprised of a train of pulses is generated during a cycle of the input clock signal. A counter increments a count in response to pulses generated in this way. When the pulse count is too high, a limiter outputs an ADJUST DOWN signal which slows down the output cycle time of the clock multiplier.