Patents by Inventor Jason Schneider

Jason Schneider has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10937139
    Abstract: A device comprising a transparent window, an imaging unit, and a computing element coupled to said imaging unit, wherein said device is configured to allow soiling particles to accumulate on a surface of said transparent window, said imaging unit is configured to capture an image of said surface, and said computing element is configured to perform analysis of said image to determine a soiling level of said transparent window, wherein a surface of said transparent window may include reference marks enabling calibration of said image during said analysis. Additionally, a method of performing said analysis.
    Type: Grant
    Filed: November 16, 2018
    Date of Patent: March 2, 2021
    Inventors: Michael Gostein, Stan Faullin, Jason Schneider, William Stueve
  • Publication number: 20190114763
    Abstract: A device comprising a transparent window, an imaging unit, and a computing element coupled to said imaging unit, wherein said device is configured to allow soiling particles to accumulate on a surface of said transparent window, said imaging unit is configured to capture an image of said surface, and said computing element is configured to perform analysis of said image to determine a soiling level of said transparent window, wherein a surface of said transparent window may include reference marks enabling calibration of said image during said analysis. Additionally, a method of performing said analysis.
    Type: Application
    Filed: November 16, 2018
    Publication date: April 18, 2019
    Inventors: Michael Gostein, Stan Faullin, Jason Schneider, William Stueve
  • Patent number: 9413174
    Abstract: An apparatus for measuring electrical characteristics of solar panels (photovoltaic modules) wherein the apparatus measures current versus voltage (“I-V”) relationships for both illuminated (“light I-V”) and/or non-illuminated (“dark I-V”) conditions; optionally provides single, dual, or four-quadrant source/sink capability; and measures one or more devices under test (DUTs). The apparatus comprises one or more source measurement units (SMUs), wherein each SMU is connected to one DUT, and optionally includes a positive high-voltage programmable power supply and/or a negative high-voltage programmable power supply. Additionally, the apparatus includes a controller which controls the functions of the SMUs, the high-voltage supplies, and other components of the apparatus, wherein the controller communicates with the SMUs over a signal bus.
    Type: Grant
    Filed: November 30, 2010
    Date of Patent: August 9, 2016
    Assignee: Atonometrics, Inc.
    Inventors: Michael Gostein, Russell Apfel, Lawrence R. Dunn, Stan Faullin, Naoum Gitnik, Jason Schneider
  • Publication number: 20160204737
    Abstract: An apparatus for measuring electrical characteristics of solar panels (photovoltaic modules) wherein the apparatus measures current versus voltage (“I-V”) relationships for both illuminated (“light I-V”) and/or non-illuminated (“dark I-V”) conditions; optionally provides single, dual, or four-quadrant source/sink capability; and measures one or more devices under test (DUTs). The apparatus comprises one or more source measurement units (SMUs), wherein each SMU is connected to one DUT, and optionally includes a positive high-voltage programmable power supply and/or a negative high-voltage programmable power supply. Additionally, the apparatus includes a controller which controls the functions of the SMUs, the high-voltage supplies, and other components of the apparatus, wherein the controller communicates with the SMUs over a signal bus.
    Type: Application
    Filed: March 22, 2016
    Publication date: July 14, 2016
    Applicant: ATONOMETRICS, INC.
    Inventors: Michael Gostein, Russell Apfel, Lawrence R. Dunn, Stan Faullin, Naoum Gitnik, Jason Schneider
  • Publication number: 20130181736
    Abstract: An apparatus for measuring electrical characteristics of solar panels (photovoltaic modules) wherein the apparatus measures current versus voltage (“I-V”) relationships for both illuminated (“light I-V”) and/or non-illuminated (“dark I-V”) conditions; optionally provides single, dual, or four-quadrant source/sink capability; and measures one or more devices under test (DUTs). The apparatus comprises one or more source measurement units (SMUs), wherein each SMU is connected to one DUT, and optionally includes a positive high-voltage programmable power supply and/or a negative high-voltage programmable power supply. Additionally, the apparatus includes a controller which controls the functions of the SMUs, the high-voltage supplies, and other components of the apparatus, wherein the controller communicates with the SMUs over a signal bus.
    Type: Application
    Filed: November 30, 2010
    Publication date: July 18, 2013
    Applicant: ATONOMETRICS, INC.
    Inventors: Michael Gostein, Russell Apfel, Lawrence R. Dunn, Stan Faullin, Naoum Gitnik, Jason Schneider
  • Patent number: 7921830
    Abstract: An EGR venturi for use in an EGR system of an IC engine includes a body defining a converging inlet section, a throat, and an interior liquid heat exchange chamber adjacent to the throat.
    Type: Grant
    Filed: December 23, 2008
    Date of Patent: April 12, 2011
    Assignee: Deere & Company
    Inventors: Jason Schneider, Bradley R. Watkins, Laurentiu Dobrila, Nathan Erickson, Randy Scarf, Doug Brocco
  • Publication number: 20100154758
    Abstract: An EGR venturi for use in an EGR system of an IC engine includes a body defining a converging inlet section, a throat, and an interior liquid heat exchange chamber adjacent to the throat.
    Type: Application
    Filed: December 23, 2008
    Publication date: June 24, 2010
    Inventors: Jason Schneider, Bradley R. Watkins, Laurentiu Dobrila, Nathan Erickson, Randy Scarf, Doug Brocco
  • Publication number: 20070033077
    Abstract: A top-down tiered process establishes an objective measure of the functional capacity of an asset to address a specified use. The process comprises: developing Issue Categories and lists of functional impact Sub-issue Types and specific issues under each type that may impact functionality of the asset for a specified use; providing the list to evaluators; employing evaluators to evaluate functionality, evaluators assigning a numerical Severity measure to each Sub-issue Type present during the evaluation; recording occurrences of issues under each Sub-issue Type discovered, summing occurrences to determine a Density of each Sub-issue Type; recording the evaluation in one or more engineering management systems (EMS); and using the recorded evaluation, calculating a value to be inserted on a numerical scale as a functionality index, FI. In select embodiments of the present invention, a numerical scale is used with values from 0-100.
    Type: Application
    Filed: August 2, 2005
    Publication date: February 8, 2007
    Inventors: Michael Grussing, Donald Uzarski, Lance Marrano, Jason Schneider